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单片机测试向量生成技术研究 总被引:1,自引:0,他引:1
集成电路测试是保证产品质量的重要手段,如何检测MCU类复杂大规模集成电路是测试的难点。文章分析了目前单片机测试向量获取的几种方法,并在此基础上提出了一种单片机测试向量生成的新方法,通过将单片机测试向量分成测试激励和测试响应两部分,测试激励部分通过编写专用脚本软件将汇编程序转换成ATE专用测试向量,测试响应部分的测试向量则通过ATE的匹配功能来完成,从而成功地实现了对单片机的测试。 相似文献
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降低时延测试功耗的有效方法 总被引:6,自引:2,他引:4
研究时延测试(应用)中的功耗问题,提出一种降低时延测试功耗的测试向量排序方法,该方法利用时延测试向量对之间的海明距离为测试向量对排序,实验研究表明,在不同降低时延故障覆盖率的前提下,测试功耗平均降低90%。 相似文献
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本文提出了扫描设计中存储元件在扫描链中的最优排序方法,采用交迭测试体制和区间法能快速求出最优解,对于确定的测试向量集,用该方法的构造的扫描链能使电路总的测试时间最少。 相似文献
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随机测试向量产生时,一大部分的测试功耗是由于那些无贡献的测试向量所引起的。文中提出了一种基于测试片段间的转移低功耗BIST结构,该结构采用有效测试向量片段间转移的方式,除去了由随机产生而对故障覆盖率没有贡献的无效向量,并把有效测试向量片段以消耗功耗最小原则依次送入被测电路,减少了测试时间,在硬件代价不高的基础上有效降低了测试功耗。 相似文献
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用于k测试的BIST测试向量生成器 总被引:2,自引:0,他引:2
检测CMOS电路中的开路故障通常需要使用测试向量对。内建自测试(BIST)作为一种有效的测试技术可以大大降低测试开销。本文采用一种具有规则性、模块化和层叠结构的自动控制单元(CA),来构造产生测试向量对的BIST模块。实验证明,该方法用于瞬态电流测试是有效的。 相似文献
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集成电路测试方案的关键在于测试向量产生器的设计.传统的测试方法在测试向量生成、测试应用的过程中,没有充分利用测试数据位流来构建测试向量,从而造成了测试时间和存储开销的增加.为了减少测试成本,提出了一种基于test-per-clock模式的内建自测试方法.通过对线性移位测试结构的分析,提出了一种递进式的反复测试生成方法:顺序求解输入位流,逆向精简,多次求解以获得更优值,最终将测试集以较小的代价嵌入到test-per-clock位流中.在测试应用时,只需存储求解后的最小输入流,通过控制线性移位的首位从而生成所需的测试集.实验结果表明,在达到故障覆盖率要求的前提下,能显著地减少测试应用时间和存储面积开销. 相似文献
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ContextGenerating test cases based on software input interface is a black-box testing technique that can be made more effective by using structured input models such as input grammars. Automatically generating grammar-based test inputs may lead to structurally valid but semantically invalid inputs that may be rejected in early semantic error checking phases of a system under test.ObjectiveThis paper aims to introduce a method for specifying a grammar-based input model with the model’s semantic constraints to be used in the generation of positive test inputs. It is also important that the method can generate effective test suites based on appropriate grammar-based coverage criteria.MethodFormal specification of both input structure and input semantics provides the opportunity to use model instantiation techniques to create model instances that satisfy all specified constraints. The input interface of a subject system can be specified using a high-level specification scheme such as attribute grammars, and a transformation function from this scheme to an instantiable formal modeling language can generate the desired model instances.ResultsWe propose a declarative grammar-based input specification method that is based on a variation of attribute grammars and allows the user to specify input constraints in addition to input structure. The model can be instantiated automatically to generate structurally and semantically valid test inputs. The proposed method has the capability to specify test requirements and coverage criteria and use them to generate valid test suites that satisfy test coverage criteria requirements.ConclusionThe work presented in this paper provides a black-box test generation method for grammar-based software inputs that can automatically generate criteria-covering test suites. 相似文献
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《Information and Software Technology》2013,55(6):1045-1062
ContextTesting from finite state machines has been investigated due to its well-founded and sound theory as well as its practical application. There has been a recurrent interest in developing methods capable of generating test suites that detect all faults in a given fault domain. However, the proposal of new methods motivates the comparison with traditional methods.ObjectiveWe compare the methods that generate complete test suites from finite states machines. The test suites produced by the W, HSI, H, SPY, and P methods are analyzed in different configurations.MethodComplete and partial machines were randomly generated varying