Structural impact of tungsten ions on ZnO-Sb2O3-As2O3 glass system

Five glasses in the quaternary system 5 ZnO-(50 − x) As₂O₃-45 Sb₂O₃: x WO₃ with the values of x ranging from 0 to 20 mol% (in steps of 5 mol%) are prepared. The samples are characterized by X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy (EDS) and differential thermal analysis (DTA) techniques. The DTA studies have indicated that the glass forming ability decreases with the increasing content of WO₃. A number of studies, like, spectroscopic (optical absorption, IR, Raman, ESR spectra) and dielectric studies (dielectric constant ?, loss tan δ, a.c. conductivity σ_a.c.) over a wide range of frequency and temperature and dielectric break down strength at room temperature, have been carried out and are analysed in the light of different oxidation states and environment of tungsten ions in these glasses. These glasses have potential photonic applications.     

Microwave properties of Ba(Zn1/3Ta2/3)O3 dielectric resonators

Ba(Zn_1/3Ta_2/3)O₃ (BZT) dielectric resonators were prepared by solid-state reaction. The starting materials were BaCO₃, ZnO, and Ta₂O₅ powders with high purity. The double calcined BZT pellets were sintered in air at temperatures of 1575, 1600, 1625, and 1650 °C for 4 h. The X-ray diffraction data allowed the study of the unit cell distortion degree and the presence of the secondary phases. A long-range order with a 2:1 ratio of Ta and Zn cations on the octahedral positions of the perovskite structure was observed with the increase of the sintering temperature. The dielectric constant of BZT resonators measured around 6 GHz was between 26 and 28. High values of Q × f product (120 THz) were obtained for BZT resonators sintered at 1650 °C/4 h. The temperature coefficient of the resonance frequency exhibits positive values less than 6 ppm/°C. The achieved dielectric parameters recommend BZT dielectric resonators for microwave and millimeter wave applications.     

Microstructures and electrical responses of pure and chromium-doped CaCu3Ti4O12 ceramics

Pure and chromium-doped CCTO (CaCu₃Ti₄O₁₂) ceramics were prepared by a conventional solid-state reaction method, and the effects of chromium doping on the microstructures and electrical properties of these ceramics were investigated. Efficient crystalline phase formation accompanied by dopant-induced lattice constant expansion was confirmed through X-ray diffraction studies. Scanning electron microscopy (SEM) results show that doping effectively enhanced grain growth or densification, which should increase the complex permittivity. The dielectric constant reached a value as high as 20,000 (at 1 kHz) at a chromium-doping concentration of 3%. The electrical relaxation and dc conductivity of the pure and chromium-doped CCTO ceramics were measured in the 300-500 K temperature range, and the electrical data were analyzed in the framework of the dielectric as well as the electric modulus formalisms. The obtained activation energy associated with the electrical relaxation, determined from the electric modulus spectra, was 0.50-0.60 eV, which was very close to the value of the activation energy for dc conductivity (0.50 ± 0.05 eV). These results suggest that the movement of oxygen vacancies at the grain boundaries is responsible for both the conduction and relaxation processes. The short-range hopping of oxygen vacancies as “polarons” is similar to the reorientation of the dipole and leads to dielectric relaxation. The proposed explanation of the electric properties of pure and chromium-doped CCTO ceramics is supported by the data from the impedance spectrum.     

Synthesis, structural and microwave dielectric properties of Al2W3−xMoxO12 (x = 0-3) ceramics

Low dielectric ceramics in the Al₂W_3−xMo_xO₁₂ (x = 0-3) system have been prepared through solid state ceramic route. The phase purity of the ceramic compositions has been studied using powder X-ray diffraction (XRD) studies. The microstructure of the sintered ceramics was evaluated by Scanning Electron Microscopy (SEM). The crystal structure of the ceramic compositions as a result of Mo substitution has been studied using Laser Raman spectroscopy. The microwave dielectric properties of the ceramics were studied by Hakki and Coleman post resonator and cavity perturbation techniques. Al₂Mo_xW_3−xO₁₂ (x = 0-3) ceramics exhibited low dielectric constant and relatively high unloaded quality factor. The temperature coefficient of resonant frequency of the compositions is found to be in the range −41 to −72 ppm/°C.     

