金刚石薄膜的低温沉积研究

采用微波等离子体辅助化学气相沉积法成功地在２８０～４４５℃沉积了金刚石薄膜。发现低温沉积的金刚石薄膜的形核密度随着温度的降低可得到极大提高；表面粗糙度随着温度的降低可得到大幅度的降低。     

MPCVD法AlN基体上金刚石薄膜的制备

以丙酮和氢气作气源,采用微波等离子体化学气相沉积法(MPCVD)在AlN表面制备金刚石薄膜,并通过拉曼光谱(Raman),扫描电子显微镜(SEM)对沉积得到的金刚石薄膜进行表征.研究表明:直接在AlN表面沉积因金刚石的形核密度很低而很难得到连续的金刚石薄膜.利用金刚石微粉研磨AlN表面有利于金刚石形核密度的提高,Raman分析和电镜观察发现:所得的金刚石薄膜存在杂质和缺陷,没有明显的刻面特征,而且是由粒径较大的球状颗粒堆积而成.     

MPCVD法AlN基体上金刚石薄膜的制备

以丙酮和氢气作气源,采用微波等离子体化学气相沉积法（MPCVD）在AlN表面制备金刚石薄膜,并通过拉曼光谱（Raman）,扫描电子显微镜（SEM）对沉积得到的金刚石薄膜进行表征.研究表明：直接在AlN表面沉积因金刚石的形核密度很低而很难得到连续的金刚石薄膜.利用金刚石微粉研磨AlN表面有利于金刚石形核密度的提高,Raman分析和电镜观察发现：所得的金刚石薄膜存在杂质和缺陷,没有明显的刻面特征,而且是由粒径较大的球状颗粒堆积而成.     

WC-Co硬质合金上高质量金刚石薄膜的制备

采用微波等离子体化学气相沉积法在硬质合金基体上制备金刚石薄膜.研究了铜过渡层和酸蚀脱钴两种基体前处理工艺以及在施加铜过渡层的情况下,不同的沉积气压和基片温度对金刚石薄膜的质量的影响.结果表明:在施加铜过渡层后,在适中的沉积条件下(沉积气压6.0 kPa,基片温度约为780℃)可得到质量较好的金刚石薄膜.     

直流负偏压对金刚石形核的影响

本文研究了微波等离子体化学气相沉积金刚石薄膜中，直流负偏压的大小、施加的时间和施加偏压期间的甲烷浓度对光滑Ｓｉ衬底上金刚石形核的影响．发现适当的衬底负偏压可以极大地促进金刚石的形核，而过高或过低的偏压则都不利于形核。     

MPECVD法在抛光石英玻璃上沉积金刚石薄膜

采用微波等离子体增强化学气相沉积方法(MPECVD),利用氢气和甲烷混合气体,在抛光石英基片上低温沉积出金刚石薄膜。用扫描电子显微镜(SEM)、激光拉曼光谱仪(Raman)和傅立叶红外光谱仪(FTIR)对薄膜的表面形貌、颗粒尺寸、纯度和光学透过性能进行了表征。通过SEM发现,得到的金刚石薄膜的颗粒尺寸为0.2~0.3μm,形核密度超过109cm-2,从薄膜形貌可以发现,较高温度有利于提高薄膜的生长速率和颗粒尺寸的均匀性。通过拉曼光谱和红外透射光谱分析发现,较高温度下沉积的薄膜具有较高的金刚石相含量,薄膜的光学透过性能也相对较好。     

WC—Co硬质合金上高质量金刚石薄膜的制备

采用微波等离子体化学气相沉积法在硬质合金基体上制备金刚石薄膜,研究了铜过渡层和酸蚀脱钴两种基体前处理工艺以及在施加铜过渡层的情况下,不同的沉积气压和基片温度对金刚石薄膜的质量的影响。结果表明,在施加铜过渡层后,在适中的沉积条件下（沉积气压6．0kPa,基片温度约为780度）可得到质量较好的金刚石薄膜。     