numbers of states, inputs, outputs, and transitions. These different configurations were used to compare test suite characteristics (number of resets, test case length) and the test suite length (i.e., the sum of the length of its test cases). The fault detection ratio was evaluated using mutation testing to produce faulty implementations with an extra state.ResultsOn average, the recent methods (H, SPY, and P) produced longer test cases but smaller test suites than the traditional methods (W, HSI). The recent methods generated test suites of similar length, though P produced slightly smaller test suites. The SPY and P methods had the highest fault detection ratios and HSI had the lowest. For all methods, there was a positive correlation between the number of resets and the test suite length and between the test case length and the fault detection ratio.ConclusionThe recent methods rely on fewer and longer test cases to reduce the overall test suite length, while the traditional methods produce more and shorter test cases. Longer test cases are correlated to fault detection ratio which favored SPY, though all methods have a ratio of over 92%. 相似文献
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Stephan Schulz 《International Journal on Software Tools for Technology Transfer (STTT)》2008,10(4):327-336
This paper presents a methodology for test suite implementation based on Testing and test control notation (TTCN)-3 libraries
which has been developed and successfully applied for the implementation of complex, standardized Internet Protocol version
6 (IPv6) conformance test suites at ETSI. It introduces the concept of a TTCN-3 library, discusses benefits and challenges,
and examines the effect of some important TTCN-3 language constructs on reuse. Finally, it explains in detail a layered library
design approach to test implementation in the context of a IPv6 test suite. 相似文献
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针对回归测试过程中由于测试需求的变更导致测试用例规模不断扩大、测试成本不断增加的问题,提出一种基于变异分析的测试用例约简方法(RTM)。首先,以测试用例能否检测到指定变异体为依据,对测试用例进行划分并创建二进制数值形式的变异体事务集矩阵;然后,应用改进的关联挖掘算法获取测试用例间的关联关系;最后,根据这些关联关系有效约简测试用例。6个经典程序仿真实验结果表明,RTM能够使约简后的测试用例约简率达到37%,与传统贪心算法和启发式算法相比,测试用例约简率提高了6%,且在提高测试用例约简率的同时,保证了测试覆盖率,单个测试用例的测试覆盖率平均提高了11%。所提方法能够利用尽可能少的测试用例满足更多的测试需求,有效提高了测试效率,降低了测试成本。 相似文献
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基于漏洞库的fuzzing测试技术 总被引:1,自引:1,他引:0
鉴于主流fuzzing(模糊)测试技术生成的测试用例随机性和针对性无法兼顾的问题,提出一种基于漏洞库的fuzzing测试技术.根据漏洞产生的原因和重现的方法对漏洞库进行整理分类,构造出测试用例集用于fuzzing测试.这样生成的测试用例集直接与漏洞相关,具有更强的针对性;同时扩展的测试用例集可以用于检测未知的同类漏洞,覆盖面更广,因此保证了一定的随机性.以ftp服务器测试为例,选取了W indow s平台下的4款ftp服务器进行测试,共发现了3款软件的6个新漏洞,提交Se-curityFocus并通过,其中5个漏洞得到了国际权威漏洞数据库CVE的认可. 相似文献
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Dennis Jeffrey 《Journal of Systems and Software》2008,81(2):196-221
Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible and to gain confidence that changes to software do not introduce defects. Once developed, test suites are reused and updated frequently, and their sizes grow as software evolves. Due to time and resource constraints, an important goal during regression testing of software is to prioritize the execution of test cases in a suite so as to improve the chances of increasing the rate of fault detection. Prior techniques for test case prioritization are based on the total number of coverage requirements exercised by the test cases. In this paper, we present a new approach to prioritize test cases that takes into account the coverage requirements present in the relevant slices of the outputs of test cases. We have implemented three different heuristics based on our relevant slicing based approach to prioritize test cases and conducted experiments to compare the effectiveness of our techniques with those of the traditional techniques that only account for the total requirement coverage. Our detailed experimental study and results provide interesting insights into the effectiveness of using relevant slices for test case prioritization in terms of ability to achieve high rate of fault detection. 相似文献