射频功率对辉光聚合物薄膜结构与光学性质的影响

采用三倍频射频辉光放电聚合技术,利用低压等离子聚合装置在不同功率条件下制备辉光放电聚合物(GDP)薄膜. 利用表面轮廓仪、Fourier变换红外光谱仪表征所制备薄膜在不同功率下的生长速率和化学结构, 讨论了功率变化对薄膜生长速度和化学结构的影响.利用元素分析仪和紫外可见光谱仪表征GDP薄膜中碳氢原子比和光学性质. 研究表明:薄膜的生长速率随射频功率的增大先增加后减少,功率为40 W时,生长速率可达到0.34 μm/h. 在波长大于500 nm的可见光区, GDP薄膜的光学透过率都在90%以上. GDP薄膜的光学间隙随射频功率的增大先减少后增加,射频功率为50 W时制备GDP薄膜的光学间隙最小.     

工作压强对硅掺杂辉光放电聚合物结构和性能的影响

采用辉光放电聚合技术,在不同工作压强条件下制备了掺硅的辉光放电聚合物(Si-GDP)薄膜.并采用傅里叶变换红外吸收光谱和X射线光电子能谱(XPS)对Si-GDP薄膜进行了表征,分析了压强变化对其内部结构及成分的影响.利用紫外—可见光谱对Si-GDP薄膜的光学带隙进行了分析.结果表明:Si-GDP薄膜中Si元素主要以Si—C,Si—H,Si—O,Si—CH₃的键合形式存在;随着工作压强的增大,薄膜中Si—C键相对含量先减小后增加;从Si-GDP薄膜的XPS分析可以发现,C—C与C C含 关键词： 硅掺杂辉光放电聚合物薄膜 工作压强 傅里叶变换红外吸收光谱 X射线光电子能谱     

热处理对CH薄膜表面粗糙度及力学性能的影响

利用低压等离子体化学气相沉积法制备厚度约为7μm的辉光放电聚合物薄膜,将制备的薄膜样品放入通有氩气保护的热处理炉中加热至300℃,分别进行6,10,24h的保温热处理。通过白光干涉仪观察分析了不同保温时间下辉光放电聚合物薄膜的表面粗糙度;利用傅里叶变换红外吸收光谱分析了300℃条件下不同保温时间对薄膜结构的影响;采用纳米压痕仪表征了不同保温时间热处理后,薄膜硬度及模量的变化。结果表明:随着保温时间的增加,薄膜的表面均方根粗糙度由12nm降至4.43nm。薄膜结构中甲基的相对含量减少,双键的相对含量增加,碳链变长,同时薄膜网络结构的交联化程度增强。硬度和模量随着保温时间的增加先减小后增大。     

热处理对制备辉光放电聚合物薄膜结构及光学性能的影响

利用低压等离子体聚合技术制备了约5 μm的辉光放电聚合物薄膜, 将所制备的样品放入热处理炉中通入氩气保护, 分别在280 ℃, 300 ℃, 320 ℃, 340 ℃进行热处理. 对热处理后的样品采用傅里叶变换红外吸收光谱(FT-IR)分析了不同热处理温度对薄膜结构的影响. 对CH振动区进行了分峰高斯拟合, 定量的分析了个官能团的变化. 利用紫外可见光谱仪分析了热处理前后薄膜在紫外–可见光区域内光学透过率及光学带隙的变化. 结果表明: 随着热处理温度的升高,薄膜中H含量减少, 薄膜中甲基相对含量减少, 而双键、芳香环结构相对含量增加, 在600 nm以后的可见光区, 薄膜的透过率减小. 薄膜光透过率的截止波长红移, 光学带隙减小. 关键词： 热处理 薄膜结构 等离子体聚合 光学性能     

硅掺杂辉光放电聚合物薄膜的热稳定性研究

采用等离子体辉光放电聚合技术,在不同四甲基硅烷(TMS)流量条件下制备了硅掺杂辉光放电聚合物(Si-GDP)薄膜,采用傅里叶变换红外光谱、X射线光电子能谱和热重(TG)分析技术分析了不同TMS流量对Si-GDP薄膜结构与热稳定性的影响.结果表明:随着TMS流量在0–0.06 cm³/min范围变化,Si-GDP薄膜中Si的原子含量C_Si为0–16.62%;含Si红外吸收峰的相对强度随TMS流量的增加而明显增大;Si-GDP薄膜的TG分析显示,温度在300 ℃时,随TMS流量的增加,Si-GDP薄膜的失重减少,热稳定性增强. 关键词： 硅掺杂辉光放电聚合物薄膜 X射线光电子能谱 热稳定性     

