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1.
采用基于密度泛函理论的第一性原理平面波超软贋势方法,分别计算了立方相Ca2Si及掺杂P、Al的电子结构和光学性质.结果表明:立方相Ca2Si是带隙为0.55483 eV的直接带隙半导体,价带主要由Si的3p和Ca的3d、4s态电子构成,导带主要由Ca 的3d、4s和Si的3p态电子共同构成,静态介电常数为11.92474,折射率为3.45322.Ca2Si掺P后,Ca2Si转变为n型半导体,其带隙值是0.42808 V,价带主要由Si、Al的3p和Ca的3d、4s态电子构成,导带主要由Ca的3d、Al的3p、3s和Si的3p态电子构成.静态介电常数为7.92698,折射率为2.81549.掺Al后, Ca2Si转变为n型半导体,带隙值是0.26317 eV,费米面附近的价带主要由Si、P的3p和Ca的3d态电子构成,导带主要由Ca的3d 4s、P的3p、3s和Si的3p态电子构成.静态介电常数为17.02409,折射率为4.12603.掺P和Al均降低Ca2Si的反射率,提高Ca2Si的吸收系数,提高Ca2Si的光利用率.说明掺杂能够有效地改变Ca2Si的电子结构和光学性质,为Ca2Si材料的研发和应用提供理论依据.  相似文献   

2.
采用基于密度泛函理论的第一性原理平面波超软贋势方法,分别计算了立方相Ca_2Si及掺杂P、Al的电子结构和光学性质。结果表明:立方相Ca_2Si是带隙为0.55483 eV的直接带隙半导体,价带主要由Si的3p和Ca的3d、4s态电子构成,导带主要由Ca的3d、4s和Si的3p态电子共同构成,静态介电常数为11.92474,折射率为3.45322。Ca_2Si掺P后,Ca_2Si转变为n型半导体,其带隙值是0.42808 V,价带主要由Si、Al的3p和Ca的3d、4s态电子构成,导带主要由Ca的3d、Al的3p、3s和Si的3p态电子构成。静态介电常数为7.92698,折射率为2.81549。掺Al后,Ca_2Si转变为n型半导体,带隙值是0.26317 eV,费米面附近的价带主要由Si、P的3p和Ca的3d态电子构成,导带主要由Ca的3d 4s、P的3p、3s和Si的3p态电子构成。静态介电常数为17.02409,折射率为4.12603。掺P和Al均降低Ca_2Si的反射率,提高Ca_2Si的吸收系数,提高Ca_2Si的光利用率。说明掺杂能够有效地改变Ca_2Si的电子结构和光学性质,为Ca_2Si材料的研发和应用提供理论依据。  相似文献   

3.
基于密度泛函理论的第一性原理,分析了Mg掺杂浓度对GaN晶格参数、能带结构、电子态密度和光学性质的影响.研究表明:Mg掺杂GaN体系,晶格常数增大,禁带宽度增加,而且禁带宽度随着Mg含量的增加而增加,同时N2p和Mg2p态电子轨道的相互杂化,从而在费米能级附近引入受主能级,随着Mg含量的增加,费米能级进入价带的位置加深,同时Mg掺杂浓度越高,价带和导带带宽越窄.掺Mg后在介电函数和光学吸收谱的低能区和高能区均出现了新的介电峰,这些峰的出现和禁带中的杂质能级到导带底的跃迁有关,由于带隙的增加使介电峰向高能量方向发生偏移.  相似文献   

4.
基于第一性原理方法研究了C单掺杂SnO2和C-X(X=Y,Zr)共掺杂SnO2的能带结构、态密度以及分电荷分布.结果表明:C掺杂、C-Y、C-Zr共掺杂SnO2的带隙值分别为1.109 eV、1.86 eV、1.214 eV,较超胞结构的带隙值降低,有利于电子的跃迁;C-Y共掺杂SnO2的导带底部有3条杂质能级分离出来,C-Zr共掺杂SnO2的能带价带顶部能级中有3条能级分离出来,其中1条能级贯穿费米能级;C-Y,C-Zr共掺杂SnO2的态密度中在低能区会产生1个态密度峰值,部分态密度的峰值由Y、Zr的d轨道贡献;C-Y、C-Zr共掺杂SnO2会打破SnO2电子平衡状态,致使电荷的重新分布.  相似文献   

