Sn-0.3Ag-0.7Cu-xBi低银无铅钎料的润湿性

以Bi为添加剂对低银型Sn-0.3Ag-0.7Cu无铅钎料进行改性,应用SAT—5100型润湿平衡仪对Sn-0.3Ag-0.7Cu-xBi(x=0,1,3和4.5)钎料的润湿性能作了对比分析。结果表明:适量Bi元素的加入可以改善Sn-0.3Ag-0.7Cu钎料合金的润湿性能,且在240℃下Sn-0.3Ag-0.7Cu-3.0Bi无铅钎料具有最佳的润湿性能,在250℃其润湿力达到最大值3.2×10–3N/cm。     

Electromigration Behavior of Low-Silver Sn-0.3Ag-0.7Cu-1.6Bi-0.2In Solder Joints

Journal of Electronic Materials - In typical service environments, high current densities pass through the interconnection leads of solder joints. The electromigration reliability of solder joints...     

磁场对Sn-0.3Ag-0.7Cu焊点显微组织及性能影响研究

以Sn-0.3Ag-0.7Cu(SAC0307)低银无铅钎料焊点为研究对象,在焊点凝固过程中施加2.3T匀强磁场,通过观察低银无铅焊点显微组织变化,揭示磁场对焊点凝固及固态扩散行为影响;利用Fe、Ni增强元素对比得出SAC0307在不同环境下的凝固和固态扩散行为。将焊点置于电流密度为3×10~3 A/cm~3的磁电耦合环境下,观察了磁电耦合条件下焊点的显微组织演变过程,并总结了磁场对焊点电迁移行为的影响。结果表明:静磁场条件下,焊点界面处IMC形态由扇贝状向针状转变;IMC倾向于向钎料内部快速生长;Fe、Ni的加入进一步促进IMC生长。     

回流焊对SnAgCuBi/Cu焊点IMC及剪切强度的影响

利用金相显微镜和扫描电镜对多次回流焊后的Sn-0.3Ag-0.7Cu-xBi/Cu焊点IMC和剪切断口形貌进行了观察和分析。结果表明:Bi的加入提高了接头剪切强度,且随着Bi含量的增加而增加,当w(Bi)为4.5%时达最大值45.07MPa,同时Bi的加入有效抑制了焊点IMC的增长。经过5次回流焊后,未加入Bi的焊点剪切强度由24.55MPa下降到20.82MPa,而加入w(Bi)为3.0%的焊点剪切强度由35.95MPa下降到32.46MPa。     

稀土元素对Sn-0.2Ag-0.7Cu钎料合金物理性能的影响

在筛选出综合性能较好的Sn-0.2Ag-0.7Cu钎料合金中,添加微量混合稀土元素(RE)以提高钎料的焊接性能。研究了稀土的添加量对其熔化温度、电导率和固–液相线温差等焊接性能的影响。结果表明:添加w(RE)为0.1%~0.5%时,固–液相线温差小于15℃,符合现行钎焊工艺要求,且对钎料合金的熔化温度和电导率影响不大。     

Phase equilibria studies of Sn-Ag-Cu eutectic solder using differential cooling of Sn-3.8Ag-0.7Cu alloys

This paper is a study of the phase equilibria of the Sn-3.8Ag-0.7Cu alloy investigated by a differential cooling method. The difficulty in assessing phase equilibria of the Sn-Ag-Cu (SAC) system because of the insufficient resolution of conventional characterization techniques is solved by inducing preferential growth of a solid phase in a melt by holding the alloy at the solid-liquid phase-equilibrium field. Application of the technique to Sn-3.8Ag-0.7Cu with varying holding temperatures yielded results that the alloy is slightly off eutectic composition. The phase-formation sequence of the alloy during solidification was found to be Ag₃Sn, β-Sn, and finally the ternary eutectic microstructure.     

