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无铅焊接工艺及失效分析
引用本文:黄卓,杨俊,张力平,陈群星,田民波.无铅焊接工艺及失效分析[J].电子元件与材料,2006,25(5):69-72.
作者姓名:黄卓  杨俊  张力平  陈群星  田民波
作者单位:1. 清华大学材料科学与工程系,北京,100084
2. 振华亚太高新电子材料有限公司,贵州,贵阳,550018
基金项目:国家高技术研究发展计划(863计划)
摘    要:综述了目前无铅焊接工艺回流焊和波峰焊的工艺特点,指出了焊接中存在的几大主要失效问题,包括开裂、焊点空洞、晶须和板材胀裂,并介绍了避免或减弱这些失效问题的方法。

关 键 词:电子技术  无铅焊料  工艺  失效  开裂  焊点空洞  晶须
文章编号:1001-2028(2006)05-0069-04
收稿时间:2005-12-20
修稿时间:2005-12-20

Lead-free Jointing Technology and Analysis of Its Failures
HUANG Zhuo,YANG Jun,ZHANG Li-ping,CHEN Qun-xing,TIAN Min-bo.Lead-free Jointing Technology and Analysis of Its Failures[J].Electronic Components & Materials,2006,25(5):69-72.
Authors:HUANG Zhuo  YANG Jun  ZHANG Li-ping  CHEN Qun-xing  TIAN Min-bo
Affiliation:1. Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China; 2. Zhenhua Asia-Pacific High-Tech Electronic Materials Co., Ltd, Guiyang 550018, China
Abstract:The characteristics of the lead-free jointing technology and the main causes of its failures were summarized, include lift-off, solderpoint voids and Sn whisker etc. Also some methods to avoid or lower these failures were given.
Keywords:electronic technology  lead-free solder  technology  failure  lift-off  solderpoint voids  Sn whisker
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