5.
Ba掺杂Si 笼状化合物结构和电子性质的研究   总被引:1,自引:1,他引:0  
费英  郑岩 《人工晶体学报》2009,38(5):1255-1260
利用第一性原理研究了Ba_8Si_(46)和Ba_8Ag_6Si_(40)笼状化合物的电子性质.对于Ba_8Si_(46),化合物中Ba原子5d轨道与Si原子3s,特别是3p轨道杂化,一方面导致了Ba_8Si_(46)在费米能级附近有很高的态密度,另一方面说明了笼内Ba原子和笼上Si原子之间存在耦合.对于Ba_8Ag_6Si_(40)分析结果表明,由于Ag的5s轨道向Si的3p轨道转移电子,导致Ag与Si原子间成键趋向离子键.带结构显示这两种化合物具有弱金属特征,但Ba_8Ag_6Si_(40)化合物与费米能级相交的带宽较大,预期这种化合物具有更好的导电性能.  相似文献   

6.
运用第一性原理方法研究了Cu/Ag单掺及Cu-Ag共掺对ZnO稳定性、电子结构和光学性质的影响.CuZn2和CuZn1-CuZn3的形成能接近0.0 eV,CuZn1-CuZn2的形成能为负值,表明Cu较易掺杂且掺杂时有聚集的趋势.AgZn2的形成能为2.5 eV,AgZn1-AgZn2和AgZn1-AgZn3的形成能高于4.5 eV,说明高浓度的Ag掺杂在实际合成中不易出现.CuZn1-AgZn2和CuZn1-AgZn3的形成能与AgZn2的相近.CuZn2、CuZn1-CuZn2和CuZn1-CuZn3模型的Cu3d与O2p轨道有较大程度的杂化,价带顶端主要由Cu3d轨道占据.AgZn2、AgZn1-AgZn2和AgZn1-AgZn3模型的Ag4d与O2p轨道杂化较弱,价带顶端主要由O2p轨道占据.CuZn1-AgZn2和CuZn1-AgZn3模型的Cu3d与O2p轨道虽有杂化,但价带顶端主要由O2p轨道占据.Cu或Ag原子掺杂使Zn4s轨道在导带区显著向下移动,降低了模型的带隙宽度,它们对ZnO电子结构的影响主要集中在带隙附近.Cu-Ag共掺修饰ZnO电子结构的能力介于Cu和Ag单掺之间.上述掺杂模型吸收边都发生了红移,实现了ZnO对可见光的吸收,同时对3.10~3.90 eV范围内紫外光的吸收均高于纯ZnO,有效提高了ZnO的光催化效率.结合形成能分析可知,在不同类型掺杂下最有利的光催化模型分别为CuZn1-CuZn2、AgZn2和CuZn1-AgZn2.  相似文献   

7.
采用基于密度泛函理论的第一性原理方法对ZnAl2O4的能带结构、态密度、布居分布及光学性质进行了理论计算。结果表明:ZnAl2O4为直接带隙半导体,能带宽度为3.91 eV;价带主要由O2p态和Zn3d态构成,导带主要由Al3s,3p态构成;ZnAl2O4为离子和共价兼有的化合物;并利用计算的能带结构和态密度分析了ZnAl2O4材料的复介电函数,光电导率,折射率以及消光系数等光学性质。且静态介电函数ε1(0)=3.35,静态折射率n0=1.83。  相似文献   

8.
基于第一性原理、密度泛函理论,通过CASTEP模块对填充金,银,铜纳米线的氮硼碳纳米管进行计算,研究其电子结构及光学性质.发现填充不同金属,稳定性由高到低分别为铜填充氮硼纳米管,银填充氮硼纳米管,金填充氮硼纳米管;体系能带图中带隙为零,即金属填充的氮硼纳米管使得本征(8,0)碳纳米管由半导体性转变为金属性;态密度分布中,价带处态密度主要由金属元素的d轨道和氮硼纳米管的s,p轨道贡献,导带处的态密度主要为氮硼纳米管的p轨道贡献;通过差分电荷密度图得知,填充金属的氮硼纳米管中共价键,离子键,金属键共存,光学性能中吸收系数峰值均增大,反射系数均出现红移.  相似文献   

9.
采用基于密度泛函理论的CASTEP程序软件包,计算了CdTe和CdZnTe的能带结构和态密度,研究对比了CdTe 和CdZnTe的分子内成键机制.结果表明,在CdZnTe中,Cd eg和Te 5s杂化形成较低的价带,Zn t2g和Te 5pz杂化形成的π键等构成中间价带,Zn 4s和Te 5pz杂化形成的σ键等构成导带.Cd 5s和Te 5s不再杂化,导带底向高能级方向移动.  相似文献   

