| 光学薄膜非线性参数的快速测量与分析 |
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| 引用本文： | 孙德贵 汪晓元. 光学薄膜非线性参数的快速测量与分析[J]. 计量学报, 1994, 15(2): 114-115,160 |
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| 作者姓名： | 孙德贵 汪晓元 |
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| 作者单位： | 中国科学院长春光机所，东北电力学院基础部 |
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| 摘 要： | 提出一种测量非线性光学薄膜非线性参数的方法，测量了ＺｎＳｅ非晶态薄膜的非线性折射率和消光系数。在此方法中，实验数据的计算与处理由一套计算机软件完成。对这种测量方法的精确性及实用性进行了分析和讨论。
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| 关 键 词： | 光学薄膜 非线性 测量 参数 |
Rapid Measurement and Analysis for the Nonlinear Parameters of Optical Thin-films |
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| Sun Degui, Wang Xiaoyuan, Weng Zhaoheng. Rapid Measurement and Analysis for the Nonlinear Parameters of Optical Thin-films[J]. Acta Metrologica Sinica, 1994, 15(2): 114-115,160 |
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| Authors: | Sun Degui Wang Xiaoyuan Weng Zhaoheng |
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| Abstract: | This paper proposes a convenient and effective method for rapidly measuring and analyzing the nonlinear parameters of optical thin-films, and uses it to measure the nonlinearities of refractive-index and extinet coefficient. In this method, the experimental data are directly computed and processed by a computer program. Finally, the limitation of the measurement method is analyzed and discussed in detail. |
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| Keywords: | Optical thin film Nonlinearity Measurement and analysis |
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