Effect of TiO2 additions on Sn-0.7Cu-0.05Ni lead-free composite solder

The effect of TiO₂ addition on the microstructure, melting behavior, microhardness and interfacial reaction between Sn-0.7Cu-0.05Ni and a Cu-substrate were explored. Samples with various TiO₂ percentages (0, 0.25, 0.5, 0.75 and 1.0 wt.%) were prepared using a microwave-assisted sintering powder metallurgy method. Microstructural analysis reveals that TiO₂ was uniformly distributed along the grain boundary of the bulk solder. Differential scanning calorimetry (DSC) results showed a decrease in the undercooling while melting temperature of the solder slightly increase. The thickness of the interfacial intermetallic compounds of the solder joint was reduced with the addition of TiO₂ particles. This thickness reduction indicates that the presence of a small amount of TiO₂ particles is effective in suppressing the growth of the intermetallic compound layer. Small dimples on the fracture surface have revealed that the Sn-Cu-Ni composite solder exhibits typical ductile failure. Overall, the addition of TiO₂ to Sn-0.7Cu-0.05Ni solder dramatically increases its shear strength and hardness and improves its wetting properties and fracture surface.     

Sn0.3Ag0.7Cu焊锡膏的储存稳定性研究

针对焊锡膏在储存过程中的发干、发粘、无法焊接等失效问题,通过研究不同有机酸活性剂与焊锡粉末的室温共存稳定性,对焊锡膏进行了失效分析,并对有机酸活性剂进行了研究。结果表明,不同有机酸室温下的活性有很大差异,水杨酸、丁二酸、戊二酸室温下活性较大,能对焊锡粉造成腐蚀,这是焊锡膏失效的主要原因。苹果酸、己二酸、壬二酸、癸二酸室温下活性较弱,不会对焊锡粉造成腐蚀。用己二酸、壬二酸复配作为活性剂配制的焊锡膏具有优异的焊接性能,高的室温储存稳定性,焊后残留少且无腐蚀性。     

An investigation of effects of Sb on the intermetallic formation in Sn-3.5Ag-0.7Cu solder joints

This study investigates the microstructural evolution and kinetics of intermetallic (IMC) formation in Sn-3.5Ag-0.7Cu lead-free solder joints with different percentages of Sb element, namely, Sn-3.5Ag-0.7Cu-xSb (x=0, 0.2, 0.5, 0.8, 1.0, 1.5, and 2.0). To investigate the elemental interdiffusion and growth kinetics of IMC formation, isothermal aging test is performed at temperatures of 100/spl deg/C, 150/spl deg/C, and 190/spl deg/C, respectively. Scanning electron microscope (SEM) is used to measure the thickness of intermetallic layer and observe the microstructural evolution of solder joint. The IMC phases are identified by EDX and XRD. Results show that some of the antimony powders are dissolved in the /spl beta/-Sn matrix (Sn-rich phase), some of them participate in the formation of Ag/sub 3/(Sn,Sb) and the rest dissolves in the Cu/sub 6/Sn/sub 5/ IMC layer. There is a significant drop in IMC thickness when Sb is added to 0.8 wt%. Over this amount the thickness of the IMC increases slightly again. The activation energy and growth rate of the IMC formation are determined. Results reveal that adding antimony in Sn-3.5Ag-0.7Cu solder system can increase the activation energy, and thus reduce the atomic diffusion rate, so as to inhibit the excessive growth of the IMC. The solder joint containing 0.8 wt% antimony has the highest activation energy. SEM images reveal that the number of small particles precipitating in the solder matrix increases with the increase in Sb composition. Based on the observation of the microstructural evolution of the solder joints, a grain boundary pinning mechanism for inhibition of the IMC growth due to Sb addition is proposed.     

