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采用Y2O3和Ni 作催化剂,在H2和He混合气体气氛下通过弧光放电法得到高纯度的单壁碳纳米管.在用热氧化提纯法对高纯度碳纳米管产物进行进一步提纯后,用这种碳纳米管粉末与酒精配制成悬浮液,通过旋涂、干燥、退火等工艺得到碳纳米管阴极薄膜.I-V测试表明用该法得到的碳纳米管薄膜具有良好的电子场致发射性能. 相似文献
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Ge2Sb2Te5材料与非挥发相转变存储器单元器件特性 总被引:1,自引:0,他引:1
对Ge2Sb2Te5材料的结构、形貌和电学特性进行了表征,将材料应用于不挥发存储单元器件中并研究了器件性能。研究了退火温度对薄膜电阻率的影响,发现在从高阻向低阻状态转变的过程中,电阻率下降的趋势发生变化,形成拐点,分析表明这是由于在拐点处结构由面心立方向密排六方结构转变所致;对不同厚度Ge2Sb2Te5薄膜的电阻率进行了分析,结果表明当厚度薄于70nm时,电阻率随厚度显著上升而迁移率下降,材料晶态电学性能的测量显示,材料有正电阻温度系数并以空穴导电;测量了Ge2Sb2Fe5非挥发相转变存储器单元的I-V曲线,发现有阈值特性,在晶态时电学特性呈欧姆特性,非晶态时I-V低场为线性关系,电场较高时呈指数关系。 相似文献
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Both sputtering conditions and crystallizing temperatures have great influence on the microstructures and phase transformation characteristics for TislNi44Cus. By means of the resistance-temperature measurement, X-ray diffraction and atomic fore microscopic study, the results indicate that the transformation temperatures of the thin films increase and the “rock candy“ martensitic relief is more easily obtained with promoting the sputtering Ar pressure, sputtering power, orcrystallizing temperature. However, when sputtering Ar pressure, sputtering power, or crystallizing temperature are lower, a kind of “chrysanthemum“ relief, which is related with Ti-rich GP zones, is much easier to be observed. The reason is that during crystallization process, both of the inherent compressive stresses introduced under the condition of higher sputteringpressure or higher crystallizing temperature are helpful to the transition from GP zones to Ti2(NiCu) precipitates and the increase of the transformation temperatures. The addition of copper to substitute for 5 96 nickel in mole fraction can reduce the transformation hvsteresis width to about 10 - 15 ℃. 相似文献
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新型悬空结构射频微电感的制作与测试 总被引:1,自引:0,他引:1
利用MEMS(Micro Electro-Mechanical System:微机电系统)工艺中的牺牲层技术制作了一种新型悬空结构微电感,在此悬空结构中,微电感的线圈制作在与衬底平行的平面上,线圈与衬底之间有立柱支撑;此新型微电感的制作工艺流程简单,与集成电路工艺相兼容,且其高频性能较好。并对此结构微电感的性能进行了测试,测试频率范围在0.05~10 GHz之间,结果表明:当悬空结构微电感的悬空高度为20 靘,工作频率在3~5 GHz范围内时,其电感量达到4 nH,其Q值最大可达到22。 相似文献
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