Chemical effects in C60 irradiation of polymers |
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Authors: | R Möllers V Torrisi A Licciardello |
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Affiliation: | a ION-TOF GmbH, Gievenbecker Weg 15, 48149 Münster, Germany b Dipartimento di Scienze Chimiche, Università di Catania, V.A. Doria 6, 95125 Catania, Italy |
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Abstract: | The C60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(α-methyl)styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C60 appears to depend strongly on the chemical nature of the system under study. |
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Keywords: | ToF-SIMS Cluster SIMS Fullerene ion beam Depth profiling Polymers Radiation damage |
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