非晶硅顶电池中的n型掺杂层对非晶硅/微晶硅叠层太阳电池性能的影响

采用超高频等离子增强化学气相沉积(VHF-PECVD)技术,逐次高速沉积非品硅顶电池及微晶硅底电池,形成pin/pin型非晶硅/微晶硅叠层电池.通常顶电池的n层与底电池的P层均采用微晶硅材料来形成隧穿复合结,然而该叠层电池的光谱响应测试结果表明,顶电池存在着明显的漏电现象.针对该问题作者提出,在顶电池的微品硅n层中引入非晶硅n保护层的方法.实验结果表明,非晶硅n层的引入有效地改善了顶电池漏电的现象;在非晶硅n层的厚度为6nm时,顶电池的漏电现象消失,叠层电池的开路电压由原来的1.27提高到1.33V,填允因子由60%提高剑63%.     

非晶硅顶电池中的n型掺杂层对非晶硅/微晶硅叠层太阳电池性能的影响

采用超高频等离子增强化学气相沉积(VHF-PECVD)技术,逐次高速沉积非品硅顶电池及微晶硅底电池,形成pin/pin型非晶硅/微晶硅叠层电池.通常顶电池的n层与底电池的P层均采用微晶硅材料来形成隧穿复合结,然而该叠层电池的光谱响应测试结果表明,顶电池存在着明显的漏电现象.针对该问题作者提出,在顶电池的微品硅n层中引入非晶硅n保护层的方法.实验结果表明,非晶硅n层的引入有效地改善了顶电池漏电的现象;在非晶硅n层的厚度为6nm时,顶电池的漏电现象消失,叠层电池的开路电压由原来的1.27提高到1.33V,填允因子由60%提高剑63%.     

Si基薄膜叠层太阳电池中顶底电池电流匹配的实现

以中间层对非晶硅/微晶硅(a-Si/μc-Si)叠层太阳电池电学特性的影响为研究对象,运用太阳能电池模拟软件,计算了中间层折射率和厚度的变化对顶/底电池电流的影响.针对当前Si基薄膜叠层太阳电池中存在的顶、底电池电流不匹配的问题,提供了解决方案.结果表明,应选用折射率小于3.1的材料作中间层;顶、底电池电流完全匹配的中...     

非晶硅/微晶硅叠层电池的模拟研究

电流匹配和隧穿复合结是影响氢化非晶硅/氢化微晶硅叠层电池性能的两个关键因素.文章采用wxAMPS模拟软件研究了氢化非晶硅/氢化微晶硅叠层电池中顶电池与底电池的厚度匹配对电池短路电流的影响,以及隧穿复合结的中间缺陷态密度和掺杂浓度对叠层电池性能的影响.研究发现当顶电池和底电池的本征层厚度分别为200和2 000 nm、中间缺陷态提高到1017 cm-3·eV-1以上,且掺杂浓度提高到5×1019 cm-3时,叠层电池获得最佳性能:换效率为15.60％,短路电流密度为11.68 mA/cm2,开路电压为1.71V.     

中间层掺杂对具有隧穿结构的非晶硅/微晶硅叠层电池的影响

为了提高非晶硅/微晶硅叠层电池的转换效率和稳定性,在隧穿结构中引入ZnO∶B中间层,研究了中间层掺杂情况对叠层电池短路电流密度、开路电压、填充因子、转换效率等性能的影响。实验结果表明:最佳的非晶硅/微晶硅叠层电池中间层为厚度较薄、掺杂浓度较高的ZnO∶B,有利于叠层电池整体性能的提高。最终,采用厚度为40 nm,B2H6流量为5 ml/min的ZnO∶B中间层,制备出了初始效率为12.2%、衰退率在8%以内的叠层电池。     

