Robustness and exponentiality in redundant repairable systems

A redundant system of independent repairable components with general failure time and repair time distributions is considered. It is shown that the system failure time has an expectation dependent only on the mean failure times and mean repair times of the components and not on their distributions. An intuitive argument is provided, based on the time of onset of the quasi-stationary distribution on the set of working states, to show that for highly reliable systems, the system failure time is exponentially distributed to good approximation. The argument also justifies a simple figure of merit for the quality of the exponential approximation. A key ingredient in the analysis is the system relaxation time, an informal review of which is provided.     

基于BP神经网络的LED可靠性模型研究

根据LED可靠性与相关参数的映射关系,建立拓扑结构为6-12-1的BP神经网络。以实测白光LED芯片的理想因子、结温、色温漂移等参数为输入量,以寿命为输出量,计算模型精度。研究结果表明,该模型有良好的外推能力及鲁棒性,可在短时间内成功预测LED寿命,神经网络训练结果相关系数为99.8%,检验组误差小于3%。     

冗余技术提高PLC控制系统可靠性的研究

针对工业现场对PLC控制系统可靠性提出更高的要求,提出利用冗余技术提高其可靠性。分析了硬件冗余和软件冗余在PLC控制系统中的应用,详细阐述了PLC控制器、输入输出口、通讯网络和电源各自的冗余方法,并着重以西门子300/400系列PLC为例进行了软硬件冗余的架构和原理分析。最后对冗余控制系统的可靠性进行分析,结果表明,使用冗余技术可使PLC控制系统的可靠性得到明显提高。     

一个可靠机器,一个不可靠机器和一个缓冲库构成的系统的定性分析

本文用纯分析的方法给出了一个可靠机器 ,一个不可靠机器和一个缓冲库构成的系统解的存在唯一性证明     

复杂通信网络的结构分解法及其在可靠性分析中的应用

对复杂通信网络拓扑结构的恰当描述与刻画是研究其可靠性及确定信号流在其中有效的传输方式的前提。通过引进适当的数据结构并采用递归分解的技巧，本给出了将任意复杂通信网络分解为环、弦、链等基本网络结构的某种组合与连接的结构分解法，并由此得到了研究网络可靠性的新的两阶段法，即先分析各基本结构的可靠性，再由此给出原网络可靠性的估计。     

APPROXIMATING ANALYSIS OF A KIND OF REPAIRABLE STANDBY SYSTEMS

ＬＩＷＥＩ（李伟）；ＣＡＯＪＩＮＨＵＡ（曹晋华）（ＩｎｓｔｉｔｕｔｅｏｆＡｐｐｌｉｅｄＭａｔｈｅｍａｔｉｃｓ，ｔｈｅＣｈｉｎｅｓｅＡｃａｄｅｍｙｏｆＳｃｉｅｎｃｅｓ，Ｂｅｉｊｉｎｇ１０００８０，ＣｈｉｎａａｎｄＡｓｉａ－ＰａｃｉｆｉｃＯｐｅｒａｔｉｏ...     

Lifetime distribution and estimation problems of consecutive-k-out-of-n:F systems

Explicit formula is given for the lifetime distribution of a consecutive-k-out-of-n:F system. It is given as a linear combination of distributions of order statistics of the lifetimes of n components. We assume that the lifetimes are independent and identically distributed. The results should make it possible to treat the parametric estimation problems based on the observations of the lifetimes of the system. In fact, we take up, as some examples, the cases where the lifetimes of the components follow the exponential, the Weibull, and the Pareto distributions, and obtain feasible estimators by moment method. In particular, it is shown that the moment estimator is quite good for the exponential case in the sense that the asymptotic efficiency is close to one.This research was partially supported by the ISM Cooperative Research Program (94-ISM-CRP-5).     

Exact Solution to the One-Dimensional Dirac Equation with Time Varying Mass

We directly use the quantum-invariant operator method to obtain the closed-form solution to the one-dimensional Dirac equation with a time-changing mass with a little manipulation. The solution got is also applicable forthe case with time-independence mass.     

Consecutive-(r,f,k)out-of-n:F和Consecutive(f,g)-out-of-(r,n):F线性系统的可靠性

Consecutive-(r,f,k)-out-of-n:F系统由n个单元顺序连结而成,仅当在连续的r个单元中,至少有f个失效或者至少连续k个失效,整个系统才失效;而Consecutive-(f,g)-out-of-(r,n):F系统由n个单元顺序连结而成,仅当在整个系统中至少有f个失效或者在连续的r个单元中,至少有g个失效,整个系统才失效。本文运用马氏链嵌入方法,在单元之间相互独立以及单元之间马氏相关这两种情况下,给出线性系统的可靠性。     

闪速存储器中应力诱生漏电流的产生机理

通过实验研究了闪速存储器存储单元中应力诱生漏电流(SILC)的产生机理. 研究结果表明，在低电场应力下，其可靠性问题主要是由载流子在氧化层里充放电引起，而在高电场下，陷阱和正电荷辅助的隧穿效应导致浮栅电荷变化是引起闪速存储器失效的主要原因. 分别计算了高场应力和低场应力两种情况下SILC中的稳态电流和瞬态电流的大小. 关键词： 闪速存储器 应力诱生漏电流 电容耦合效应 可靠性