Effect of gamma irradiation on the low-frequency (1/̷) noise of linear ics: Reliability physics study

Linear integrated circuits IC 709 and 741 were irradiated by gamma rays using cobalt-60 source. Low-frequency noise was measured for these ICs before and after irradiation dose levels 10⁴, 10⁵, 10⁶ and 5 × 10⁶ R. In general IC 741s appeared to be more noisy than IC 709s. The noise levels increase substantially in the case of IC 741 after gamma irradiation of 10⁶ R. Comparative measurement results are presented in this article. These results may be useful to correlate radiation as a defect producing stress, mode and type of failures and reliability of linear ICs.