CVD条件对金刚石薄膜/钼基体界面层的影响

用微波等离子体化学气相沉积法(MPCVD)在Mo基片上沉积金刚石薄膜时,界面层钼的碳化程度与初始沉积条件有关.利用XRD,SEM,EDS对界面层进行的研究表明:在化学气相沉积的开始阶段,较低的甲烷浓度有利于碳向基体内的扩散从而让表面的Mo充分碳化,形成富含Mo2C的界面层.甲烷浓度过高时有利于金刚石的形核而不利于碳向基体内的扩散.在金刚石薄膜的生长过程中,碳向基体内的扩散很少,界面层的组成结构保持不变.     

CVD条件对金刚石薄膜／钼基体界面层的影响

用微波等离子体化学气相沉积法（MPCVD）在Mo基片上沉积金刚石薄膜时,界面层钼的碳化程度与初始沉积条件有关,利用XRD,SEM,EDS,对界面层进行的研究表明：在化学气相沉积的开始阶段,较低的甲烷浓度有利于碳向基体内的扩散从而让表面的Mo充分碳化,形成富含Mo2C的界面层,甲烷浓度过高时有利于金刚石的形核而不利于碳向基体内的扩散,在金刚石薄膜的生长过程中,碳向基体内的扩散很少,界面层的组成结构保持不变。     

金刚石薄膜的低温沉积

采用乙醇和氢气作为工作气体,利用微波等离子体化学气相沉积法在较低的沉积温度下制备了金刚石薄膜,用扫描电子显微镜(SEM)、Raman光谱、X射线衍射仪(XRD)和红外光谱研究了薄膜的结构和性质.结果表明:在450 ℃的基片温度下,利用乙醇和氢气在优化的工艺条件下可得到具有微晶结构的金刚石薄膜.     

PAHFCVD金刚石膜表面形貌的研究

采用等离子辅助热丝化学气相沉积(PAHFCVD)装置进行了金刚石薄膜、碳化钛/金刚石复合膜、掺硼金刚石薄膜的制备。制备条件分别为:V(CH)4∶V(H2)=3∶100,载气流量5~50 cm3.s─1,钛源钛酸异丙酯(Ti[OC3H7]4),硼源硼酸三甲酯(BC3O4H9),基体温度820~860℃,基体偏压300 V,沉积气压4 kPa。运用扫描电子显微镜(SEM)、X射线衍射(XRD)和能量扩散电子谱(EDX)等分析手段对PAHFCVD金刚石膜、金刚石复合膜和掺硼金刚石膜进行了表征。结果发现,金刚石/碳化钛膜和掺硼金刚石膜主要晶面为(111)面。     

Influence of methane on hot filament CVD diamond films deposited on high-speed steel substrates with WC-Co interlayer

Diamond films were deposited on high-speed steel substrates by hot filament chemical vapor deposition (HFCVD) method. To minimize the early formation of graphite and to enhance the diamond film adhesion, a WC-Co coating was used as an interlayer on the steel substrates by high velocity oxy-fuel spraying. The effects of methane content on nucleation, quality, residual stress and adhesion of diamond films were investigated. The results indicate that the increasing methane content leads to the increase in nucleation density, residual stress, the degradation of quality and adhesion of diamond films. Diamond films deposited on high-speed steel (HSS) substrate with a WC-Co interlayer exhibit high nucleation density and good adhesion under the condition of the methane content initially set to be a higher value (4%, volume fraction) for 30 min, and then reduced to 2% for subsequent growth at pressure of 3 kPa and substrate temperature of 800 °C.     

