基于XRD的镀锌钝化膜残余应力试验研究

利用XRD技术测试了镀锌钝化膜结合界面的残余应力，同时通过电解抛光法检测了其厚度方向残余应力的分布规律，分析了残余应力对镀锌钝化膜结合强度的影响. 试验结果表明，镀锌钝化膜的残余应力均表现为压应力，并随着基体表面残余应力的增大而减小；钝化膜在2—10μm厚度方向的残应力为-274.5—-428.3MPa，其应力为梯度分布；镀锌钝化膜与基体的界面结合强度与其残余应力成反比，减小薄膜残余应力，有利于提高镀锌钝化膜与基体的结合强度. 关键词： X射线衍射法(XRD) 镀锌钝化膜 结合强度 残余应力

Experimental study of residual stress of galvanized passive film based on XRD

Residual stresses of galvanized passive film were measured by X-ray diffraction (XRD), at the same time, the residual stress distribution of galvanized passive film in the thickness direction was measured with electro-analysis polishing method, and the effect of residual stress on bonding strength of the film were analyzed. The experimental results show that residual stress of galvanized passive film is always compressive, which decreases as the residual stresses on the substrate surface increases. Residual stress of galvanized passive film in the thickness direction of 2—10μm is -274.5—-428.3MPa, and the residual stress distribution of galvanized passive film in the thickness direction has a gradient. Interfacial bonding strength of galvanized passive film/substrate is inversely proportional to the residual stress, and the decrease of the film stress improves the bonding strength.