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基于MCS-51单片机的智能辐射测厚仪
引用本文:朱建芳.基于MCS-51单片机的智能辐射测厚仪[J].仪表技术与传感器,2006(2):13-15.
作者姓名:朱建芳
作者单位:广州航海高等专科学校,广东,广州,510330
摘    要:分析了能广泛应用于金属轧制生产线上进行非接触式连续测量材料厚度的辐射测厚仪的工作原理,设计了智能辐射测厚仪的硬件和软件,利用单片机实现对测量数据的特殊处理、工作状态的自动识别、动态自动校正、动态温度补偿和人工修正等。实际应用表明,仪器达到了规定的技术指标,应用效果较好。

关 键 词:单片机  辐射测厚仪  智能化
文章编号:1002-1841(2006)02-0013-03
收稿时间:2005-09-13
修稿时间:2005年9月13日

Design of Intelligent Radiation Thickness Gauge Based on MCS-51 Single-chip Microcomputer
ZHU Jian-fang.Design of Intelligent Radiation Thickness Gauge Based on MCS-51 Single-chip Microcomputer[J].Instrument Technique and Sensor,2006(2):13-15.
Authors:ZHU Jian-fang
Affiliation:Guangzhou Maritime College, Guangzhou 510330, China
Abstract:Analyses the working principle of radiation thickness gauge of non-contacting continous on-line measurement,which is widely suitable for mangle production line of metal strip.The hardware and software design of the intelligent radiation thickness gauge is given.By single-chip microcomputer technology,the gauge realizes the following funtions:the special data processing,automatic indentification of working states,automatic dynamic calibration,bynamic temperature compensation and manual correction.The real application shows that the gauge meets the need of specifications for production and has very good effect.
Keywords:single-chip microcomputer  radiation thickness gauge  intelligentize
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