Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.     

一种新的光学角度测量与补偿

石英晶体在切片过程中由于加工误差会引起两表面的不平行,从而影响对其晶向的判断.为了弥补这种缺陷,需要对上下两表面的倾角进行测量.本文对全自动X射线分选仪的晶体倾角测量问题进行了研究,用位置灵敏探测器探测被晶体反射的激光光斑,推导出了位置灵敏探测器探测到的坐标点随上下晶面夹角的关系式,并进一步分析了不同入射角,不同晶体厚...     

用于绝对相位还原的对称式和非对称式二元结构光编码

基于邻域分析的相移法不适合阶跃场景测量且往往会造成相位误差的积累,为此提出了用于获取绝对相位的对称式和非对称式二元阶梯相位结构光编码方法.两种方法编码图案不同,对称式编码方法编码图案黑白条纹的宽度相等,非对称式不等.通过投影多帧二元结构光编码图案,结合相移法相位提取公式获得阶梯相位.测量时,基于传统正弦条纹投影和相移法获得高准确度包裹相位,并用阶梯相位确定对应包裹相位的级次.根据级次直接进行相位展开,进而获得绝对相位.以量块作为测量对象,两种方法的测量均方根误差达到0.072mm.两种方法均能够有效还原阶跃场景,实现三维重构.