| 一种基于遗传算法的VDSM IC电源网格动态IR-drop分析新方法 |
| |
| 引用本文： | 张培勇,严晓浪,史峥.一种基于遗传算法的VDSM IC电源网格动态IR-drop分析新方法[J].电路与系统学报,2006,11(1):1-5. |
| |
| 作者姓名： | 张培勇 严晓浪 史峥 |
| |
| 作者单位： | 浙江大学,超大规模集成电路设计研究所,浙江,杭州,310013 |
| |
| 摘 要： | 提出了一种用于超深亚微米集成电路电源网格IR-drop验证的新方法.该方法以遗传算法为基础,与已有的分析方法相比,该方法兼具静态IR-drop分析法和动态IR-drop分析法的优点,适用于包含大型组合模块的超大规模集成电路,可主动寻找电路中最大IR-drop.通过对ISCAS85电路实现的验证,发现了静态分析法不能发现的芯片边缘IR-drop问题.实验结果验证了该方法的正确性与有效性.
|
| 关 键 词： | 电源网格分析 组合电路 |
| 文章编号： | 1007-0249（2006）00-0001-05 |
| 收稿时间： | 2003-10-13 |
| 修稿时间： | 2003-12-01 |
A novel method for dynamic IR-drop analysis of VDSM IC power grid based on genetic approach |
| |
| ZHANG Pei-yong,YAN Xiao-lang,SHI Zheng.A novel method for dynamic IR-drop analysis of VDSM IC power grid based on genetic approach[J].Journal of Circuits and Systems,2006,11(1):1-5. |
| |
| Authors: | ZHANG Pei-yong YAN Xiao-lang SHI Zheng |
| |
| Abstract: | A novel GA based algorithm for UDSM VLSI power grid verification is presented, Unlike other existing techniques, this algorithm possesses merits of both the static and dynamic IR-drop analysis methods. For large scale combinational circuits, the maximum IR-drop can be automatically found following the proposed scheme. Application on ISCAS 85 example shows potential IR-drop faults which are unknown by using traditional methods, The correctness and efficiency are both verified by experiments. |
| |
| Keywords: | VLSI CMOS |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