Dielectric relaxation behaviors of pure and Pr6O11-doped CaCu3Ti4O12 ceramics in high temperature range

Pure and Pr₆O₁₁-doped CaCu₃Ti₄O₁₂ (CCTO) ceramics were prepared by conventional solid-state reaction method. The compositions and structures were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The influences of Pr-ion concentration on dielectric properties of CCTO were measured in the ranges of 60 Hz-3 MHz and 290-490 K. The third phase of Ca₂CuO₃ was observed from the XRD of CCTO ceramics. From SEM, the grain size was decreased obviously with high valence Pr-ion (mixing valence of Pr³⁺ and Pr⁴⁺) substituting Ca²⁺. The room temperature dielectric constant of Pr-doped CCTO ceramics, sintered at 1323 K, was an order of magnitude lower than the pure CCTO ceramics due to the grain size decreasing and Schottky potential increasing. The dielectric spectra of Pr-doped CCTO were flatter than that of pure CCTO. The loss tangent of Pr-doped CCTO ceramics was less than 0.20 in 2 × 10²-10⁵ Hz region below 440 K. The complex impedance spectra of pure and Pr-doped CCTOs were fitted by ZView. From low to high frequency, three semicircles were observed corresponding to three different conducting regions: electrode interface, grain boundary and grain. By fitting the resistors R and capacitors C, the activation energies of grain boundary and electrode contact were calculated. All doped CCTOs showed higher activation energies of grain boundary and electrode than those of pure CCTO ceramics, which were concordant with the decreasing of dielectric constant after Pr₆O₁₁ doping.     

Effects of lanthanum doping on the preferred orientation, phase structure and electrical properties of sol-gel derived Pb1-3x/2Lax (Zr0.6Ti0.4)O3 thin films

Pb_1-3x/2La_x (Zr_0.6Ti_0.4)O₃ thin films (0 ≤ x ≤ 0.08) were prepared on the Pt (1 1 1)/Ti/SiO₂/Si (1 0 0) substrates by a sol-gel method. The morphology, preferred orientation, phase structure, dielectric and ferroelectric properties of the films have been investigated. Our results show that lanthanum doping is favorable to enhance crystalline and obtain (1 0 0)-preferred orientation of the films. Meanwhile, it is suggested that the films undergo a structure change from “rhombohedral” phase to monoclinic phase as the lanthanum-doped content is increased to x ≈ 0.05. Results of dielectric properties and ferroelectric properties indicate that lanthanum doping contributes to improve film dielectric constant and dielectric loss while it brings about a striking decrease in remnant polarization value. Possible explanations for the variations of electrical properties have been discussed in terms of preferred orientation, phase structure and large lattice distortion.     

Low-firable high-K dielectric in the Zrx(Zn1/3Nb2/3)1−xTiO4 ceramic system

Composite ceramics in the solid solution of Zr_x(Zn_1/3Nb_2/3)_1−xTiO₄ (x = 0.1-0.4) have been prepared by the mixed oxide route. Formation of solid solution was confirmed by the X-ray diffraction patterns. The microwave dielectric properties, such as dielectric constant (?_r), Q × f value and temperature coefficient of resonant frequency (τ_f) have been investigated as a function of composition and sintering temperature. With x increasing from 0.1 to 0.4, the dielectric constant decreases from 70.9 to 43.2, and the τ_f decreases from 105 to 55 ppm/°C. The Q × f value, however, increases with increasing x value to a maximum 26,600 GHz (at 6 GHz) at x = 0.3, and then decreases thereafter. For low-loss microwave applications, a new microwave dielectric material Zr_0.3(Zn_1/3Nb_2/3)_0.7TiO₄, possessing a fine combination of microwave dielectric properties with a high ?_r of 51, a high Q × f of 26,600 GHz (at 6 GHz) and a τ_f of 70 ppm/°C, is suggested.     