本征非晶硅薄膜的准分子激光晶化

为了减低非晶硅薄膜太阳能电池的光致衰减效应和提高其光电转换效率,用等离子体化学气相沉积系统制备了本征非晶硅薄膜,用波长为248nm的KrF准分子激光器激光晶化了非晶硅表层,用共焦显微喇曼测试技术研究了非晶硅薄膜在不同的激光能量密度和不同的频率下的晶化状态,并用扫描电子显微镜测试晶化前后薄膜的形貌。结果表明,随着激光能量密度的增大,薄膜晶化效果越来越好,能量密度达到268.54mJ/cm2时晶化效果最好,此时结晶比约为76.34%;最佳的激光能量密度范围是204.99mJ/cm2~268.54mJ/cm2,这时薄膜表面晶化良好;在1Hz~10Hz范围内,激光频率越大晶化效果越好;晶化后薄膜明显出现微晶和多晶颗粒,从而达到了良好的晶化效果。     

叠层片式大电流磁珠的成型工艺

叠层片式大电流磁珠是一种特殊的叠层片式磁珠,主要应用于电源部分的电磁干扰( EMI)抑制.研究分析了叠层片式大电流磁珠三种主要的成型工艺,及其制作的叠层片式大电流磁珠的优缺点.结果表明,交迭印刷法最适用于叠层片式大电流磁珠的制作;相比较另两种工艺,其优点表现为:合格率最高,达到98.5%;无表面开裂现象,侧面开裂比例最...     

本征氧化层对Si纳米板弹性模量的影响

采用能量法计算了表面不带氧化层的Si纳米板和表面带不同厚度氧化层的Si纳米板的杨氏模量.结果表明,表面带氧化层的Si纳米板杨氏模量随着板厚度的减小而增加,不带氧化层的则随之降低,但当板厚度增加时,它们都趋于一个定值123GPa.板的杨氏模量随表面氧化层层数的增加而上升,随着板厚度的减小,氧化层的影响起到了决定性的作用.当表面带氧化层的纳米板厚度为50nm时,板的杨氏模量随着氧化层层数的增加从120GPa上升到近200GPa.计算结果解释了目前报道的Si纳米板杨氏模量尺度效应不一致的原因.     

本征氧化层对Si纳米板弹性模量的影响

采用能量法计算了表面不带氧化层的Si纳米板和表面带不同厚度氧化层的Si纳米板的杨氏模量.结果表明,表面带氧化层的Si纳米板杨氏模量随着板厚度的减小而增加,不带氧化层的则随之降低,但当板厚度增加时,它们都趋于一个定值123GPa.板的杨氏模量随表面氧化层层数的增加而上升,随着板厚度的减小,氧化层的影响起到了决定性的作用.当表面带氧化层的纳米板厚度为50nm时,板的杨氏模量随着氧化层层数的增加从120GPa上升到近200GPa.计算结果解释了目前报道的Si纳米板杨氏模量尺度效应不一致的原因.     

过渡区p层在高速沉积非晶硅薄膜电池中的应用

研究了采用甚高频等离子体增强化学气相沉积(VHF-PECVD)技术沉积从微晶相向非晶相相变的过渡区p层,并将其作为电池的窗口层应用到高速沉积的非晶硅薄膜电池中。通过调整p层的沉积参数,获得不同p层的暗电导率从1.0E-8S/cm变化到1.0E-1S/cm,并获得了从微晶相向非晶相转变的过渡区p层。实验发现,电池的开路电压Voc随p层SiH4浓度的增加先增加后降低,当p层处在过渡区时达到最大;p层处在过渡区时电池的短路电流Isc和填充因子FF都得到了不同程度的提高。在p/i界面引入buffer层后,能进一步显著提高电池的FF和Voc。在过渡区p层作为电池窗口层,没有背反射电极,本征层沉积速率为1.5nm/s情况下获得效率达8.65%(Voc=0.89V,Jsc=12.90mA/cm2,FF=0.753)的高速非晶硅薄膜电池。比较了过渡区P层与P-a-SiC:H分别作为电池窗口层对于电池性能特别是FF的影响,由于存在结构演变的原因,FF对于过渡区P层厚度的依赖大于后者。     

Influence of band gap of p-type hydrogenated nanocrystalline silicon layer on the short-circuit current density in thin-film silicon solar cells

