Avoiding linear dependencies in LFSR test pattern generators

Linear Feedback Shift Registers (LFSRs) constitute a very efficient mechanism for generating pseudoexhaustive or pseudo-random test sets for the built-in self-testing of digital circuits. However, a well-known problem with the use of LFSRs is the occurrence of linear dependencies in the generated patterns. In this paper, we show for the first time that the amount of linear dependencies can be controlled by selecting appropriate characteristic polynomials and reordering the LFSR cells. We identify two classes of such polynomials which, by appropriate LFSR cell ordering, guarantee that a large ratio of linear dependencies cannot occur. Experimental results show significant enhancements on the fault coverage for pseudo-random testing and support the theoretical relation between minimization of linear dependencies and effective fault coverage.This work was partially supported by NSF grant MIP-9409905, a 1993–94 ACM/IEEE Design Automation Scholarship and a grant from Nissan Corporation. A preliminary version of this work appeared in A Class of Good Characteristic Polynomials for LFSR Test Pattern Generators, in Proc. of IEEE International Conference on Computer Design, Oct. 1994, pp. 292–295, where it received the ICCD'94 Best Paper Award.