10.
基于密度泛函理论广义梯度近似第一性原理计算的方法,系统研究了Ca掺杂ZnO氧化物的晶格结构和电子结构,在此基础上分析了其电学性能.结果表明,Ca掺杂ZnO晶胞减小.Ca掺杂氧化物仍为直接带隙半导体材料,带宽达1.5 eV.掺杂体系费米能级附近的能带主要由Cas态、Cap态、Znp态和Op态电子构成,其中p态电子对价带态贡献最大,且Cas态、Znp态和Op态电子之间存在着更强的相互作用.Ca掺杂ZnO氧化物费米能级EF附近载流子浓度增加,运动速度减小,有效质量增加,导电机构为Cas态、Znp态和Op态电子在价带与导带的跃迁,具有更高的电导率,较高的Seebeck系数和综合电性能.  相似文献   

11.
Rakin  V. I. 《Crystallography Reports》2020,65(6):1033-1041
Crystallography Reports - The relationship of morphological spectra (sets of data on the morphological types of real polyhedral crystals and their probabilities under current physicochemical...  相似文献   

12.
The evolution of the geometric characteristics introduced by Pauling and their dependence on the specific features of the structure and chemical bonds have been considered. The values of the covalent and van der Waals radii are given as well as their relationships and mutual transitions.  相似文献   

13.
A review of measurement of thermophysical properties of silicon melt   总被引:2,自引:0,他引:2  
Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi3 existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.  相似文献   

14.
Within the method of discrete modeling of packings, an algorithm of generation of possible crystal structures of heteromolecular compounds containing two or three molecules in the primitive unit cell, one of which has an arbitrary shape and the other (two others) has a shape close to spherical, is proposed. On the basis of this algorithm, a software package for personal computers is developed. This package has been approved for a number of compounds, investigated previously by X-ray diffraction analysis. The results of generation of structures of five compounds—four organic salts (with one or two spherical anions) and one solvate—are represented.  相似文献   

15.
Crystallography Reports - Macroscopic jumps of plastic deformation (few percent in amplitude) on creep curves of aluminum–magnesium alloy, caused by a local effect of concentrated solution of...  相似文献   

16.
Two types of domain-wall equations are analyzed: the equations derived by the Sapriel method and the equations obtained by interface matching of the thermal-expansion tensor. It is shown that, for W-type domain walls, these methods yield the same equations. For W′-type domain walls, the equations obtained by different methods coincide for proper ferroelastics and differ for improper ferroelastics.  相似文献   

17.
I. Avramov 《Journal of Non》2011,357(22-23):3841-3846
The temperature dependence of viscosity of silicate melts is discussed in the framework of the Avramov–Milchev (AM) equation. The composition is described by means of two parameters: the molar fraction, x, and the “lubricant fraction”, l. The molar fraction is the sum of the molar parts xi of all oxides dissolved in SiO2, the molar fraction of the latter being 1 ? x. It is shown that, with sufficient precision, two of the parameters of the AM equation can be presented as unique functions of the molar fraction. On the other hand, x is not sufficient to determine properly the reference temperature Tr , at which viscosity is ηr = 1013 [dPa.s]. Therefore, additional parameter, “lubricant fraction” l, is introduced. For each of the components, li is a product of molar part xi and a specific dimensionless coefficient 0  ki  1 accounting for the specific contribution of this component to the increased mobility of the system. It is demonstrated that, for l > 0, the reference temperature is related to the “lubricant fraction” l through the reference temperature Tr,SiO2 of pure SiO2.  相似文献   

18.
Crystal chemical characteristics of the α and β modifications of Zn2V2O7 are calculated based on in situ high-temperature X-ray measurements. The expansion of the structure is found to be strongly anisotropic up to the negative volumetric thermal expansion of the α-Zn2V2O7 unit cell in the temperature range of 300–600°С, α V =–17.94 × 10–6 1/K. The transformations of the “hard” and “soft” sublattices with an increase temperature and at the phase transition are considered in detail. It is shown that the negative volumetric thermal expansion of α-Zn2V2O7 is due to the degeneracy of the zigzag-like shape of zinc–oxygen columns at constant distances between their vertices.  相似文献   

19.
SAXS in situ experiments on the evolution of TMOS solutions during hydrolysis and polycondensation lead to power laws with scaling exponents ≈ 2. It is suggested that this could be the result of the polydispersity of the samples and that only an apparent fractal dimension can be obtained in this way. Kinetic studies tend to indicate that agglomeration in the sol is the result of a diffusion-controlled process.  相似文献   

20.
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