Hydrothermal synthesis of MnCO3 nanorods and their thermal transformation into Mn2O3 and Mn3O4 nanorods with single crystalline structure

MnCO₃ nanorods with diameters of 50-150 nm and lengths of about 1-2 μm have been prepared for the first time by a facile hydrothermal method. Mn₂O₃ and Mn₃O₄ nanorods were obtained via the heat-treatment of the MnCO₃ nanorods in air and nitrogen atmosphere, respectively. The morphology and structure of the as-synthesized MnCO₃, Mn₂O₃ and Mn₃O₄ nanorods were characterized by X-ray diffraction, scanning electron microscopy, transmission electron microscopy and selected area electron diffraction. It was found that the MnCO₃ nanorods are single-crystalline, and their morphology and single-crystalline characteristic can be sustained after thermal transformation into Mn₂O₃ and Mn₃O₄. The corresponding growth directions for MnCO₃, Mn₂O₃ and Mn₃O₄ nanorods were [2 1 4], [1 0 0] and [1 1 2], respectively. When applied as anode materials for lithium ion batteries, the Mn₂O₃ and Mn₃O₄ nanorods exhibited a reversible lithium storage capacity of 998 and 1050 mAh/g, respectively, in the first cycles.     

Influence of preheating on crystallization and growing behavior of Ce and Mn doped Ba0.6Sr0.4TiO3 film by sol–gel method

Cerium and manganese codoped Ba_0.6Sr_0.4TiO₃ (CeMn-BST) film and pure BST, Ce-BST and Mn-BST films were prepared. Influence of preheating on film crystallization and growing behavior was studied. X-ray diffraction (XRD) reveals that all films mainly grow along (110) orientation and show cubic ABO₃ perovskite structures, and the preheating promotes Ce^3 + and Mn^4 + ions enter into B-sites and substitute Ti^4 + ions. Preheating enhances crystallization and causes the strongest crystallization with CeMn-codoping. Atomic force microscopy (AFM) exhibits that films preheated show layered growth, while those not preheated show island growth, which are related to layer number and doping. Therefore, the films preheated show larger permittivities, higher tunabilities, and lower dielectric losses except the pure BST film and higher figures of merit (FOMs). Preheating with CeMn-codoping causes best dielectric properties with 56% tunability, 0.0037–0.0091 loss and near 150 FOM, meeting the needs of tunable microwave applications.     

Effects of growth temperature on structure and electrical properties of dielectric (Ba,Sr)TiO3 capacitors with transparent conducting oxide electrodes

200 nm-thick BST thin films were grown on Zr-doped In₂O₃/SrTiO₃ (1 0 0) substrates at 550-750 °C. X-ray diffraction results show that the as-deposited BST films were polycrystalline with random crystallographic orientations. X-ray diffraction patterns reveal that the BST film grown at 650 °C had the best crystalline quality of all the deposition temperatures. Atomic force microscopy and secondary ion mass spectrometry showed that the surface and interface structures of the BST films became rough as the growth temperature increased. The BST film grown at 650 °C showed the best electrical properties, with a dielectric constant of 420 at 1 MHz, dielectric tunability of 32.1%, dielectric loss of 0.015 at 300 kV/cm, and a mean optical transmittance in visible wavelength of 71.3%.     

Piezoelectric and dielectric properties of Dy2O3-doped (Bi0.5Na0.5)0.94Ba0.06TiO3 lead-free ceramics

(Bi_0.5Na_0.5)_0.94Ba_0.06TiO₃ + x wt% Dy₂O₃ with x = 0-0.3 ceramics were synthesized by conventional solid-state processes. The effects of Dy₂O₃ on the microstructure, the piezoelectric and dielectric properties were investigated. X-ray diffraction pattern confirmed that the coexistence of tetragonal and rhombohedral phases in the (Bi_0.5Na_0.5)_0.94Ba_0.06TiO₃ composition was not changed by adding 0.05-0.3 wt% Dy₂O₃. SEM images indicate that all the ceramics have pore-free microstructures with high density, and that doping of Dy₂O₃ inhibits the grain growth of the ceramics. The addition of Dy₂O₃ shows the double effects on decreasing the piezoelectric and dielectric properties for 0 < x < 0.15 when Dy³⁺ ions substitute B-site Ti⁴⁺ ions, and increasing the properties for 0.15 < x < 0.3 when Dy³⁺ ions enters into A-site of the perovskite structure. The optimum electric properties of piezoelectric constant d₃₃ = 170 pC/N and the dielectric constant ?_r = 1900 (at a frequency of 1 kHz) are obtained at x = 0.3.     

