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61.
数字多媒体广播(DMB)是从数字音频广播(DAB)基础上发展起来的一种新型广播技术。数字音频广播是在调幅AM和调频FM之后的第三代广播技术。通过对数字多媒体技术的介绍较全面地阐述了其技术系统、功能、现状及发展前景。 相似文献
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64.
Wei-Hua Guo Yong-Zhen Huang Chun-Lin Han Li-Juan Yu 《Quantum Electronics, IEEE Journal of》2003,39(6):716-721
To improve the accuracy of measured gain spectra, which is usually limited by the resolution of the optical spectrum analyzer (OSA), a deconvolution process based on the measured spectrum of a narrow linewidth semiconductor laser is applied in the Fourier transform method. The numerical simulation shows that practical gain spectra can be resumed by the Fourier transform method with the deconvolution process. Taking the OSA resolution to be 0.06, 0.1, and 0.2 nm, the gain-reflectivity product spectra with the difference of about 2% are obtained for a 1550-nm semiconductor laser with the cavity length of 720 /spl mu/m. The spectra obtained by the Fourier transform method without the deconvolution process and the Hakki-Paoli method are presented and compared. The simulation also shows that the Fourier transform method has less sensitivity to noise than the Hakki-Paoli method. 相似文献
65.
Kerber A. Cartier E. Pantisano L. Degraeve R. Kauerauf T. Kim Y. Hou A. Groeseneken G. Maes H.E. Schwalke U. 《Electron Device Letters, IEEE》2003,24(2):87-89
The magnitude of the V/sub T/ instability in conventional MOSFETs and MOS capacitors with SiO/sub 2//HfO/sub 2/ dual-layer gate dielectrics is shown to depend strongly on the details of the measurement sequence used. By applying time-resolved measurements (capacitance-time traces and charge-pumping measurements), it is demonstrated that this behavior is caused by the fast charging and discharging of preexisting defects near the SiO/sub 2//HfO/sub 2/ interface and in the bulk of the HfO/sub 2/ layer. Based on these results, a simple defect model is proposed that can explain the complex behavior of the V/sub T/ instability in terms of structural defects as follows. 1) A defect band in the HfO/sub 2/ layer is located in energy above the Si conduction band edge. 2) The defect band shifts rapidly in energy with respect to the Fermi level in the Si substrate as the gate bias is varied. 3) The rapid energy shifts allows for efficient charging and discharging of the defects near the SiO/sub 2//HfO/sub 2/ interface by tunneling. 相似文献
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Obtaining shorter regular expressions from finite-state automata 总被引:1,自引:0,他引:1
We consider the use of state elimination to construct shorter regular expressions from finite-state automata (FAs). Although state elimination is an intuitive method for computing regular expressions from FAs, the resulting regular expressions are often very long and complicated. We examine the minimization of FAs to obtain shorter expressions first. Then, we introduce vertical chopping based on bridge states and horizontal chopping based on the structural properties of given FAs. We prove that we should not eliminate bridge states until we eliminate all non-bridge states to obtain shorter regular expressions. In addition, we suggest heuristics for state elimination that leads to shorter regular expressions based on vertical chopping and horizontal chopping. 相似文献
68.
Sixiong Han Yasuaki Ichikawa 《International journal for numerical methods in engineering》1995,38(24):4081-4100
In this paper, a mathematical model is proposed for the problem of the scattering of plane waves in a three-dimensional cracked materials. Instead of obtaining closed-form solutions as in conventional theoretical analysis methods, this approach, called the Equivalent Nodal Force (ENF) method formulates the mechanical effects of cracks as an equivalent nodal force in a numerical procedure, and physically translates cracked material into an equivalent continuous one. Several mechanical relations between waves and cracks are evident from this method. Also the results of several numerical calculations are presented and these are compared with those obtained by the conventional methods. 相似文献
69.
部分种子成分的特征X射线在等效生物材料中衰减的测定 总被引:6,自引:5,他引:1
用Si(Li)探测器实现了Na、Mg、S、Cl的特征X射线在有机膜中的相对衰减以及与O、K元素的特征X射线能量相当的X射线或轫致辐射在有机膜中的相对衰减,分别得出了它们减的数学描述,并把实验得到不同能量的X射线在有机膜中的质量吸收系数与Berkeley的OCG软件计算出的结果相比,相关都小于30%。 相似文献
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