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针对组合电路的测试生成算法种类繁多,但对所检测到的故障进行定位的方法却很少的问题,阐明了一种基于Reed-Muller模式的组合电路的故障定位方法.该方法在减少测试开销的同时,不但可以方便检测出电路中的单固定型故障,且可以对故障进行定位.此方法还可应用于其他相关电路的可测性设计中. 相似文献
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Testgeneration of integrated circuitis a very activeresearch subject in CAD and digital system fault diag-nosis. With the improvement of the complexity and in-tegrated degree of circuit, the test of digital integratedcircuit becomes harder and harder. Although peoplehave studied this for several years, digital integratedcircuit test is still generally regarded as a difficult prob-lem in international areas at present.For the problem that test patterns are obtained bydetermined finite faults s… 相似文献
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