Development of an identification system for biaxially oriented polymer films based on the degree of their transverse extension |
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| Authors: | V. V. Goncharenko I. O. Mikulenok D. G. Shvachko D. N. Shved |
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| Affiliation: | (1) Institute of Experimental Physics, University of Gdańsk, Wita Stwosza 57, PL-80-952 Gdańsk, Poland;(2) Department of Technical Physics and Applied Mathematics, Technical University of Gdańsk, Narutowicza 11/12, 80-952 Gdańsk, Poland |
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| Abstract: | An expression has been developed that generalizes three basic geometric schemes of film deformation (axial, planar, and biaxial extension) and also all intermediate schemes. The system of quantitative identification of nonuniformly biaxially oriented films according to their transverse extension has been tested on six different film types. |
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