不同工作压强下辉光放电聚合物薄膜的表面形貌与光学性质

利用低压等离子体聚合技术在不同工作压强下制备了辉光放电聚合物(GDP)薄膜。利用原子力显微镜、傅里叶红外光谱仪、元素分析仪和紫外-可见光谱仪对GDP薄膜的表面形貌、化学结构、碳氢原子数比以及光学性质进行了表征。分析了工作压强对薄膜表面形貌、化学结构、碳氢原子比和光学性质的影响以及相互关系。结果表明:GDP薄膜的表面形貌随工作压强的增大而变得平整光滑,均方根粗糙度逐渐减小。随工作压强增大,GDP薄膜的化学结构的相互交联化程度减弱,C=C双键含量不断减小,碳氢原子数比不断减小,氢元素含量逐渐增大,薄膜的光学透过率截止波长发生"蓝移",光学间隙不断增加。     

GDP/D-GDP化学结构与力学性能的研究

利用低压等离子体增强化学气相沉积技术制备碳氢辉光放电聚合物(GDP)和全氘代辉光放电聚合物(D-GDP)薄膜。利用表面轮廓仪、傅里叶红外光谱仪和纳米压痕技术对制备的样品进行表征,讨论了GDP/D-GDP薄膜的沉积速率、化学结构和力学性能在ICF物理实验用靶应用中的优缺点。结果表明:GDP/D-GDP薄膜的沉积速率都随反应气体流量比例近线性增加,GDP的沉积速率达到2.6μm,D-GDP的沉积速率达到1μm,GDP的沉积速率远大于D-GDP的沉积速率;D-GDP薄膜内部的交联化程度较弱,D-GDP更有利于靶丸内燃料的红外均化;GDP的力学性能明显优于D-GDP,更有利于ICF物理实验用靶的燃料填充与装配操作。     

射频功率对辉光放电H2/C4H8等离子状态的影响

采用辉光放电技术和等离子体质谱诊断技术,研究了H₂/C₄H₈混合气体等离子体中正离子成分及主要正离子能量随射频功率的变化规律,并分析了H₂/C₄H₈混合气体主要的离解机理和形成过程.研究表明:随着射频功率的增加,碳氢碎片离子的浓度增加,在20 W时达到最大值,25 W后有所减小.当射频功率小于10 W时,H₂/C₄H₈混合气体等离子体中C₄H₉⁺相对浓度最大,当功率大于或等于10 W时,C₃H₃⁺相对浓度最大.随着射频功率的增大,碳氢碎片离子的能量逐渐增加.对H₂/C₄H₈混合气体等离子体的组成与能量进行的定性分析,将为H₂/C₄H₈混合气体辉光放电聚合物涂层工艺参数优化提供参考.     

辉光放电聚合物薄膜的红外性质研究

为了实现惯性约束聚变 (ICF)点火,需要制备出均匀的高密度燃料靶。对于氘氘 (DD) 冰层,红外均化技术可用于改善其内表面粗糙度。本文利用红外光谱仪和红外显微镜研究了辉光放电聚合物(GDP)薄膜和靶球的红外吸收性质,得到了GDP薄膜材料特定波长处的红外吸收系数。通过比较薄膜材料和靶球的红外吸收,证实了热处理可以降低GDP材料中的氧化位点,从而抑制羟基(—OH)峰的形成,优化DD冰层的红外均化效果。利用所得实验数据对DD均化实验中红外均化积分球所需要的红外功率和国家点火装置(national ignition facility, NIF)标准靶的红外透射率进行了估算,计算结果对DD冰红外均化实验具有重要指导作用。     

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在工作气体采用氩气和甲烷混合气体(4:1)的直流辉光放电中,在工作气压分别为10、20、30和40Pa以及沉积时间分别为10、20和30min下利用等离子体化学气相沉积法在内径10mm长100mm的304不锈钢管内表面制备了类金刚石薄膜,并利用喇曼光谱研究了沉积的工作气压和时间对薄膜微观结构的影响。通过对喇曼谱图进行定量解析发现：随着压强的增加,D峰、G峰位置、两峰峰宽以及其强度比值ID/IG都呈先减小后增大趋势,20Pa时达到最低点;随着沉积时间的增加,D峰、G峰位置向低波数端减小,半峰宽减小;D峰、G峰的强度比ID/IG减小。定量解析的结果表明,随沉积时间的增加,DLC薄膜中的sp3含量会增多,结构会相对更有序,薄膜中石墨团簇的尺寸会更大。     

