| 不同邻晶面Hg1-xCdxTe外延薄膜的特性分析 |
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| 引用本文： | 李标,褚君浩,朱基千,陈新强,曹菊英,汤定元.不同邻晶面Hg1-xCdxTe外延薄膜的特性分析[J].物理学报,1997,46(6):1168-1173. |
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| 作者姓名： | 李标 褚君浩 朱基千 陈新强 曹菊英 汤定元 |
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| 作者单位： | 中国科学院上海技术物理研究所红外物理国家重点实验室 |
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| 摘 要： | 在取向不同的CdTe衬底上用液相外延技术生长了Hg1-xCdxTe薄膜，结合金相显微镜、红外显微镜、X射线双晶衍射、红外吸收及Raman光谱等手段分析了不同邻晶面外延层的性质，结果表明，在“近平面”（衬底偏角δ＜0.1°）或“无台阶面”（δ≈1.2°）上生长的外延层的晶格质量及光学性能较好
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| 关 键 词： | 汞镉碲 外延薄膜 薄膜特性 红外材料 |
| 收稿时间： | 1996-07-24 |
CHARACTERIZATION OF Hg1-xCdxTe EPITAXIAL FILMS ON VARIOUS VICINAL PLANES |
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| LI BIAO,CHU JUN-HAO,ZHU JI-QIAN,CHEN XIN-QIANG,CAO JU-YING and TANG DING-YUAN.CHARACTERIZATION OF Hg1-xCdxTe EPITAXIAL FILMS ON VARIOUS VICINAL PLANES[J].Acta Physica Sinica,1997,46(6):1168-1173. |
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| Authors: | LI BIAO CHU JUN-HAO ZHU JI-QIAN CHEN XIN-QIANG CAO JU-YING and TANG DING-YUAN |
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| Abstract: | The Hg1-xCdxTe films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph,infrared absorption spectra, Raman scattering, and X ray double crystal diffraction. The results show that-near facet (δ<1°) and terrace free (δ≈1.2 °) growth modes are superior in both the planarity and the amount of precipitates. |
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