吐哈油田葡北3-12井超长封固段固井技术

葡北3-12注气井位于吐哈盆地葡北构造带中断葡北1号构造．井深为3610m。针对该区块地层承压能力低，易漏失，油气水窜严重，常规固井方法无法满足固井要求的问题，该井采用三段三凝制、常规水泥浆和泡沫水泥浆体系固井，并采用重钻井液顶替技术．降低施工压力。该技术能保证固井候凝过程中井底压力平衡，施工安全。现场应用表明，采用常规水泥浆和泡沫水泥浆固井技术．提高了低压易漏井、长封固井段的固井质量，解决了水泥返高不足的问题；并通过一次常规固井工艺实现了全井封固，简化了施工工艺，节约了成本，经济效益和社会效益十分显著。该井封固优质段累计达2600m，优质率达85％，固井结果良好。     

非金属夹杂物对硬线盘条拉拔性能的影响及其工艺控制

分析了非金属夹杂物对硬线盘条拉拔性能的影响及其来源 ,通过考察分析冶炼、浇注生产工艺针对非金属夹杂物含量的影响 ,提出了避免或减少非金属夹杂物含量的工艺控制方法。     

Improvement on threshold proxy signcryption scheme

Signcryption is a public key or asymmetric cryptographic method that provides simultaneously both message confidentiality and integrity at a lower computational and communication cost. This paper presents a （t, n） threshold proxy signcryption scheme in which no less than t proxy agents in the proxy group can produce the signcryption cryptogram. combines the functionality of threshold proxy signing and encryption. The proposed scheme combines the functionality of both threshold proxy signing and encryption, and provides fair protection for the sender and the proxy agents. This scheme is secure against attack of public key substitution. It also satisfies security properties such as confidentiality and authenticity.     

白云鄂博主矿开拓运输工艺转换有关问题的探讨

本文对白云鄂博主矿采场铁公路联合运输向公路运输转换位置是否确定为1638m水平以及运输工艺转换过程中相关问题进行分析论证，提出主矿采场铁路至少可向下延深一个水平，技术上可行，节约运费千万元以上。     

Investigation of the Correlation between Texture and Microstructure on a Submicrometer Scale in the TEM

In recent years the investigation of local texture and microstructure by analysis of electron backscatter diffraction patterns (EBSP) in the SEM has become a very powerful and popular method. With the introduction of SEM with field emission guns (FEG) the spatial resolution of EBSP measurements could be enhanced from 500 nm with a tungsten emitter to better than 50 nm. This evolution of SEM techniques raises the question whether transmission electron microscopy (TEM) still has fields of application in texture research. The present article answers this question with a clear “yes” and presents three examples of investigations where TEM is indispensable. The three examples comprise the investigation of the correlation between dislocation structure and deformation texture, a study on nucleation mechanisms of recrystallization in highly deformed metals and the investigation of microtexture and microstructure in nanocrystalline materials. Together with the presentation of these cases some of the necessary measurement techniques are described briefly. It is shown that TEM has to be applied when highest spatial resolution of orientation determination and imaging and high accuracy of orientation determination are to be reached, when the three‐dimensional and quantitative characterization of lattice defects is required or when materials with a high density of lattice defects are to be investigated.     

Implicit, long-term spatial contextual memory.

Learning and memory of novel spatial configurations aids behaviors such as visual search through an implicit process called contextual cuing (M. M. Chun & Y. Jiang, 1998). The present study provides rigorous tests of the implicit nature of contextual cuing. Experiment 1 used a recognition test that closely matched the learning task, confirming that memory traces of predictive spatial context were not accessible to conscious retrieval. Experiment 2 gave explicit instructions to encode visual context during learning, but learning was not improved and conscious memory remained undetectable. Experiment 3 illustrates that memory traces for spatial context may persist for at least 1 week, suggesting a long-term component of contextual cuing. These experiments indicate that the learning and memory of spatial context in the contextual cuing task are indeed implicit. The results have implications for understanding the neural substrate of spatial contextual learning, which may depend on an intact medial temporal lobe system that includes the hippocampus (M. M. Chun & E. A. Phelps, 1999). (PsycINFO Database Record (c) 2010 APA, all rights reserved)     

特钢长型材轧制技术新进展

在可持续发展原则指导下，强化控轧控冷、高精度轧制和改进表面与外形质量是当前特钢轧制技术发展的重点。     

厦门市气源转换的技术分析

分析了气源转换时原有输配系统的管道、调压设备、计量设备、用气设备与天然气系统相适应的问题，提出了相应的措施。     

数字分量电视图像的光纤传输实验

介绍了光纤传输数字电视的意义，电视信号分量数字化的标准和优点。利用自行研制的２７０Ｍｂ／ｓ光发射机和光接收机，建立了分量数字电视信号的光纤传输系统，直接传输了１００ｋｍ光纤，系统传输无误码，传输后图像质量不变。光接收机灵敏度达－２９．２４ｄＢｍ，动态范围为１３．５ｄＢ。无压缩电视图像的传输对于远程医疗和演播室间转输节目等有非常实际的意义。     

The electron microscopy of post-growth induced defects of ZnSe/GaAs epilayers

A fundamental research of structural defects induced upon post-growth processing of ZnSe/GaAs epilayers grown on (100) GaAs was done by identifying defect-related reflections in the transmission electron diffraction (TED) patterns of ZnSe. Structural artifacts, other than the as-grown defects, on this material system could be excluded according to our results. Four types of abnormal reflections have been observed in addition to primary reflections. These extra reflections are sensitive to the post-growth processing of ZnSe epilayers and may arise from various external effects, rather than epitaxy growth, such as irradiation damage, surface oxidation, and surface contamination. By mapping these reflections at several major zone axes using TED patterns, we found that the reciprocal lattice for a ZnSe crystal with structural defects consists of two distinct types of extra reflections associated with irradiation damage. The first type of extra reflections is ±1/3{111} and the other is ±1/2{111} corresponding to pure-edge and non-edge dislocation loops, respectively. For (100) oriented wafers, the ±1/3{111} and ±1/2{111} reflections were observed only on two of the four possible 〈111〉 variants (i.e. [111]_Zn and [111]_Zn)and this phenomenon was attributed to the anisotropy of defect distribution. Extra reflections associated with surface oxidation and contamination are also observed. The orientation relationships between a surface hexagonal ZnO and a cubic ZnSe film are [0001]_ZnO//[−111]_ZnSe, and [01−11]_ZnO//[011]_ZnSe. The origin, characterization, and elimination of these induced reflections are discussed. With the knowledge about these extra effects on structural defect formation, we have shown the real microstructure of ZnSe epilayers.