Fabricating nanostructures through a combination of nano-oxidation and wet etching on silicon wafers with different surface conditions

This study investigates the surface conditions of silicon wafers with native oxide layers (NOL) or hydrogen passivated layers (HPL) and how they influence the processes of nano-oxidation and wet etching. We also explore the combination of nano-oxidation and wet etching processes to produce nanostructures. Experimental results reveal that the surface conditions of silicon wafers have a considerable impact on the results of nano-oxidation when combined with wet etching. The height and width of oxides on NOL samples exceeded the dimensions of oxides on HPL samples, and this difference became increasingly evident with an increase in applied bias voltage. The height of oxidized nanolines on the HPL sample increased after wet etching; however, the width of the lines increased only marginally. After wet etching, the height and width of oxides on the NOL were more than two times greater than those on the HPL. Increasing the applied bias voltage during nano-oxidation on NOL samples increased both the height and width of the oxides. After wet etching however, the increase in bias voltage appeared to have little effect on the height of oxidized nanolines, but the width of oxidized lines increased. This study also discovered that the use of higher applied bias voltages on NOL samples followed by wet etching results in nanostructures with a section profile closely resembling a curved surface. The use of this technique enabled researchers to create molds in the shape of a silicon nanolens array and an elegantly shaped nanoscale complex structures mold.     

Differential nanofiller cluster formations in dental adhesive systems

Nanofillers are added to dental adhesives to improve mechanical properties of the hybrid layer. Ethanol or water added to the demineralized dentin to improve adhesive infiltration may produce filler aggregation. OBJECTIVE: To assess the effect of 5 vol% water or ethanol addition on nanoparticles distribution in dental adhesives. METHODS: Six available commercial adhesives systems were selected: Clearfil SE Bond (CSE), Clearfil Protect Bond (CPB), FL‐Bond (FLB), Clearfil S3 (CS3), Bond Force (BF), One Up Bond F plus (OUB), and an experimental adhesive system without filler (EXP). Polymer films were obtained by adding 0 (control) or 5 vol% water or ethanol into the bonding resins. Preparations were light‐cured (40 s). Three specimens were analyzed for each mixture. Three phases and 3D images were taken from each specimen by means of an atomic force microscope in taping mode (TM/AFM). Cluster sizes and surface nanoroughness were assessed. RESULTS: Control specimens from CSE, FLB, OUB, and BF presented clusters. The addition of solvents lead to particles aggregation in tested bonding resins. Ethanol addition produced more aggregates, particularly in adhesives containing fluoraluminosilicate as fillers. CONCLUSIONS: Nanofillers aggregation occurred in all adhesive systems in presence of additional solvents. In general, aggregate sizes were higher after the addition of ethanol. Formed clusters size values are always above the dimensions of the spaces existing between the demineralized collagen fibers. Microsc. Res. Tech. 75:749–757, 2012. © 2011 Wiley Periodicals, Inc.     

Fat bloom formation and characterization in milk chocolate observed by atomic force microscopy

The surface microstructure and polymorphic behavior of milk chocolate subjected to multiple thermal cycles between 20 and 32, 33, or 34°C were examined using atomic force microscopy (AFM) and powder X-ray diffraction (XRD). The surface of unbloomed milk chocolate was smooth (surface roughness of 278 nm) and consisted of small, evenly distributed crystals. XRD results indicated the presence of mostly form V crystals and little or no form VI crystals. Cycling between 20 and 32°C resulted in little bloom formation and change in polymorphic behavior. Gradual bloom formation occurred as a result of cycling between 20 and 33°C, and was accompanied by the nascence of form VI crystals. Surface roughness increased gradually from 417 nm after one cycle to 476 and 521 nm after two and three cycles, respectively. Extensive bloom arose from cycling between 20 and 34°C. Surface roughness increased from 373 nm after one cycle to 603 and 736 nm after two and three cycles, respectively. This heavily bloomed chocolate consisted of jutting crystals and large raised, yet smooth areas that were haphazardly located within the chocolate matrix. In summary, a new perspective on the development of surface bloom due to thermal cycling is provided.     

