多元红外探测器综合性能参数自动测试系统

针对多元红外探测器过程质量控制和批量检测需求,研究开发了一套多元红外探测器综合性能参数自动测试系统,系统整体噪声水平<2mV,通道增益一致性优于1.60%,实现了动态阻抗、探测率、电压/电流响应率、I-V曲线、启动时间、续冷时间、元间均匀性等参数的全自动测试.针对某型号探测器的测量实验表明,该测试系统具有较好的测量精度和稳定性.

Automatic Testing System for Comprehensive Parameters of Multi-node Infrared Detector

To realize process quality control and batch test for multipixel infrared detector, an automatic comprehensive parameters test system is developed, which reaches the level that the system noise is less than 2 mV and the channel gain is better than 1.60%. The system can automatically test the parameters such as dynamic resistant, test ratio, voltage/current responsibility, start time, cooling time, I-V curve, pixel-to-pixel uniformity and so on. The experiment on some real infrared detector shows that the system has good measurement accuracy and repeatability.