Statistical distribution based detector response function of a Si(PIN) detector for K_α and K_β X-ray |
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引用本文: | 李哲,庹先国,杨剑波,刘明哲,成毅,王磊.Statistical distribution based detector response function of a Si(PIN) detector for K_α and K_β X-ray[J].中国物理 C,2013(1):144-148. |
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作者姓名: | 李哲 庹先国 杨剑波 刘明哲 成毅 王磊 |
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作者单位: | Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences,Chengdu University of Technology;State Key Laboratory of Geoharzard Prevention and Geoenvironment Protection,Chengdu University of Technology;Southwest University of Science and Technology |
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基金项目: | Supported by National Natural Science Foundation of China(40974065, 41025015);Scientific and Technological Innovative Team in Sichuan Province(2011JTD0013);“863” Program of China(2012AA063501) |
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摘 要: | A semi-empirical detector response function (DRF) model of a Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on the statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function, and an exponential tail function. Parameters in the model are obtained by the weighted nonlinear least-squares fitting method. In the application, six kinds of elements’ characteristic X-ray spectra are obtained by using the Si (PIN) detector, and fitted by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.
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关 键 词: | detector response function Si (PIN) detector statistical distribution analytic method weighted non-linear least-squares fitting |
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