纳米针状金刚石膜的制备

利用高功率微波等离子体化学气相沉积方法在硅衬底上沉积了多晶金刚石薄膜,然后利用电子束蒸发方法在金刚石薄膜表面上沉积了5 nm厚的Pt薄膜.利用Pt的自组织化效应,再通过氢等离子体照射、氧等离子体刻蚀、王水处理等手段,使金刚石薄膜表面形成了纳米针.利用拉曼光谱和扫描电子显微镜(SEM)表征金刚石薄膜的结构,拉曼光谱显示在1 315 cm^-1处出现纳米金刚石特征峰,SEM显示纳米针均匀地直立在金刚石薄膜表面,每平方厘米大约含有10⁸个纳米针,纳米针的平均高度约为1 μm.     

YT类硬质合金成形铣刀的金刚石涂层工艺研究

针对YT15硬质合金B212型成形铣刀片,以两种不同的化学方式对硬质合金基体进行预处理,而后采用热丝化学气相沉积的方法在其表面沉积微米级金刚石薄膜.使用扫描电子显微镜观察金刚石薄膜颗粒的大小及均匀度,激光拉曼光谱仪检测金刚石涂层的成分,压痕法检验金刚石涂层刀片的膜-基附着强度,并就不同预处理的基体表面对金刚石薄膜的质量、附着性能的影响进行分析.结果表明,经预处理后的YT类硬质合金表面粗糙度较YG类降低约10%,采用平行布置热丝方式和现有的沉积工艺在YT类硬质合金衬底涂覆的金刚石薄膜均匀性较好,且经酸碱预处理的金刚石薄膜表现出良好的附着力,附着强度介于600~1 000 N,醇碱预处理对衬底表面原有的光洁度损坏较小,有助于细化金刚石晶粒,但膜-基附着强度不高.     

Synthesis of boron-doped diamond/porous Ti composite materials — Effect of carbon concentration

Highly boron-doped diamond films were deposited on porous titanium substrates by hot filament chemical vapor deposition technique.The morphology variation of highly boron-doped diamond films grown on porous titanium substrates was investigated,and the effects of carbon concentration on nucleation density and diamond growth were also studied.The continuous change of surface morphology and structure of diamond film were characterized by scanning electron microscopy.The structures of diamond film and interlayer were analyzed by X-ray diffraction.The quality of boron-doped diamond film was confirmed by visible Raman spectroscopy.The experimental results reveal that surface morphology and quality of boron-doped diamond films are various due to the change of carbon concentration.The thickness of intermediate layer decreases with the carbon concentration increasing.     

Nanodiamond films deposited at moderate temperature on pure titanium substrate pretreated by ultrasonic scratching in diamond powder suspension

Nanocrystalline diamond （NCD） film deposition on pure titanium and Ti alloys is extraordinarily difficult because of the high diffusion coefficient of carbon in Ti, the large mismatch in their thermal expansion coefficients, the complex nature of the interlayer formed during diamond deposition, and the difficulty to achieve very high nucleation density. In this investigation, NCD films were successfully deposited on pure Ti substrate by using a novel substrate pretreatment of ultrasonic scratching in a diamond powder-ethanol suspension and by a two-step process at moderate temperature. It was shown that by scratching with a 30-μm diamond suspension for 1 h, followed by a 10-h diamond deposition, a continuous NCD film was obtained with an average grain size of about 200 nm. Detailed experimental results on the preparation, characterization, and successful deposition of the NCD films on Ti were discussed.     

表面覆盖氮化硼膜的金刚石膜的场发射特性

利用热丝化学气相沉积（HFCVD）方法在Si衬底上生长了4μm厚的金刚石膜,然后利用射频磁控溅射方法在金刚石膜上沉积了100nm厚的六角氮化硼（h—BN）薄膜．在超高真空系统中测试了覆盖氮化硼（BN）薄膜前后金刚石膜的场发射特性,结果表明覆盖BN薄膜后的金刚石膜的场发射特性明显提高,开启电场由14V／μm升到8V／μm．F—N曲线表明,覆盖BN薄膜后的金刚石膜在强电场区域的场增强因子有所降低,这可能归因于场发射点随着电场的增强而改变．