Field ion microscopic observations of LaB6 on tungsten

The importance of field ion microscopy as a unique surface microscopic technique has been pointed out with particular reference to the lanthanum hexaboride (LaB₆)-deposited refractory metal cathodes. In the core, field ion microscopic observations of LaB₆ deposited tungsten are described. The observations are discussed in relation to the field electron emission microscopy of LaB₆/W system. The paper ends with a few comments on the scope of further study of this or a similar system using the field ion microscopy and the atom probe field ion microscope.