Group delay ripple reduction and reflectivity increase in a chirpedfiber Bragg grating by multiple-overwriting of a phase mask with anelectron-beam |
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Authors: | Komukai T Inui T Nakazawa M |
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Affiliation: | NTT Network Innovation Labs., Kanagawa; |
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Abstract: | The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask |
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