衍射光学元件制作中的基片涂胶方法

在基片上涂布一层厚度均匀的光刻胶层,是衍射光学元件制作中的一个重要步骤。介绍了目前用于衍射光学元件制作的两种主要涂胶方法———提拉法和旋转法,分析了这两种方法的特点和影响胶层厚度的主要因素,尤其是对其均匀性的影响,并提出了获得均匀胶厚的途径。对于提拉涂胶,选择粘度较高的光刻胶溶液与合适的提拉速度将有助于减小Marangoni流动和Van derWaals力对膜厚均匀性的影响;对于旋转涂胶,可以通过密封基片所在空间,或者通过气流控制器使基片上方空气流动处于层流状态来获得均匀一致的溶剂挥发速率,从而提高胶层的均匀性。     

喷雾式涂胶的新应用

介绍了喷雾式涂胶(SprayCoating)的多种新应用。在形貌起伏很大的表面均匀地涂布光刻胶(抗蚀剂)是一项非常有挑战性的工作,喷雾式涂胶正是为了满足这个挑战而开发的。实践证明,与传统的旋涂技术相比,喷雾式涂胶可以在保持光刻胶均匀性良好的同时显著地节约光刻胶的用量。已经发现此技术可用于非圆形基片和多件基片同时涂布。此外,此技术也可以为脆弱的结构提供保护性涂胶以及悬空结构的填充。     

方形基片喷雾涂胶工艺的优化

通过实验优化了方形基片喷雾涂胶工艺.以AZ6130光刻胶作为研究对象,实验过程中在改变胶液体积流量和氮气压力条件下,采用二流体喷头对方形基片进行喷涂,使用显微镜和粗糙度轮廓仪观察并测量其表面形貌.实验结果表明:在不改变其他实验条件下,氮气压力为0.03 MPa时,随着胶液体积流量从0.6 mL/min增加至2.2 mL/min,胶膜厚度从5.3 μm增加至19.0 μm,膜厚均匀性从3.5％增加至22.6％;胶液体积流量为1.0 mL/min时,随着氮气压力从0.01 MPa增加至0.09 MPa,胶膜厚度从6.5 μm降低至4.7 μm,膜厚均匀性从3.6％增加至15.6％.通过对实验基片的观察、测量与分析,得到方形基片制备过程中最优喷涂工艺为胶液体积流量1.0 mL/min,氮气压力0.03 MPa.     

结构化晶圆表面厚胶喷涂工艺

采用超声雾化喷涂技术,以AZ4620光刻胶为研究对象,以硅通孔(TSV)刻蚀后的硅片为基材,在12英寸(1英寸=2.54 cm)结构化晶圆表面喷涂光刻胶形成薄膜。分别研究了稀释质量比、超声功率、氮气体积流量、喷嘴与晶圆表面的间距、载台温度等工艺参数对TSV硅片表面喷涂质量的影响,最终通过优化过程工艺参数,得到表面胶颗粒细小、膜厚均匀性好、台阶覆盖率高的涂覆刻蚀片。实验结果表明,超声雾化喷涂法可以很好地应用于三维结构表面涂覆,克服了旋涂方法在三维结构应用中带来的缺陷,同时有效地提高了光刻胶的利用率,在集成电路(IC)制造和微电子机械系统(MEMS)工艺中有着广阔的应用前景。     

基于ITO玻璃基板的涂胶工艺研究

光刻胶涂布的厚度和均匀性直接影响细微光刻电路图形的精度,对电子产品的集成度和合格率有着极为重要的影响.基于ITO玻璃基板涂胶工艺实验,研究了影响涂胶厚度和涂胶均匀性的各种因素,包括光刻胶黏度、涂胶辊表面结构、胶辊压入量和涂胶速度等.针对几种常见的典型涂胶缺陷进行了研究分析,并制定了相应的解决对策.     

单层陶瓷介质基片烧结技术研究

单层片式瓷介电容器产业化对制备该系列产品所需的陶瓷介质基片提出了很高的质量要求,要求陶瓷介质基片(长度×宽度×厚度=(25~50)mm×(25~50)mm×(0.1~0.3)mm)厚度均匀(五点测试,偏差≤0.01 mm)、表面平整(翘曲度≤0.05 mm/25 mm)、表面光洁、无凹坑和无杂质等缺陷。通过采用"垫片负重"、"生坯垒烧"和"生坯垒烧+垫片负重"烧结方式进行陶瓷介质基片的烧结试验,然后对不同烧结方式制备的介质基片表面质量进行分析和评价。结果表明:采用"生片垒烧+垫片负重"烧结方式制备出尺寸为40 mm×40 mm×0.25 mm的介质基片,其厚度均匀(最大偏差为0.003 mm)、表面平整(翘曲度≤0.05 mm/25 mm),陶瓷介质基片满足单层片式瓷介电容器后续工序对其表面质量的要求。     