Improving leakage currents of Pt/Ba0.8Sr0.2TiO3/Pt capacitors using multilayered structures

Pt/Ba_0.8Sr_0.2TiO₃ (BST)/Pt capacitors fabricated by the sol–gel process generally show abnormally high leakage currents. In this paper, we report the reduction of this leakage current in multilayered sol–gel Pt/BST/Pt thin film capacitors. The multilayered structure also provided the flexibility of adjusting the dielectric constant of the film. The thin films were fabricated by a step-by-step annealing scheme at 750 °C except that the top and bottom layers were annealed at less than 750 °C. The observed results are explained by an amorphous/polycrystalline structure, which was confirmed by scanning electron microscopy and X-ray diffraction analysis.     

Dielectric properties of iron doped calcium copper titanate, CaCu2.9Fe0.1Ti4O12

CaCu_2.9Fe_0.1Ti₄O₁₂ (CCFTO) has been prepared by a novel semi-wet route and its dielectric properties have been studied in the temperature range 300-500 K. It is found that dielectric constant (?) decreases drastically in the frequency range 100 Hz to 1 MHz. Complex plane impedance and modulus analysis was done to understand this drastic decrease in ?. Oxidation state of various ions was studied using X-ray photoelectron spectroscopy (XPS). The decrease in the permittivity of CCFTO can be attributed to two factors: the suppression of the Ca/Cu disorder in CCFTO which is observed in CaCu₃Ti₄O₁₂ (CCTO) and the absence of the grain boundary internal barrier layer capacitance mechanism.     

Enhanced electrical properties of Pb(Zr0.80Ti0.20)O3 thick films prepared by a modified sol-gel technique

Ferroelectric Pb(Zr_0.80Ti_0.20)O₃ thick films (5.0 μm) were grown on Pt/Ti/SiO₂/Si substrates by a modified sol-gel technique. In this process, PZT nanopowders were prepared via sol-gel, and then these powders were dispersed in a precursor sol to form a slurry. Slurry and PZT precursor solution were spin-coated alternately to form uniform and crack-free thick films. The microstructure and electrical properties of the PZT thick films were investigated. The results in this work show that the PZT thick films possess typical polycrystalline perovskite structures, good pyroelectric coefficient (8.0 × 10^− 8C/cm² K), high remnant polarization (30 μC/cm²), and low coercive field (50 kV/cm).     

Ferroelectric relaxor behavior and dielectric spectroscopic study of 0.99(Bi0.5Na0.5TiO3)-0.01(SrNb2O6) solid solution

0.99(Bi_0.5Na_0.5TiO₃)-0.01(SrNb₂O₆) was prepared by simple solid state reaction route. Material stabilized in rhombohedral perovskite phase with lattice constants a = 3.9060 Å, α = 89.86° and a_h = 5.4852 Å, c_h = 6.7335 Å for hexagonal unit cells. Density of material was found 5.52 g_m/cm³ (92.9% of theoretical one) in the sample sintered at 950 °C. The temperature dependent dielectric constant exhibits a broad peak at 538 K (?_m = 2270) at 1 kHz that shows frequency dependent shifts toward higher temperature - typical relaxor behavior. Modified Curie-Weiss law was used to fit the dielectric data that exhibits almost complete diffuse phase transition characteristics. The dielectric relaxation obeys the Vogel-Fulcher relationship with the freezing temperature 412.4 K. Significant dielectric dispersion is observed in low frequency regime in both components of dielectric response and a small dielectric relaxation peak is observed. Cole-Cole plots indicate polydispersive nature of the dielectric relaxation; the relaxation distribution increases with increase in temperature.     

Sol-gel synthesis of Bi3.25La0.75Ti3O12 nanotubes

Ferroelectric Bi_3.25La_0.75Ti₃O₁₂ (BLT) nanotubes were synthesized by sol-gel technique using nanochannel porous anodic aluminum oxide (AAO) templates, and were characterized by X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM). BLT nanotubes with diameter of around 240 nm and the wall thickness of about 25 nm exhibited a single orthorhombic perovskite structure and highly preferential crystal growth along the [1 1 7] orientation, which have smooth wall morphologies and well-defined diameters corresponding to the diameter of the applied template. The formation mechanism of BLT nanotubes was discussed.     