Influence of Au addition on the phase equilibria of near-eutectic Sn-3.8Ag-0.7Cu Pb-free solder alloy

This paper illustrates the influence of Au addition on the phase equilibria of Sn-Ag-Cu (SAC) near-eutectic alloys and on the interface reaction with the Cu substrate. From the thermal and microstructural characterization of Sn-3.8Ag-0.7Cu alloys containing various amounts of Au, it is found that the Au promotes the formation of a quaternary-eutectic reaction at 204.5°C ± 0.3°C. The equilibrium phases in the quaternary-eutectic microstructure are found to be AuSn₄, Ag₃Sn, βSn, and Cu₆Sn₅. While the addition of Au to Sn-3.8Ag-0.7Cu alloys is also found to increase liquidus temperature and the temperature ranges of the phase equilibria field for primary phases, such influences from Au are found to be less pronounced when the alloys were reacted with the Cu substrate. Because of the formation of the Au-Cu-Sn-ternary interface intermetallic, it is found that a majority of Au added to the solder is drained from the melt. The drainage of Au reduces the impact of Au on the phase equilibria of the solder alloys in the joint. It is further found that the involvement of Au in the interface reaction results in a change of the interface phase morphology from the conventional scallop structure to a compositelike structure consisting of (AuCu)₆Sn₅ grains and finely dispersed, βSn islands.     

微量锗对Sn-0.7Cu-0.05Ni钎料微观组织与性能的影响

为改善Sn-0.7Cu-0.05Ni钎料抗氧化性差及溶铜速率快的问题,向Sn-0.7Cu-0.05Ni钎料中添加微量锗,研究了不同锗添加量(质量分数0.01%~0.10%)对SnCuNi钎料合金显微组织及性能的影响。结果表明,微量的锗能显著细化Sn-0.7Cu-0.05Ni钎料合金组织,抑制金属间化合物的生长,改善合金的组织分布,提高钎料的润湿性及力学性能。此外,锗的添加还能显著提高钎料的抗氧化性并降低溶铜速率,当锗的质量分数从0增至0.10%时,溶铜速率从0.117 m/s降至0.110 m/s。     

Corrosion behavior, whisker growth, and electrochemical migration of Sn-3.0Ag-0.5Cu solder doping with In and Zn in NaCl solution

Corrosion characteristics of Sn-3.0Ag-0.5Cu (SAC) solder doped with In and Zn in NaCl solutions were conducted by sweeping the voltage at a constant rate with a potentiostat. Whisker growth was completed by dipping in 3.5 wt.% NaCl salt solution. Electrochemical migration (ECM) experiment was carried out as a designed program in an electric field with a power supply. Surface morphology and elemental composition of SAC and its doped candidates were determined by SEM, EDAX, XRD techniques. Results showed that when the percent content of Zn was ?1%, corrosion current density (I_corr) increased with Zn% increasing, it was up to the highest value when %Zn was 1%. After that, the open circuit potential moved negatively quickly as a function of Zn percent, however I_corr increased with Zn percent increasing, also lower than that of doped solder with 1 wt.% Zn, higher than that of no doped solder. The same corrosive law was suitable for SAC candidate with In doping. SEM morphologies showed that whiskers existed in all cases of different In/Zn-concentration alloys. After exposure to severe conditions (3.5 wt.% NaCl solution) for 7 days, the longest whisker for 96.8(Sn-3.0Ag-0.5Cu)-0.2In-3Zn solder was about 300 μm, the average grown rate was evaluated to about 5 Å/s which is higher than the reported result in the former literatures. The possible mechanism was that: after metals reacted with water/ions in water, products or oxidizer in solder expanded to induce compression stress, during the release of stress, Sn extruded out. ECM tests showed that dendrite growth was a result of system under far-equilibrium conditions in sorts of fields as electrical field, thermal field, concentration field, etc., the farer off the equilibrium, the easier that ECM process took place. Dendrite growth rate of SAC solder were faster than those of its candidates with In or Zn dopings, furthermore, rate with Zn doping was larger than that with In doing, which is due to differences on surfaces or different intermetallic compound formations (IMC) on surfaces. Doped with In, dendrites looked like emarcid petals, although they might not look like dendrites, contents on dendrites were mainly Sn. Whereas, dendrites looked like clew with only Zn doping, it was mainly Sn with little Zn. Different from the above, dendritic microstructures of SAC solder without doping entirely looked like branches, contents were mainly Cu and Sn. From the points of corrosion and whisker growth, Zn, In dopings in SAC solders may be not benefit to micro/nanoelectronic packaging, though other mechanical or soldering characteristics can be improved with their dopings.     

