有源低热器件红外热图像增强新方法

提出几种提高红外电路故障诊断仪诊断有源低热器件能力的新方法。这几种方法主要是通过增大元器件耗散功率和表面发射率来宾现的。理论分析和实践结果都表明，本文所提出的方法能有效地改善有源低热器件的红外热图像。混和信号激励法能明显增大三极管放大电路耗散功率，特别是第一级耗散功率；增频激励法能有效提高IC耗散功率；表面漫射法能有效增大元器件的发射系数。这三种方法有效地提高了元器件的温度和发射系数，从而增强了元器件的辐射度或明显改善了它们的热图像。

New methods for enhancing thermal image of active low dissipation components

Some new methods for enhancing the infrared image of low dissipation components are proposedbased on improving consumption and surface emissivity of components. Theoretic analysis and experimental result both show that these measures proposed in this paper can improve the image of the active low dissipation devices effectively. Mixing-signal stimulation method can enhance dissipation of bipolar transistor evidently, especially first cascade amplifying circuits. Moreover, multiple frequency stimulation method can increase consumption of IC obviously and surface diffuse reflection method can improve surface emission coefficient of IC availably. As a result, these three methods evidently improve radiation exitance and thermal image of devices and improve the troubleshooting, ratio.