Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope |
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Authors: | Milani Marziale Drobne Damjana Tatti Francesco Batani Dimitri Poletti Giulio Orsini Francesco Zullini Aldo Zrimec Alexis |
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Affiliation: | Department of Materials Science, University of Milano-Bicocca, Milano, Italy. marziale.milani@mater.unimib.it |
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Abstract: | A novel focused ion beam-based technique is presented for the read-out of microradiographs of Caenorhabditis elegans nematodes generated by soft x-ray contact microscopy (SXCM). In previous studies, the read-out was performed by atomic force microscopy (AFM), but in our work SXCM microradiographs were imaged by scanning ion microscopy (SIM) in a focused ion beam/scanning electron microscope (FIB/SEM). It allows an ad libitum selection of a sample region for gross morphologic to nanometric investigations, with a sequence of imaging and cutting. The FIB/SEM is less sensitive to height variation of the relief, and sectioning makes it possible to analyse the sample further. The SXCM can be coupled to SIM in a more efficient and faster way than to AFM. Scanning ion microscopy is the method of choice for the read-out of microradiographs of small multicellular organisms. |
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Keywords: | focused ion beam soft x‐ray microscopy atomic force microscopy ultramicroscopy Caenorhabditis elegans |
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