全息光栅掩模制备中的光刻胶薄膜特性控制研究

本文对全息光栅掩模制备中光刻胶薄膜的应力与厚度均匀性问题进行了研究。应用干涉法及Stoney公式计算的分析结果,对SiO2基底上光刻胶薄膜的应力进行了研究。对膜厚的均匀性采用干涉显微镜在同一样品,不同直径上多点测量的方法,初步得出光刻胶薄膜膜厚均匀性的分布规律。分组变换加速度,转速,匀胶时间等参数,并对结果进行比较,发现在匀胶转速相同的前提下,光刻胶薄膜应力值随加速度的降低面减小,光刻胶薄膜的均匀性随加速度的增加而变好。在3000rpm至4000rpm的低转速时,光刻胶薄膜样品的膜厚均匀性好。出此,在全息光栅匀胶工艺中,要选择适当的转速的加速度,以得到应力较小和均匀性较好的光刻胶薄膜。与此同时,薄膜膜厚均匀性呈现出中间薄,边缘较厚的规律。     

一种新型聚合物微透镜阵列的制造技术

提出了一种利用软模压印制备微透镜阵列的技术.采用传统的光刻胶热熔方法制备微透镜阵列母板,利用复制模具的方法在聚二甲基硅氧烷(PDMS)上得到一个和母板表面图形相反的模具,最后通过压印的方法把PDMS模具上的图形转移到涂有紫外固化胶的玻璃基片上,待紫外胶完全固化后可得到和母板一致的微透镜阵列.经过测试微透镜阵列的焦点图像和表面形貌可发现最后制备的微透镜阵列表面形貌均匀、聚焦性能良好、光忖强均匀.     

紫外固化真空负压纳米压印系统的研制

气体压力施压是实现纳米压印技术中将模板压入转移介质的重要技术路径,在克服应力不均匀、保护基片和模板等方面优势明显。报道了一种旨在提高压印压力均匀性、低压力施压的真空负压紫外固化纳米压印系统的研制。制备真空腔室,腔室顶部利用弹性橡胶环结合紫外透过性好的SiO2玻璃与腔体连接,采用抽真空的方式形成负压,腔室外大气压强通过SiO2玻璃均匀地作用到压印模板上,将其压入液态紫外敏感光刻胶中,再采用紫外光固化光刻胶,分离后实现模板图形向基板的转移。压印力大小取决于腔室内外的气体压强差,通过调节腔室内部气压大小改变施加在模板上的实际压力,内部气压大小通过连通气压表观察。图形转移实验结果表明,所研制纳米压印样机系统能够实现图形的高保真转移,在基片上形成光刻胶材质的结果图形,500nm特征线宽图形转移实验结果清晰,在较大面积基片上的压印压力均匀性良好。     

纳米压印制作半导体激光器的分布反馈光栅

分布反馈(DFB)光栅的制作是半导体激光器芯片的关键工艺,通过纳米压印技术在InP基片表面涂覆的光刻胶上压印出DFB光栅图形,并分别通过湿法腐蚀和干法刻蚀技术将光栅图形转移到InP基片上。所制作的DFB光栅周期为240nm(对应于1 550nm波长的DFB激光器),光栅中间具有λ/4相移结构。采用纳米压印技术制作的DFB光栅相对于通常双光束干涉法制作的光栅具有更好的均匀性以及更低的线条粗糙度,而且解决了双光束干涉法无法制作非均匀光栅的技术难题。相对于电子束直写光刻法,采用纳米压印技术制作DFB光栅具有快速与低成本的优势。采用纳米压印技术在InP基片上成功制作具有相移结构的DFB光栅,为进一步进行低成本高性能的半导体激光器芯片的制作奠定了良好基础。     

AZ4620光刻胶的喷雾式涂胶工艺

对于一些MEMS应用,需要在形貌起伏很大的晶圆表面均匀地涂布光刻胶。喷雾式涂胶工艺满足了这些要求。研究了几种稀释的AZ4620光刻胶溶液的雾化喷涂性能,在沈阳芯源微电子设备有限公司KS-M200-1SP喷雾式涂胶机上进行了雾化喷涂试验,分别对裸片及深孔不同尺寸的晶圆进行喷雾式涂胶实验;特别研究了决定喷涂薄膜膜厚和均匀性...     

Extrusion spin coating: an efficient and deterministic photoresist coating method in microlithography

Extrusion spin coating was developed to reduce photoresist waste and to improve coating uniformity in microlithography. This new method uses an efficient extrusion coating technique to apply a thin film of resist to a wafer prior to spinning. This initial layer of photoresist eliminates the spreading phase, the most inefficient step in conventional spin coating. The initial layer also provides existing spin coating models with preset initial conditions, allowing the prediction of coating thickness and uniformity a priori. This paper compares the experimental results with Emslie et al.'s predictive models of spin coating. A solvent concentration of 80% or higher in the coating chamber environment was found to be necessary to attain a predictable coating thickness with 5-/spl Aring/ uniformity. With optimized process variables, the mean coating thickness matched theoretical predictions within a variation of 0.01 /spl mu/m. Defect-free coating results were achieved with coating efficiencies as high as 40%.     

