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Charge carrier injection and transport associated with thermally generated cracks in a 6,13-bis(triisopropylsilylethynyl) pentacene thin-film transistor |
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| Authors: | Jin-Hyuk Bae Hyeok KimGilles Horowitz Sin-Doo Lee |
| Affiliation: | a School of Electrical Engineering #32, Seoul National University, Kwanak P.O. Box 34, Seoul 151-600, Republic of Korea b ITODYS, Université Paris Diderot (Paris 7), CNRS, 75205 Paris, France |
| Abstract: | |
| Keywords: | Crack TIPS-pentacene Post-thermal annealing Carrier injection Carrier transport Interfacial resistance |
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