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非晶硅薄膜晶体管的热阻模型
引用本文:刘远,姚若河,李斌.非晶硅薄膜晶体管的热阻模型[J].液晶与显示,2011,26(1):28-33.
作者姓名:刘远  姚若河  李斌
作者单位:1. 广东丁业大学材料与能源学院,广东广州510006;华南理工大学电子与信息学院,广东广州510640
2. 华南理工大学电子与信息学院,广东广州,510640
基金项目:国家自然科学基金(No.60776020); 广东工业大学博士启动项目(No.405105006)
摘    要:基于能量方程、热流方程和边界条件,推导出了非晶硅薄膜晶体管的沟道热阻模型。采用该模型可准确预估器件有源层内的平均温度。在沟道热阻模型的基础上,考虑器件间场氧化层和金属互联线的影响,建立了非晶硅薄膜晶体管的二维热阻模型。采用该模型可描述器件有源层内温度的横向分布,并快速预估沟道内的最高结温。最后,将模型预测结果与器件模拟仿真结果进行了对比,两者拟合良好。

关 键 词:非晶硅薄膜晶体管  热阻  自热效应  温度分布

Thermal Impedance Model for Amorphous Silicon Thin Film Transistors
LIU Yuan,YAO Ruo-he,LI Bin.Thermal Impedance Model for Amorphous Silicon Thin Film Transistors[J].Chinese Journal of Liquid Crystals and Displays,2011,26(1):28-33.
Authors:LIU Yuan  YAO Ruo-he  LI Bin
Affiliation:LIU Yuan1,2,YAO Ruo-he2,LI Bin2(1.Faculty of Materials and Energy,Guangdong University of Technology,Guangzhou 510006,China2.School of Electronic and Information Engineering,South China University of Technology,Guangzhou 510640,China)
Abstract:A channel thermal impedance model for amorphous silicon thin film transistor is derived from a system of coupled energy equation,heat flowing equation and boundary conditions.By the use of this model,the average temperature in the active region can be calculated.Then,by considering of the effects of field oxide and interconnects between devices,a two dimensional thermal model is developed.By the use of this model,the temperature distribution in the channel can be described and the maximum junction temperatu...
Keywords:amorphous silicon thin film transistor  thermal resistance  self-heating effect  temperature distribution  
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