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| 处理器电路的隔离测试方法研究 | |
| 引用本文： | 路锋,冯辅周,闫存金.处理器电路的隔离测试方法研究[J].计算机工程与应用,2011,47(32):78-81. |
| 作者姓名： | 路锋 冯辅周 闫存金 |
| 作者单位： | 1. 装甲兵工程学院机械工程系,北京100072;装甲兵工程学院装甲兵装备技术研究所,北京100072 2. 装甲兵工程学院机械工程系,北京,100072 3. 装甲兵工程学院装甲兵装备技术研究所,北京,100072 |
| 摘 要： | 含处理器(CPU)电路的测试和故障诊断一直是测试领域的一个难点。在研究过程中,提出并设计了一种电气隔离测试方法。该方法通过对CPU电路基本属性分析,采用对CPU复位脚进行操作使其一直处于某种特定状态,并设计一套外围电路对其进行数据收发,从而实现将CPU从电路中"隔离"出来进行测试。实验结果表明,该方法具有其独特的优势。 |
| 关 键 词： | 自动测试 故障诊断 隔离测试 复杂电路 |
| 修稿时间： | |
Research on processor circuit testing method of isolation |
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| LU Feng,FENG Fuzhou,YAN Cunjin.Research on processor circuit testing method of isolation[J].Computer Engineering and Applications,2011,47(32):78-81. | |
| Authors: | LU Feng FENG Fuzhou YAN Cunjin |
| Affiliation: | LU Feng1,2,FENG Fuzhou1,YAN Cunjin21.Department of Mechanical Engineering,Academy of Armored Force Engineering,Beijing 100072,China 2.Armored Force Equipment Technology Institute,China |
| Abstract: | Processor circuit testing and malfunction diagnosis is one of the difficulties in the field of automatic test and malfunction diagnosis.In the study,it proposes and designs a method of isolating test.In this method,it analyzes the basic circuit properties of the processor and uses the reset pin of the CPU to operate the CPU in a particular state,and then designs its peripheral circuit to transceiver data,makes the CPU isolation out of the circuit for testing.This method has its unique advantages. |
| Keywords: | automatic test malfunction diagnosis isolation test complex circuit |
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