射频功率对类金刚石薄膜结构和性能的影响

利用直流-射频-等离子体增强化学气相沉积技术在单晶硅表面制备了类金刚石薄膜，采用原子力显微镜、Raman光谱、x射线光电子能谱、红外光谱和纳米压痕仪考察了射频功率对类金刚石薄膜表面形貌、微观结构、硬度和弹性模量的影响.结果表明，制备的薄膜具有典型的含H类金刚石结构特征，薄膜致密均匀，表面粗糙度很小.随着射频功率的升高，薄膜中成键H的含量逐渐降低，而薄膜的sp3³含量、硬度以及弹性模量先升高， 后降低，并在射频功率为100W时达到最大. 关键词： 等离子增强化学气相沉积 类金刚石薄膜 射频功率 结构和性     

溅射功率对碳化硼薄膜组分与力学性能的影响

采用射频磁控溅射技术,在不同溅射功率条件下制备了碳化硼薄膜,并用X射线光电子能谱(XPS)和傅里叶变换红外吸收光谱(FT-IR)对碳化硼薄膜的组分进行了定量表征,分析了功率变化对碳化硼组分的影响。利用纳米压入仪通过连续刚度法(CSM)对碳化硼薄膜的硬度和模量等力学性能进行了分析。研究表明:随着功率的增大,硼与碳更易结合形成BC键,在功率增大到250 W时,BC键明显增多;在250 W时,硼与碳的原子分数比出现了最大值5.66;碳化硼薄膜的硬度与模量都随功率的增大呈现出先增大后减小的趋势,且在250 W时均出现了最大值,分别为28.22 GPa和314.62 GPa。     

Annealing effect on microstructure and mechanical properties of amorphous Al-C-N films

Al-C-N thin films with different Al contents were deposited on Si (1 0 0) substrates by closed-field unbalanced reactive magnetron sputtering in the mixture of argon and nitrogen gases. These films were subsequently vacuum-annealed at 700 °C and 1000 °C, respectively. The microstructures of as-deposited and annealed films were characterized by X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM); while the hardness and elastic modulus values were measured by nano-indention method. The results indicated that the microstructure of both as-deposited and annealed Al-C-N films strongly depended on Al content. For thin films at low Al content, film delamination rather than crystallization occurred after the sample was annealed at 1000 °C. For thin films at high Al content, annealing led to the formation of AlN nanocrystallites, which produced nanocomposites of AlN embedded into amorphous matrices. Both the density and size of AlN nanocrystallites were found to decrease with increasing depth from the film surface. With increasing of annealing temperature, both hardness and elastic modulus values were decreased; this trend was decreased at high Al content. Annealing did not change elastic recovery property of Al-C-N thin films.     

The structure, surface topography and mechanical properties of Si-C-N films fabricated by RF and DC magnetron sputtering

Silicon carbon nitride thin films were deposited on Co-Cr alloy under varying deposition conditions such as sputtering power and the partial pressure ratio of N₂ to Ar by radio frequency and direct current magnetron sputtering techniques. The chemical bonding configurations, surface topography and hardness were characterized by means of X-ray photoelectron spectroscopy, atomic force microscopy and nano-indentation technique. The sputtering power exhibited important influence on the film composition, chemical bonding configurations and surface topography, the electro-negativity had primary effects on chemical bonding configurations at low sputtering power. A progressive densification of the film microstructure occurring with the carbon fraction was increased. The films prepared by RF magnetron sputtering, the relative content of the Si-N bond in the films increased with the sputtering power increased, and Si-C and Si-Si were easily detachable, and C-O, N-N and N-O on the film volatile by ion bombardment which takes place very frequently during the film formation process. With the increase of sputtering power, the films became smoother and with finer particle growth. The hardness varied between 6 GPa and 11.23 GPa depending on the partial pressure ratio of N₂ to Ar. The tribological characterization of Co-Cr alloy with Si-C-N coating sliding against UHMWPE counter-surface in fetal bovine serum, shows that the wear resistance of the Si-C-N coated Co-Cr alloy/UHMWPE sliding pair show much favourable improvement over that of uncoated Co-Cr alloy/UHMWPE sliding pair. This study is important for the development of advanced coatings with tailored mechanical and tribological properties.     

射频功率对辉光放电聚合物结构和性能的影响

采用辉光放电技术,利用三倍频射频电源制备了不同功率下的辉光放电聚合物(GDP)涂层.并对GDP涂层进行了傅里叶变换红外吸收光谱(FT-IR)和元素分析仪表征,讨论了功率变化对其内部结构的影响.利用热重法(TG)表征了GDP涂层在30—650 ℃范围内的热稳定性.结果表明:随着射频功率的提高,GDP涂层的沉积速率增大;SP³CH₃和联结甲基的乙烯基强度明显减小,SP³CH₂, SP²CH_{2 关键词： GDP涂层 红外吸收谱 热稳定性 射频功率}     

Synthesis and Properties of Thermosensitive Poly(N-Isopropylacrylamide)/Waterborne Polyurethane Graded Concentration Hybrid Films

