Crystallographic characterization of silicon nitride ceramics sintered with Y2O3–Al2O3 or E2O3–Al2O3 additions |
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| Authors: | C Santos S Ribeiro K Strecker PA Suzuki S Kycia CRM Silva |
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| Affiliation: | 1. Universidade de São Paulo-Escola de Engenharia de Lorena (USP-EEL), Brazil;2. Laboratório Nacional de Luz Síncrotron (LNLS), Brazil;3. Centro Técnico Aeroespacial, Divisão de Materiais (CTA-IAE-AMR), Brazil |
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| Abstract: | Silicon nitride ceramics were sintered using Y2O3–Al2O3 or E2O3–Al2O3 (E2O3 denotes a mixed oxide of Y2O3 and rare-earth oxides) as sintering additives. The intergranular phases formed after sintering was investigated using high-resolution X-ray diffraction (HRXRD). The use of synchrotron radiation enabled high angular resolution and a high signal to background ratio. Besides the appearance of β-Si3N4 phase the intergranular phases Y3Al5O12 (YAG) and Y2SiO5 were identified in both samples. The refinement of the structural parameters by the Rietveld method indicated similar crystalline structure of β-Si3N4 for both systems used as sintering additive. On the other hand, the intergranular phases Y3Al5O12 and Y2SiO5 shown a decrease of the lattice parameters, when E2O3 was used as additive, indicating the formation of solid solutions of E3Al5O12 and E2SiO5, respectively. |
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| Keywords: | D Si3N4 Y3Al5O12 Y2SiO5 X-ray diffraction Rietveld method |
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