Effect of volume in interfacial reaction between eutectic Sn-3.5% Ag-0.5% Cu solder and Cu metallization in microelectronic packaging

The Sn-3.5Ag-0.5Cu (wt.%) is the most promising replacement for the eutectic tin-lead solder alloy. Here, an investigation has been carried out to compare the interfacial reactions of the Cu pad of a ball grid array (BGA) substrate with molten eutectic Sn-3.5% Ag-0.5% Cu solder having different volumes. Two different sizes of BGA solder balls were used: 760-μm and 500-μm diameter. Scanning electron microscopy (SEM) was used to measure the consumed thickness of the Cu and also the thickness of the intermetallic compound (IMC). The soldering reaction was carried out at 230°C, 240°C, and 250°C for 1 min, 5 min, 10 min, and 20 min. The Cu consumption was much higher for the Sn-Ag-Cu solder with higher volume. On the other hand, the mean thickness of the intermetallics for solder with smaller volume was thicker than that of the bigger solder balls. The Cu₃Sn compound was also observed at the interface between the Cu₆Sn₅ IMCs and Cu substrate for longer reflow for the both solder balls. Larger Cu₆Sn₅ IMCs were observed in the bulk of the solder with bigger volume. A simplistic theoretical approach is carried out to find out the amount of Cu₆Sn₅ IMCs in the bulk of the solder by measurement of the Cu consumption from the substrate and the thickness of the IMCs that form on the interface.     

Microstructural and tensile properties of Fe and Bi added Sn-1Ag-0.5Cu solder alloy under high temperature environment

In this work, the iron (Fe) and bismuth (Bi) added (0.05 wt% Fe and 1 wt% or 2 wt% Bi) Sn-1Ag-0.5Cu (SAC105) lead-free solder alloys were prepared and their microstructure and tensile properties under severe thermal environments were extensively investigated and compared with the base alloy SAC105. The isothermal aging was done at 200 °C for 100 h, 200 h, and 300 h. Fe/Bi added SAC105 showed a significant reduction in the IMCs size (Ag₃Sn and Cu₆Sn₅), especially the Cu₆Sn₅ IMCs and a refinement in the microstructure, which is due to the existence of Bi in the alloys. Moreover, the existence of Fe and Bi gives the microstructure better stability under severe thermal aging conditions. The tensile testing results showed that the addition of Fe and Bi to SAC105 greatly improves yield stress and tensile strength, but decreases ductility level, which is because of the Bi solid solution strengthening mechanism. Under severe thermal aging, the Fe/Bi added SAC105 showed more stable tensile properties, because of the existence of both Fe and Bi in the alloys.     

Quantitative metallography of β-Sn dendrites in Sn-3.8Ag-0.7Cu ball grid array solder balls via electron backscatter diffraction and polarized light microscopy

Electron backscatter diffraction and polarized light microscopy have been used to quantify the number of crystallographically independent β-Sn dendrites present in near-eutectic, ball grid array Sn-Ag-Cu (SAC) solder balls as a function of cooling rate (0.35–3.0°C/s). Based on these data, it is estimated that a single 900-μm-diameter solder ball contains on average eight individual β-Sn dendrites, independent of cooling rate. Specific orientation relationships were also found to be prevalent between neighboring β-Sn dendrites. These results confirm and expand upon recent research, and further emphasize the probable anisotropic nature of SAC solder joints.     

Sn0.7Cu-xEr/Cu焊点界面反应及其化合物层生长行为研究

通过回流焊工艺制备了Sn0.7Cu-x Er/Cu(x=0,0.1,0.5)钎焊接头,研究钎焊温度及等温时效时间对接头的界面金属间化合物(IMC)的形成与生长行为的影响。结果表明:Sn0.7Cu钎料中微量稀土Er元素的添加,能有效抑制钎焊及时效过程中界面IMC的形成与生长。在等温时效处理过程中,随着时效时间的延长,界面反应IMC层不断增厚,在相同时效处理条件下,Sn0.7Cu0.5Er/Cu焊点界面IMC层的厚度略小于Sn0.7Cu0.1Er/Cu焊点界面的厚度。通过线性拟合方法,得到Sn0.7Cu0.1Er/Cu和Sn0.7Cu0.5Er/Cu焊点界面IMC层的生长速率常数分别为3.03×10–17 m2/s和2.67×10–17 m2/s。     