Spray coating of PMMA for pattern transfer via electron beam lithography on surfaces with high topography

Spray coating of polymethylmethacrylate (PMMA) as electron beam resist on non planar surfaces is presented as a reliable technique for deposition of uniform resist layers with adjustable thickness at wafer scale. In the experiments a commercial spray coating system with an ultrasonic spray nozzle was used. Parameters which influence the quality of the resist layer with respect to uniformity across a 4 in Si wafer, such as ultrasonic power and dispensed volume, were evaluated. The suitability of spray coated PMMA for the pattern transfer on surfaces with high topography was proven by PMMA spray coating of 8 μm deep trenches etched into Si wafers. The PMMA was then electron beam exposed and chromium line patterns were transferred on the Si surface via a lift-off process.     

基于UV-LIGA技术的双层微齿轮模具镶块工艺

以氧化铟锡(ITO)玻璃作为基底,采用UV-LIGA技术制作了双层微齿轮型腔模具的镶块。首先,采用正胶(RZJ-304)进行光刻,在ITO玻璃表面电镀镍掩模,通过镍掩模对第一层SU-8光刻胶进行背面曝光。再利用正面套刻的方法对第二层SU-8光刻胶进行曝光,显影得到双层微齿轮的胶模。最后,进行微电铸得到双层微齿轮型腔镶块。通过实验验证了双层微齿轮模具镶块制作的工艺流程,优化了其工艺参数,克服了底部曝光不足引起的问题,并对制作工艺过程中产生的涂胶不平整、前烘时胶层不稳定、热板加热不均以及接触式曝光破坏胶层表面等问题进行了研究。所制得的双层微齿轮胶模垂直度高,表面质量好,且套刻精度高。     

Pattern transfer of microstructures between deeply etched surface for MEMS applications

Photolithography plays a vital role in micromachining process however; coating a thin and uniform resist layer on a non-planar surface is a challenging task for micro-electro-mechanical system (MEMS). Conventional spin coating of photoresist (PR) over an un-even surface would deliver streaks all over the wafer surface. Spray coating of PR is a promising technique when compared to other candidates. This paper presents an efficient pattern transfer of microstructures between the bulk micromachined cavities over silicon and glass wafers using an uncommon photoresist mixture being spray coated. The method is simple and highly cost effective. Finally we implemented this technique for a MEMS application to prove the feasibility of spray coating for microstructure fabrication.     

Linewidth variations in photoresist patterns on profiled surfaces

Photoresist thickness nonuniformities in the vicinity of profile steps on substrate surfaces lead to linewidth variations of AZ 1350 photoresist geometries. The effect increases with increasing reflectivity of the substrate, decreasing photoresist layer thickness, and decreasing contrast transfer of the exposure system. It is shown that the photoresist linewidth is maximum when the resist thickness is a multiple of half the exposure wavelength in the resist.     

Removal of post-etch photoresist and sidewall residues using organic solvent and additive combined with physical forces

The effect of tetramethyl ammonium hydroxide (TMAH) used as additive in organic solvent (N-methyl pyrrolidone, NMP) on removal efficiency of post-etch photoresist was investigated on both blanket substrate and single damascene structures. In contrast to plasma ashing, photoresist removal using NMP/TMAH combined with megasonics showed no carbon depletion and no significant change in k-value. Mixing TMAH with NMP enhanced photoresist removal efficiency with respect to pure NMP. Photoresist removal using NMP/TMAH resulted in lower low-k capacitance (lower k-value) compared with that of plasma ashing process, due to the removal of the damaged layer generated during plasma etching. As a consequence of the removal of the damaged layer, a CD change was observed. The CD loss was estimated to be about 7 nm for 1% TMAH, and became negligible for 0.1% TMAH. Analysis of low-k sidewall using angle-resolved X-ray photoelectron spectroscopy showed that solvent mixture containing TMAH also removed sidewall residues generated by the etch plasma.     

Engineering sidewall angles of silica-on-silicon waveguides

Burned photoresist is used as etch mask when producing silica-on-silicon waveguides. The sidewall angle of the optical glass waveguides is engineered by varying photoresist thickness and etch selectivity. The principle for the formation of the angles is introduced and very promising experimental results are shown.     

Concurrently pumped ultrasonic spray coating for donor:acceptor and thickness optimization of organic solar cells

We assess the utility of concurrent spray coating to efficiently screen and optimize solutions for organic solar cells. With this technique two independent solutions are coaxially pumped to the ultrasonic nozzle tip of the spray coater, where a micron-scale mist of droplets, each consisting of one of the two respective solutions with negligible mixing, is ejected toward the substrate. Concurrent spray coating is shown to allow the scanning of two important photoactive layer parameters: thickness, by concurrently diluting concentrated donor:acceptor (D:A) solution with pure solvent, and D:A ratio by concurrently spraying independent solutions of donor and acceptor. The assessment is done using the archetypal poly(3-hexylthiophene) (P3HT):(6,6)-phenyl C61-butyric acid methyl ester (PCBM) system. By allowing the droplets to coalesce on the substrate prior to drying, the resulting film realizes a favorable morphology, confirmed via high-performance OSC devices, with a peak efficiency of 4.1%, 72% fill factor, 9.3 mA/cm² short circuit current density, and a 620 mV open circuit voltage.