The impact of the optical band gap (E_g) of a p-type hydrogenated nanocrystalline silicon layer on the short-circuit current density (J_sc) of a thin-film silicon solar cell is assessed. We have found that the J_sc reaches maximum when the E_g reaches optimum. The reason for the J_sc on E_g needs to be clarified. Our results exhibit that maximum J_sc is the balance between dark current and photocurrent. We show here that this dark current results from the density of defects in the p-layer and the barrier at the interface between p-and i-layers. An optimum cell can be designed by optimizing the p-layer via reducing the density of defects in the p-layer and the barrier at the p/i interface. Finally, a 6.6% increase in J_sc was obtained at optimum E_g for n-i-p solar cells.     

种子层对微晶硅锗太阳电池的影响

Using plasma enhanced chemical vapor deposition（PECVD） at 13.56 MHz,a seed layer is fabricated at the initial growth stage of the hydrogenated microcrystalline silicon germanium(μc-Si_1-xGe_x:H) i-layer.The effects of seeding processes on the growth ofμc-Si_1-xGe_x:H i-layers and the performance ofμc-Si_1-xGe_x:H p-i-n single junction solar cells are investigated.By applying this seeding method,theμc-Si_1-xGe_x:H solar cell shows a significant improvement in short circuit current density(J_sc) and fill factor（FF） with an acceptable performance of blue response as aμc-Si:H solar cell even when the Ge content x increases up to 0.3.Finally,an improved efficiency of 7.05%is achieved for theμc-Si_0.7Ge_0.3:H solar cell.     

n-Doped-layer free amorphous silicon thin film solar cells fabricated with the CuMg alloy as back contact metal

The feasibility of using CuMg alloy as back contact metal for n⁺-doped-layer free a-Si:H thin film solar cell (TFSC) has been investigated in this work. The ohmic-contact characteristic has been achieved by using the CuMg alloy as back contact metal. The proposed structure showed the typical solar cell current-voltage (I-V) characteristic. An initial efficiency of 4.3% has been obtained with a open-circuit voltage V_oc = 0.79 V, short-circuit current J_sc = 13.4 mA/cm² and fill factor F.F. = 0.40. Furthermore, the experimental results also showed the CuMg alloy was suitable for the replacement of n⁺-doped-layer with the production cost reduction of a-Si:H TSFC.     

Effects of contact electrode size on the characteristics of polycrystalline-Si p-i-n solar cells

The effects of contact electrode size on the photo-voltaic characteristics of polycrystalline-Si p-i-n solar cells have been studied,with respect to a unit-cell pitch size of 1μm width.For the non-transparent Al contact electrode with a contact width of 0.05-0.2μm,the short-circuit current is obviously reduced with increasing contact width,due to a larger area of optical reflection by the electrode.On the other hand,even when using a transparent ITO(indium-tin-oxide) electrode,a larger width of contact electrode may also cause a smaller short-circuit current, due to a larger area of optical absorption by the electrode.However,for this ITO electrode,the contact electrode of 0.05μm width causes a smaller short-circuit current than that of 0.1μm width,primarily ascribed to a smaller area for collecting carrier and a larger contact resistance.As a result,while using the ITO contact electrode to enhance the conversion efficiency of the solar cell,a proper width of contact electrode should be employed to optimize the photo-voltaic characteristics.     

Effects of contact electrode size on the characteristics of polycrystalline-Si p-i-n solar cells

The effects of contact electrode size on the photo-voltaic characteristics of polycrystalline-Si p-i-n solar cells have been studied,with respect to a unit-cell pitch size of 1μm width.For the non-transparent Al contact electrode with a contact width of 0.05-0.2μm,the short-circuit current is obviously reduced with increasing contact width,due to a larger area of optical reflection by the electrode.On the other hand,even when using a transparent ITO(indium-tin-oxide) electrode,a larger width of contact e...     