Depressing effect of 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu solder alloy on the intermetallic growth with Cu substrate during isothermal aging

The formation and growth of intermetallic compounds (IMCs) in lead-free solder joints, during soldering or subsequent aging, have a significant effect on the thermal and mechanical behavior of solder joints. In this study, the effects of a 0.2wt.%Zn addition into Sn-3.0Ag-0.5Cu (SAC) lead-free solder alloys on the growth of IMCs with Cu substrates during soldering and subsequent isothermal aging were investigated. During soldering, it was found that a 0.2wt.%Zn addition did not contribute to forming the IMC, which was verified as the same phase structure as the IMC for Sn-3.0Ag-0.5Cu/Cu. However, during solid-state isothermal aging, the IMC growth was remarkably depressed by the 0.2 wt.% Zn addition in the SAC solder matrix, and this effect tended to be more prominent at higher aging temperature. The activation energy for the overall IMC growth was determined as 61.460 and 106.903 kJ/mol for Sn-Ag-Cu/Cu and Sn-Ag-Cu-0.2Zn/Cu, respectively. The reduced diffusion coefficient was confirmed for the 0.2Zn-containing solder/Cu system. Also, thermodynamic analysis showed the reduced driving force for the Cu₆Sn₅ IMC with the addition of Zn. These may provide the evidence to demonstrate the depressing effect of IMC growth due to the 0.2wt.%Zn addition in the Sn-Ag-Cu solder matrix.     

Comparative studies on solder joint reliability of CTBGA assemblies with various adhesives using the array-based package shear test

This paper discusses the influences of various adhesives on board-level shear strength of ChipArray® Thin Core Ball Grid Array (CTBGA) assemblies through an innovative reliability evaluation approach, i.e. array-based package (ABP) shear test. It is found that the adhesives do enhance the shear strength for all the test categories as compared with the assemblies without adhesives (w/o A), but the degree of improvements between different strategies vary quiet a lot. The specific shear strength is affected by a number of factors, in which dispending patterns and material properties of the adhesives used influences it obviously. In general, the adhesives with high storage modulus and large dispensing volume are preferred, for example, stiff full or partial capillary flow underfills. In order to further understand the failure mechanism of the CTBGA during the ABP shear test, failure analysis on tested devices are also conducted using side view optical microscopy, scanning electron microscope (SEM) and energy dispersive X-ray (EDX), the results indicate that the predominant failure mode changes from PCB pad lift/cratering to fracture at package side intermetallic compound (IMC)/solder interface with increasing dispensing volume and storage modulus, which basically improves the solder joint reliability of CTBGA assemblies.     

Investigation on thermal fatigue of SnAgCu,Sn100C,and SnPbAg solder joints in varying temperature environments

Thermal cycling tests have been performed for a range of electronic components intended for avionic applications, assembled with SAC305, SN100C and SnPbAg solder alloys. Two temperature profiles have been used, the first ranging between −20 °C and +80 °C (TC1), and the second between −55 °C and +125 °C (TC2). High level of detail is provided for the solder alloy composition and the component package dimensions, and statistical analysis, partially supported by FE modeling, is reported. The test results confirm the feasibility of SAC305 as a replacement for SnPbAg under relatively benign thermomechanical loads. Furthermore, the test results serve as a starting point for estimation of damage accumulation in a critical solder joint in field conditions, with increased accuracy by avoiding data reduction. A computationally efficient method that was earlier introduced by the authors and tested on relatively mild temperature environments has been significantly improved to become applicable on extended temperature range, and it has been applied to a PBGA256 component with SAC305 solder in TC1 conditions. The method, which utilizes interpolated response surfaces generated by finite element modeling, extends the range of techniques that can be employed in the design phase to predict thermal fatigue of solder joints under field temperature conditions.