Temperature range for critical scaling behavior in YBCO thin films |
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Authors: | J Deak MJ Darwin M McElfresh |
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Affiliation: | Physics Department, Purdue University, West Lafayette, IN 47907, USA |
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Abstract: | The magnetic and transport properties of thin films and single crystals of YBa2Cu3O7−δ are compared. For measurements on thin films, the apparent critical scaling behavior is observed to exist over a temperature range from 87 K down to the vortex-glass transition Tg = 84.2 K at 2.5 kOE and from 83 K to Tg = 70.4 K at 50 kOe. The inflection point (Tinf) in temperature dependent resistivity measurements R(T) coincides with the highest temperature at which current-voltage (I–V) characteristics are found to scale. The region between Tg and Tinf shows a behavior characteristics of thermally activated flux motion, while above Tinf I–V curves show ohmic behavior. No similar scaling region is observed in some single crystal results, supporting recent claims that the phase transition in some single crystals may not be critical in nature (of order greater than one). |
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