Porous Titania Thin Films Grown by Anodic Oxidation for Hydrogen Sensors

Porous titanium dioxide (Titania) thin films were grown by anodic oxidation using high purity (99.7%) titanium foil in a dilute sulphuric acid (1 M) medium. The anodization process was carried out for 30 minutes with 20 mA/cm² and 50 mA/cm² current densities. The samples were characterized by XRD, SEM, and AFM techniques. It was found that the grown porous titania films were less sensitive to 500 ppm hydrogen in air ambient below 300°C; however, the sensitivity and response behavior of the film at 300°C are very much dependent on the growth conditions. Particularly, the films grown at current density 50 mA/cm² and 1 M acid concentration exhibited the lowest response time of 151 sec at 300°C.     

一种新型Si电子束蒸发器的研制及其应用研究

我们成功地设计出一种新型的Si电子束蒸发器,并将它应用于Ge/Si(111)量子点的生长.由于采用悬臂式设计,它完全克服了高压短路的问题.电子束蒸发器的性能试验表明,稳定输出功率可以控制输出稳定的Si束流.应用这种电子束蒸发器可以在700 ℃,成功沉积出平整的单晶Si薄膜.进一步的试验表明,在这种缓冲层表面可以自组装生长出Ge量子点.     

用ECR氮等离子对纳米TiO2薄膜光谱响应改性的研究

采用ECR氮等离子对纳米TiO2薄膜表面进行氮注入处理来改善纳米TiO2催化剂的光谱响应范围。处理后表面颜色变成微黄色，说明氮离子已注入到TiO2薄膜里；AFM观察处理前后的薄膜，发现表面形貌没有很大改变；紫外—可见光谱分析结果表明，TiO2薄膜催化剂的光谱响应红移了12—18nm；通过不同功率、不同处理时间研究显示，在微波功率为400W、处理60min改性效果最理想。     

纳米样板的制备及其精度分析

介绍了纳米样板的研究现状及制备工艺，特别对扫描探针显微镜(SPM)表面局域氧化反应工艺进行了详述；分析了原子力显微镜(AFM)探针诱导局域氧化工艺的原理及其影响参数，原理为高度局域化的电化学反应，影响参数包括探针上所施加的电压、扫描速度、探针曲率半径、相对湿度以及氧化物厚度等；用该方法分别制备了5条栅线和7条栅线的一维纳米结构样板，并对7条栅线的纳米结构样板的精度和不确定度影响因素进行了分析。     

Surface modification of AFM silicon probes for adhesion and wear reduction

Tip wear of silicon probes used for an atomic force microscope (AFM) is a critical issue. Wear can result in an increase of tip radius and adhesion between tip and sample, thus reducing the image resolution and introducing artifacts. In order to reduce adhesion, friction, and wear so as to reduce tip related artifacts, liquid lubricant (Z-TETRAOL), self-assembled monolayers (pentafluorophenyltriethoxysilane (PFPTES)), and fluorocarbon polymer (Fluorinert™) were applied on the silicon probe. A comprehensive investigation of adhesion, friction, and wear of the uncoated/coated tips in both ambient air and various humidity levels as well as the influence of the coatings on the image resolution was performed. Experiments showed that the coatings reduced the adhesion, friction, and wear of the silicon tip, improved the initial image resolution, and exhibited less deterioration as compared to that of uncoated tip in the long-term test.     

AFM剖析纳米TiO2自清洁玻璃表面形貌

采用AFM对纳米TiO2自清洁玻璃表面形貌进行剖析、发现玻璃膜表面纳米TiO2粒径随TiO2溶胶浓度增大而增大，其在可见光条件下玻璃表面超亲水性随溶胶浓度提高而下降；稀土离子掺杂使纳米TiO2粒径变小，Ce^3＋掺杂使TiO2柱径从50nm变为30nm，玻璃的可见光透过率提高．从7了％提高到86％，对有机物的光催化效率提高、在90min内，对甲泰的分解率从90．02％提高到92．85％；钢化处理对纳米TiO2柱径的影响不大，但使镀膜玻璃的可见光透过率从86％提高到88％，Ce^3＋掺杂的钢化玻璃的TiO2对甲苯的分解率从92.85％提高到93．15％，分解时间从90min缩短到60min，Y^3＋掺杂对TiO2的影响小于Ce^3＋掺杂。