| 故障绝缘子的发热机理及其红外热像检测 |
| |
| 引用本文： | 金光熙,权光日,郎成,于东林,许承蓓.故障绝缘子的发热机理及其红外热像检测[J].电瓷避雷器,2011(5):12-15. |
| |
| 作者姓名： | 金光熙 权光日 郎成 于东林 许承蓓 |
| |
| 作者单位： | 1. 吉林化工学院理学院,吉林吉林,132022
2. 吉林市朝鲜族中学校,吉林吉林,132001 |
| |
| 摘 要： | 绝缘子故障主要指绝缘电阻劣化和表面污秽.在分析讨论引起绝缘子发热的电阻劣化和表面污秽机理基础上,利用绝缘子等值电路模型分析了绝缘子在电阻劣化和表面污秽时的发热规律以及实际运行绝缘子的热像特征.结果表明:低值、零值和污秽绝缘子的发热规律和热像特征具有明显的差异,故可用高分辨的红外热像仪来检测和分析实际运行中的绝缘子运行状...
|
| 关 键 词： | 绝缘子故障 发热机理 热像特征 红外热像 |
Heating Mechanism and Infrared Thermography Detection of Failure Insulators |
| |
| JIN Guang-xi,QUAN Guang-ri,LANG Cheng,YU Dong-lin,XU Cheng-bei.Heating Mechanism and Infrared Thermography Detection of Failure Insulators[J].Insulators and Surge Arresters,2011(5):12-15. |
| |
| Authors: | JIN Guang-xi QUAN Guang-ri LANG Cheng YU Dong-lin XU Cheng-bei |
| |
| Affiliation: | JIN Guang-xi1,QUAN Guang-ri2,LANG Cheng1,YU Dong-lin1,XU Cheng-bei1 (1.Schools of Science,Jilin Institute of Chemical Technology,Jilin 132022,China,2.Korean Middle School of Jilin CIty,Jilin 132001,China) |
| |
| Abstract: | Insulator failure mainly refers to the insulation resistance deterioration and the surface contamination.Based on the mechanism of resistance deterioration and surface contamination caused by insulator heating,the heating regular and thermal imagery characteristics of actual service insulator are analyzed by using the insulator equivalent circuit model when resistance deterioration and surface contamination. The result shows that: there are obvious differences among low resistance,zero resistance, and the h... |
| |
| Keywords: | insulator failure heating mechanism thermal image characteristic infrared thermal image |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
