Dielectric Relaxor Evolution and Frequency‐Insensitive Giant Strains in (Bi0.5Na0.5)TiO3‐Modified Bi(Mg0.5Ti0.5)O3–PbTiO3 Ferroelectric Ceramics |
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| Authors: | Wanli Zhao Ruzhong Zuo Donggeng Zheng Longtu Li |
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| Affiliation: | 1. Institute of Electro Ceramics & Devices, School of Materials Science and Engineering, Hefei University of Technology, , Hefei, 230009 China;2. State Key Laboratory of New Ceramics and Fine Processing, Department of Materials, Science and Engineering, Tsinghua University, , Beijing, 100084 China |
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| Abstract: | The 0.45Bi(Mg0.5Ti0.5)O3–(0.55 ? x)PbTiO3–x(Bi0.5Na0.5)TiO3 (BMT–PT–xBNT) ternary solid solution ceramics were prepared via a conventional solid‐state reaction method; the evolution of dielectric relaxor behavior and the electrostrain features were investigated. The XRD and dielectric measurements showed that all studied compositions own a single pseudocubic perovskite structure and undergo a diffuse‐to‐relaxor phase transition owing to the evolution of the domain from a frozen state to a dynamic state. The formation of the above dielectric relaxor behavior was further confirmed by a couple of measurements such as polarization loops, polarization current density curves, as well as bipolar strain loops. A large strain value of ~0.41% at a driving field of 7 kV/mm (normalized strain d33* of ~590 pm/V) was obtained at room temperature for the composition with x = 0.32, which is located near the boundary between ergodic and nonergodic relaxor. Moreover, this electric field‐induced large strain was found to own a frequency‐insensitive characteristic. |
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