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Statistical distribution based detector response function of a Si(PIN) detector for K_α and K_β X-ray
引用本文:李哲,庹先国,杨剑波,刘明哲,成毅,王磊.Statistical distribution based detector response function of a Si(PIN) detector for K_α and K_β X-ray[J].中国物理 C,2013(1):144-148.
作者姓名:李哲  庹先国  杨剑波  刘明哲  成毅  王磊
作者单位:Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences,Chengdu University of Technology;State Key Laboratory of Geoharzard Prevention and Geoenvironment Protection,Chengdu University of Technology;Southwest University of Science and Technology
基金项目:Supported by National Natural Science Foundation of China(40974065, 41025015);Scientific and Technological Innovative Team in Sichuan Province(2011JTD0013);“863” Program of China(2012AA063501)
摘    要:A semi-empirical detector response function (DRF) model of a Si (PIN) detector is proposed to fit element Kα and Kβ X-ray spectra, which is based on the statistical distribution analytic (SDA) method. The model for each single peak contains a step function, a Gaussian function, and an exponential tail function. Parameters in the model are obtained by the weighted nonlinear least-squares fitting method. In the application, six kinds of elements’ characteristic X-ray spectra are obtained by using the Si (PIN) detector, and fitted by the established DRF model. Reduced chi-square values are at the interval of 1.11-1.25. Other applications of the method are also discussed.

关 键 词:detector  response  function  Si  (PIN)  detector  statistical  distribution  analytic  method  weighted  non-linear  least-squares  fitting
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