| X射线荧光法测试镀银铜线镀层厚度 |
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| 引用本文： | 张瑾,马磊.X射线荧光法测试镀银铜线镀层厚度[J].现代科学仪器,2005(3):60-62. |
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| 作者姓名： | 张瑾 马磊 |
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| 作者单位： | 中国电子科技集团公司第二十三研究所检测中心,上海,200437 |
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| 摘 要： | 结合X射线荧光法厚度测定仪FISCHERSCOPE—RAY XUL，介绍了X射线荧光法测定镀层厚度的基本原理及仪器流程结构，并应用该方法对不同镀银铜线进行了镀层厚度测试，结果表明该方法测试重复性好，精密度高。同时本方法同经典的称重法的比较结果显示，该方法准度高，结果准确可靠。
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| 关 键 词： | X射线荧光法 镀层厚度 测厚仪 镀银铜线 |
| 修稿时间： | 2004年11月23 |
Determination of Ag-coated Copper Wire Layer Thickness by X-Ray Fluorescence Method |
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| Zhang Jin,Ma Lei.Determination of Ag-coated Copper Wire Layer Thickness by X-Ray Fluorescence Method[J].Modern Scientific Instruments,2005(3):60-62. |
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| Authors: | Zhang Jin Ma Lei |
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| Abstract: | Function principle of determination coating thickness by X-Ray fluorescence method and instrument flow chart were introduced based on FISCHERSCOPE R X-RAY XUL. And different Ag -coated copper wire coating thickness were measured through XRF method with FISCHERSCOPE R X-RAY XUL. The tested results showed that XRF method could ensure satisfying repeatability and precision . In addition, accuracy comparison based on XRF method and weighing method for different samples proved that X-Ray fluorescence method could gain high accuracy in the course of determination of Ag coated copper wire layer thickness |
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| Keywords: | XRF method Coating thickness Thickness measurement instrument Ag -coated copper wire |
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