Studies on nucleation kinetics of InxGa1?xN/GaN heterostructures |
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Authors: | E Varadarajan R Dhanasekaran P Ramasamy |
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Affiliation: | (1) Crystal Growth Centre, Anna University, 600 025 Chennai, India |
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Abstract: | Nucleation kinetics during the growth of InxGa1−xN on a GaN substrate have been studied. The behavior of nonequilibrium between the InxGa1−xN and the GaN substrate has been analyzed, and hence, the expression derived for the stress-induced supercooling/superheating
has been numerically evaluated. The maximum amount of stress-induced supercooling is found to be 1.017 K at x=0.12. These
values are incorporated in the classical heterogeneous nucleation theory. Using the regular solution model, the interfacial
tension between the nucleus and substrate and, hence, the interfacial tension between nucleus and mother phase and thermodynamical
potential of the compounds have been calculated. The amount of driving force available for the nucleation has been determined
for different compositions and degrees of supercooling. It has been shown that the value of the interaction parameter of InN-GaN
plays a dominant role in nucleation and growth kinetics of InxGa1−xN on a GaN substrate. These values have been used to evaluate the nucleation parameters. It is shown that the nucleation barrier
for the formation of a InxGa1−xN nucleus on a GaN substrate is minimum in the range of x=0.12 to x=0.17, and it has been qualitatively proved that good quality
InxGa1−xN on GaN can be grown only in the range 0<x≤0.2. |
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Keywords: | Nucleation InGaN/GaN heterostructure lattice mismatch stress-induced supercooling/superheating interfacial tension |
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