Improved photovoltaic properties of amorphous silicon thin-film solar cells with an un-doped silicon oxide layer

This paper proposes the use of undoped hydrogenated microcrystalline silicon oxide (μc-SiO_x:H) deposited on the n-μc-Si:H layer of amorphous silicon single-junction superstrate configuration thin-film solar cells produced through 40 MHz very high frequency plasma-enhanced chemical vapor deposition. Raman spectroscopy and optoelectronic analyses of the undoped μc-SiO_x:H thin film revealed that adding a small amount of oxygen into a μc-network results in a low optical absorption, wide band gap, high optical band gap E₀₄, high refractive index, reasonable conductivity, and crystalline volume fraction, which are advantageous properties in solar cells. Compared with a standard cell, the current density–voltage (J–V) characteristics of the cell with an undoped μc-SiO_x:H/n-μc-Si:H structure showed an enhancement in short-circuit current density J_sc from 13.32 to 13.60 mA/cm², and in conversion efficiency from 8.53% to 8.61%. The increased J_sc mechanism can be attributed to an improved light-trapping capability in the long wavelength range between 510 and 660 nm, as demonstrated by the external quantum efficiency.     

Hydrogen dilution on an undoped silicon oxide layer and Its application to amorphous silicon thin-film solar cells

This paper proposes the use of undoped hydrogenated microcrystalline silicon oxide (μc-SiO_x:H) deposited on an n-μc-Si:H layer of amorphous silicon single-junction superstrate-configuration thin-film solar cells produced using 40 MHz very high frequency plasma-enhanced chemical vapor deposition. We found that undoped μc-SiO_x:H thin film under optimized hydrogen dilution conditions had high crystallinity, high conductivity, a wide optical band gap, and a high refractive index, which are advantageous properties in solar cells. However, deposition at higher hydrogen dilutions degraded the quality and optoelectronic properties of the films, because the morphology of the films changed from microcrystalline to amorphous. These results suggest that the use of an optimized undoped μc-SiO_x:H layer improves a-Si:H thin-film solar cell performance through enhancement of the short-circuit current density J_sc. The increased J_sc can be attributed to an improved light-trapping capability in the long wavelength range, between 620 and 680 nm, as demonstrated by the external quantum efficiency. This technique also allows optimal conversion efficiency to be achieved. The results demonstrated that hydrogen dilution plays a dominant role in the improvement of film quality and solar cell performance; however, the tradeoff between refractive index and conductivity must be considered.     

Improvement of hydrogenated amorphous silicon germanium thin film solar cells by different p-type contact layer

In this study, we report an appreciably increased efficiency from 6% up to 9.1% of hydrogenated amorphous silicon germanium (a-SiGe:H) thin film solar cells by using a combination of different p-doped window layers, such as boron doped hydrogenated amorphous silicon (p-a-Si:H), amorphous silicon oxide (p-a-SiO_x:H), microcrystalline silicon (p-µc-Si:H), and microcrystalline silicon oxide (p-µc-SiO_x:H). Optoelectronic properties and the role of these p-layers in the enhancement of a-SiGe:H cell efficiency were also examined and discussed. An improvement of 1.62 mA/cm² in the short-circuit current density (J_sc) is attributed to the higher band gap of p-type silicon oxide layers. In addition, an increase in open-circuit voltage (V_oc) by 150 mV and fill factor (FF) by 6.93% is ascribed to significantly improved front TCO/p-layer interface contact.     

Effects of the undoped layer on characteristics of amorphous silicon Schottky diodes

The effects of undoped layer thickness on the dark and illuminated I-V characteristics of hydrogenated amorphous silicon Schottky barrier solar cells are investigated. Schottky barrier (S.B.) metals having different work function (Cr and Pd) were deposited on the 0.22 µm - 1.45 µm thick a-Si:H films. Photovoltaic performance, Jsc, Voc, FF and efficiency, are independent of thickness of the undoped layer if film thickness is larger than the depletion region width. Jscand Vocare controlled by S.B. metal and FF is independent of S.B. metal. Dark I-V characteristics depend on both S.B. metal and device thickness suggesting a barrier controlled space charge limited phenomena. Variation of turn-on (threshold) voltage with undoped layer thickness can be applied to the design of switching and memory devices.