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基于Top-Hat的硬度压痕测量光照均匀度校正
引用本文:刘新佳,吕晓东,王敬涛,李秀春.基于Top-Hat的硬度压痕测量光照均匀度校正[J].工程与试验,2012,52(2):65-67.
作者姓名:刘新佳  吕晓东  王敬涛  李秀春
作者单位:1. 北京航空航天大学,北京,100191
2. 莱州华银试验仪器有限公司,山东莱州,261400
摘    要:针对维氏硬度压痕测量过程中由于物理光源照射产生的图像照度不均匀现象,研究了基于数字形态学的Top-Hat算法,对图像光照均匀度进行了校正。并针对传统Top-Hat存在的问题,提出了一种改进的算法。试验证明,该算法可靠有效,能够满足维氏硬度测量的工程实际要求。

关 键 词:维氏压痕  Top-Hat  硬度测量  图像校正

Correction of Uneven Illuminated Image for Hardness Indentation Measurement based on Top-Hat Algorithm
Liu Xinjia , Lv Xiaodong , Wang Jingtao , Li Xiuchun.Correction of Uneven Illuminated Image for Hardness Indentation Measurement based on Top-Hat Algorithm[J].ENGINEERING & TEST,2012,52(2):65-67.
Authors:Liu Xinjia  Lv Xiaodong  Wang Jingtao  Li Xiuchun
Affiliation:1.School of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics,Beijing100191,China ;2.Laizhou Huayin Testing Instrument Co.,LTD,Laizhou261400,Shandong,China)
Abstract:Imaging at the physical light source leads to uneven illumination images in the process of the Vickers indentation measurement.Some researches based on the Top-Hat algorithm are done to get the even illumination image.An improved algorithm has been proposed because the traditional Top-Hat algorithm has some disadvantages.The experimental results show that this algorithm is reliable and effective,and can meet the needs of the actual production very well.
Keywords:Vickers indentation  Top-Hat  hardness measurement  image correction
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