Microstructure and properties of SiO2 matrix reinforced by BN nanotubes and nanoparticles

In order to overcome intrinsic brittleness and poor mechanical properties of SiO₂, two kinds of hexagonal boron nitride (h-BN) (boron nitride nanotubes (BNNTs) and boron nitride nanoparticles (BNNPs)) were employed to reinforce SiO₂ matrix. The mechanical properties, relative density and dielectric constant of the composites were investigated detailedly. Compared to the monolithic SiO₂, 5 wt% BNNTs/SiO₂ and 5 wt% BNNPs/SiO₂ composites exhibited excellent mechanical properties and low dielectric constant. Furthermore, phase composition and microstructure of the composites were analyzed thoroughly by X-ray diffraction, transmission electron microscopy, and field emission scanning electron microscopy.     

Structural and electrical properties of Gd(Ni1/2Zr1/2)O3

The Gd(Ni_1/2Zr_1/2)O₃ (GNZ) ceramic is synthesized by the solid-state reaction technique. The X-ray diffraction pattern of the sample shows monoclinic phase at room temperature. The dielectric dispersion of the material is investigated in the temperature range from 303 K to 673 K and in the frequency range from 100 Hz to 1 MHz. The relaxation peak is observed in the frequency dependence of the loss tangent. The relaxation time at different temperatures is found to obey Arrhenius law having activation energy of 1.1 eV which indicates the hopping of ions at the lattice site and may be responsible for the dielectric relaxation of GNZ. The scaling behaviour of loss tangent suggests that the relaxation mechanism is temperature independent. The frequency dependent conductivity spectra follow the power law. In the impedance formalism, the Cole-Cole model is used to study the relaxation mechanism of GNZ.     

Dielectric and microwave properties of ZrO2 doped CaO-SiO2-B2O3 ceramic matrix composites

The behavior of dielectric and microwave properties against sintering temperature has been carried out on CaO-SiO₂-B₂O₃ ceramic matrix composites with ZrO₂ addition. The results indicated that ZrO₂ addition was advantageous to improve the dielectric and microwave properties. X-ray diffraction (XRD) patterns show that the major crystalline β-CaSiO₃ and a little SiO₂ phase existed at the temperature ranging from 950 °C to 1050 °C. At 0.5 wt% ZrO₂, CaO-SiO₂-B₂O₃ ceramic matrix composites sintered at 1000 °C possess good dielectric properties: ?_r = 5.85, tan δ = 1.59 × 10⁻⁴ (1 MHz) and excellent microwave properties: ?_r = 5.52, Q · f = 28,487 GHz (11.11 GHz). The permittivity of Zr-doped CaO-SiO₂-B₂O₃ ceramic matrix composites exhibited very little temperature dependence, which was less than ±2% over the temperature range of −50 to 150 °C. Moreover, the ZrO₂-doped CaO-SiO₂-B₂O₃ ceramic matrix composites have low permittivity below 5.5 over a wide frequency range from 20 Hz to 1 MHz.     

Electric and dielectric behavior of CaCu3Ti4O12-based thin films obtained by soft chemical method

CaCu₃Ti₄O₁₂ (stoichiometric) and Ca_1.1Cu_2.9Ti₄O₁₂ (non-stoichiometric) thin films have been prepared by the soft chemical method on Pt/Ti/SiO₂/Si substrates, and their electrical and dielectric properties have been compared as a function of the annealing temperature. The crystalline structure and the surface morphology of the films were markedly affected by the annealing temperature and excess calcium. The films show frequency-independent dielectric properties at room temperature which is similar to those properties obtained in single-crystal or epitaxial thin films. The room temperature dielectric constant of the 570-nm-thick CCTO thin films annealed at 600 °C at 10 kHz was found to be 124. The best non-ohmic behavior (α = 12.6) presented by the film with excess calcium annealed at 500 °C. Resistive hysteresis on the I-V curves was observed which indicates these films can be used in resistance random access memory (ReRAM).