Temperature-sensitive hybrid films were synthesized with a concentration gradient by casting and UV curing of N-isopropylacrylamide (NIPAAm) monomers (0%–70%) on the free surface of waterborne polyurethane (WPU) films on a Teflon substrate. The surface hardness and contact angle of the free surface with a water drop increased asymptotically with the addition of NIPAAm, whereas those on the substrate side were virtually unchanged. The diffusion coefficient (D), rates of swelling at 20°C (below the lower critical solution temperature (LCST) of poly(N-isopropylacrylamide) (PNIPAM)) and deswelling at 50°C (above the LCST) increased with increasing NIPAM content, showing favorable thermosensitivity. In addition, the glassy state modulus and glass transition temperature (Tg) of the film increased with increasing NIPAM content, whereas the rubbery modulus decreased due to the increased molecular weight between the crosslinks. In addition, as the NIPAM content increased, the film showed a positive yield with an increased yield and fracture stress and decreased ductility. Above 50% NIPAM, the film became brittle, showing a linear stress–strain relationship.     

Superhard Nb-Si-N composite films synthesized by reactive magnetron sputtering

By means of the reactive magnetron sputtering method, a series of Nb-Si-N composite films with different Si contents were deposited in an Ar, N₂ and SiH₄ mixture atmosphere. These films’ chemical composition, phase formation, microstructure and mechanical properties were characterized by the energy dispersive spectroscopy, X-ray diffraction, transmission electron microcopy, atomic force microscopy and nanoindentation. The experimental results showed that the silicon content in the Nb-Si-N composite films can be conveniently controlled by adjusting the SiH₄ partial pressure in mixed gas. The hardness and elastic modulus of the Nb-Si-N films were remarkably increased with a small amount of silicon addition and reached their maximum values of 53 and 521 GPa, respectively, at 3.4 at.% Si. Such an obvious enhancement of mechanical properties is related to the increment of crystal defects in the Nb-Si-N films. With silicon content increasing in the films further, the mechanical properties decreased gradually to somewhat a bit lower than those of the NbN film.     

Effect of RF power on the optical and morphological properties of RF plasma polymerised linalyl acetate thin films

Thin films derived from linalyl acetate were fabricated using the Radio Frequency (RF) plasma polymerisation technique between RF power levels of 10 and 75 W. The optical properties of the films were investigated using spectroscopic ellipsometry and UV-vis spectroscopy between 200 and 1000 nm. An optical band gap of approximately 3 eV for all power levels was determined from Tauc plots. The surface morphology and hardness of the material were studied using AFM and nano-indentation respectively to determine the effect of RF power on the thin film properties. Smooth surfaces with an average roughness of approximately 0.2 nm with consistent morphology were obtained across all power levels, while hardness demonstrated a linearly increasing dependence on RF deposition power, with values ranging between 0.29 and 0.44 GPa. These studies indicate the ability to tailor film characteristics by varying the RF deposition power, and the potential for the films to be used within electronic devices as encapsulation layers, insulating layers, or as semiconducting layers with the introduction of charge carriers to the chemical structure of the material.     

Research on adhesion strength and optical properties of SiC films obtained via RF magnetron sputtering

SiC is widely used in various mechanical applications as a protective film because of its strength, thermal stability and good mechanical hardness. Here, amorphous SiC thin films with AlN as a buffer layer were deposited on glass and Si substrates through RF magnetron sputtering at different RF powers. The influence of the AlN buffer layer thickness on the morphological and the mechanical properties of the composite films was investigated. Results demonstrate that the AlN buffer layer can effectively improve the adhesion strength of SiC thin films, which has increased gradually from 26.78 N to 37.66 N. The transmittance of SiC thin films was measured using a UV–Vis–NIR spectrophotometer over a spectral range of 300–1200 nm. The average transmittance of SiC films decreases with increasing RF power, and their optical band gap values have varied from 3.31 eV to 3.50 eV.     

Effect of air post contamination on mechanical properties of amorphous carbon nitride thin films

We report in this study the mechanical, structural and compositional characteristics of amorphous carbon nitride films (a-CN_x) deposited on Si(100) using RF magnetron sputtering of graphite targets in pure nitrogen and under different RF powers. The properties of the films were determined in their as deposited state using nuclear reaction analysis (NRA), elastic recoil detection (ERDA), infrared (IR) absorption and Raman spectroscopy. The mechanical properties were obtained combining nanoindentation and residual stress measurements. The presence of various types of C-N bonds, as well as the post-deposition contamination of the deposited films by oxygen and water (voids) is revealed. The measured hardness and Young modulus were 0.9-2.03 and 23-27 GPa, respectively. These results have been analysed in term of the matrix flexibility which results from the nitrogen content and the porous character of the films, which can affect deeply the estimation of the physical-mechanical properties of the films.