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结构光三维视觉检测中光条椭圆拟合方法与仿真研究
引用本文:魏振忠,张广军. 结构光三维视觉检测中光条椭圆拟合方法与仿真研究[J]. 仪器仪表学报, 2003, 24(1): 69-74
作者姓名:魏振忠  张广军
作者单位:北京航空航天大学,北京,100083
基金项目:教育部跨世纪优秀人才培养计划基金资助项目
摘    要:针对在圆柱类工件的结构光三维视觉检测中,结构光光条短,数据量少,造成结构光光条椭圆拟合精度低的问题,提出了一种新的基于短轴长度约束的最小二乘拟合方法,建立了数学模型,进行了仿真研究,并与无约束最小二乘拟合方法(简称无约束法)进行了比较,仿真结果表明,该方法在一定条件下能够有效提高在短弧和噪声下光条椭圆拟合的精度和鲁椿性,有实际应用的价值。

关 键 词:圆柱类工件 结构光 三维视觉检测 光条 椭圆拟合 短轴约束法 仿真
修稿时间:2001-06-01

An Elliptical Fitting Method of Light Stripe and Its Simulation for Structured Light Based 3D Vision Inspection
Wei Zhenzhong Zhang Guangjun. An Elliptical Fitting Method of Light Stripe and Its Simulation for Structured Light Based 3D Vision Inspection[J]. Chinese Journal of Scientific Instrument, 2003, 24(1): 69-74
Authors:Wei Zhenzhong Zhang Guangjun
Abstract:During inspecting cylindrical workpieces, the structured-light stripe is much short, and contains inadequate data information. Under the circumstance, the fitting precision is usually lower if the inadequate data is fitted by an ellipse. To address this problem, a new least-square fitting method based on the restriction of the length of the elliptical short axis is proposed. Its simulation is finished, and also compared with the non-restriction-method. The simulation results show that the proposed method can efficiently improve the precision and robustness of elliptical fitting for structured light based 3D vision inspection, and will have a bright future for practical application.
Keywords:Cylindrical workpieces Structured-light Three dimensional vision inspection Light stripe Elliptical fitting Short axis restriction method
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