A 2.4-GHz 0.25-/spl mu/m CMOS dual-mode direct-conversion transceiver for bluetooth and 802.11b

A dual-mode transceiver integrates the transmitter of 0-dBm output power and the receiver for both Bluetooth with -87 dBm sensitivity and 802.11b with -86 dBm sensitivity in a single chip. A direct-conversion architecture enables the maximum reuse and the optimal current consumption of the various building blocks in each mode for a low-cost and low-power solution. A single-ended power-amplifer (PA) driver transmits the nominal output power of 0 dBm with 18-dB gain control in 3-dB steps. Only little area overhead is required in the baseband active filter and programmable gain amplifier (PGA) to provide the dual-mode capability with optimized current consumption. The DC-offset cancellation scheme coupled with PGAs implements the very low high-pass cutoff frequency with a smaller area than required by a simple coupling capacitor. Fabricated in 0.25-/spl mu/m CMOS process, the die area is 8.4 mm/sup 2/ including pads, and current consumption in RX is 50 mA for Bluetooth and 65 mA for 802.11b from a 2.7-V supply.     

A 2.4-GHz dual-mode 0.18-/spl mu/m CMOS transceiver for Bluetooth and 802.11b

High-level integration of the Bluetooth and 802.11b WLAN radio systems in the 2.4-GHz ISM band is demonstrated in scaled CMOS. A dual-mode RF transceiver IC implements all transmit and receive functions including the low-noise amplifier (LNA), 0-dBm power amplifier, up/down mixers, synthesizers, channel filtering, and limiting/automatic gain control for both standards in a single chip without doubling the required silicon area to reduce the combined system cost. This is achieved by sharing the frequency up/down conversion circuits in the RF section and performing the required baseband channel filtering and gain functions with just one set of reconfigurable channel filter and amplifier for both modes. A chip implemented in 0.18-/spl mu/m CMOS occupies 4/spl times/4 mm/sup 2/ including pad and consumes 60 and 40 mA for RX and TX modes, respectively. The dual-mode receiver exhibits -80-dBm sensitivity at 0.1% BER in Bluetooth mode and at 12-dB SNR in WLAN mode.     

A fully integrated SOC for 802.11b in 0.18-/spl mu/m CMOS

A fully integrated system-on-a-chip (SOC) intended for use in 802.11b applications is built in 0.18-/spl mu/m CMOS. All of the radio building blocks including the power amplifier (PA), the phase-locked loop (PLL) filter, and the antenna switch, as well as the complete baseband physical layer and the medium access control (MAC) sections, have been integrated into a single chip. The radio tuned to 2.4 GHz dissipates 165 mW in the receive mode and 360 mW in the transmit mode from a 1.8-V supply. The receiver achieves a typical noise figure of 6 dB and -88-dBm sensitivity at 11 Mb/s rate. The transmitter delivers a nominal output power of 13 dBm at the antenna. The transmitter 1-dB compression point is 18 dBm and has over 20 dB of gain range.     

A Bluetooth radio in 0.18-/spl mu/m CMOS

This paper describes the results of an implementation of a Bluetooth radio in a 0.18-/spl mu/m CMOS process. A low-IF image-reject conversion architecture is used for the receiver. The transmitter uses direct IQ-upconversion. The VCO runs at 4.8-5.0 GHz, thus facilitating the generation of 0/spl deg/ and 90/spl deg/ signals for both the receiver and transmitter. By using an inductor-less LNA and the extensive use of mismatch simulations, the smallest silicon area for a Bluetooth radio implementation so far can be reached: 5.5 mm/sup 2/. The transceiver consumes 30 mA in receive mode and 35 mA in transmit mode from a 2.5 to 3.0-V power supply. As the radio operates on the same die as baseband and SW, the crosstalk-on-silicon is an important issue. This crosstalk problem was taken into consideration from the start of the project. Sensitivity was measured at -82 dBm.     

An analog GFSK modulator in 0.35-/spl mu/m CMOS

An analog Gaussian frequency shift keying (GFSK) modulator designed in 0.35-/spl mu/m CMOS consumes 600 /spl mu/A from a 3-V supply and realizes an analog implementation of the FM differential equation. The modulator operates at baseband and is intended for use in a direct-conversion Bluetooth transmitter. It achieves a frequency deviation of 160 kHz with better than /spl plusmn/3% accuracy. The modulator implements an amplitude control loop to achieve a well-defined output swing. The total output harmonic distortion is less than 1%.     

A 0.35-/spl mu/m CMOS 2-GHz VCO in wafer-level package

This letter presents a complementary metal oxide semiconductor (CMOS) voltage-controlled oscillator (VCO) with a high-Q inductor in a wafer-level package for the LC-resonator. The on-chip inductor is implemented using the redistribution metal layer of the wafer-level package (WLP), and therefore it is called a WLP inductor. Using the thick passivation and copper metallization, the WLP inductor has high quality-factor (Q-factor). A 2-nH inductor exhibits a Q-factor of 8 at 2 GHz. The center frequency of the VCO is 2.16 GHz with a tuning range of 385 MHz (18%). The minimum phase noise is measured to be -120.2 dBc/Hz at an offset frequency of 600 kHz. The dc power consumed by the VCO-core is 1.87 mW with a supply voltage of 1.7 V and a current of 1.1 mA. The output power with a 50-/spl Omega/ load is -12.5/spl plusmn/1.3 dBm throughout the whole tuning range. From the best of our knowledge, compared with recently published 2-GHz-band 0.35 /spl mu/m CMOS VCOs in the literature, the VCO in this work shows the lowest power consumption and the best figure-of-merit.     

A 3-V, 0.35-/spl mu/m CMOS Bluetooth receiver IC

A fully integrated CMOS low-IF Bluetooth receiver is presented. The receiver consists of a radio frequency (RF) front end, a phase-locked loop (PLL), an active complex filter, a Gaussian frequency shift keying (GFSK) demodulator, and a frequency offset cancellation circuit. The highlights of the receiver include a low-power active complex filter with a nonconventional tuning scheme and a high-performance mixed-mode GFSK demodulator. The chip was fabricated on a 6.25-mm/sup 2/ die using TSMC 0.35-/spl mu/m standard CMOS process. -82 dBm sensitivity at 1e-3 bit error rate, -10 dBm IIP3, and 15 dB noise figure were achieved in the measurements. The receiver active current is about 65 mA from a 3-V power supply.     

A 10.7-MHz sixth-order SC ladder filter in 0.35-/spl mu/m CMOS technology

A sixth-order 10.7-MHz bandpass switched-capacitor filter based on a double terminated ladder filter is presented. The filter uses a multipath operational transconductance amplifier (OTA) that presents both better accuracy and higher slew rate than previously reported Class-A OTA topologies. Design techniques based on charge cancellation and slower clocks are used to reduce the overall capacitance from 782 down to 219 unity capacitors. The filter's center frequency and bandwidth are 10.7 MHz and 400 kHz, respectively, and a passband ripple of 1 dB in the entire passband. The quality factor of the resonators used as filter terminations is around 32. The measured (filter + buffer) third-intermodulation (IM3) distortion is less than -40 dB for a two-tone input signal of +3-dBm power level each. The signal-to-noise ratio is roughly 58 dB while the IM3 is -45 dB; the power consumption for the standalone filter is 42 mW. The chip was fabricated in a 0.35-/spl mu/m CMOS process; filter's area is 0.84 mm/sup 2/.     

A single-chip dual-band direct-conversion IEEE 802.11a/b/g WLAN transceiver in 0.18-/spl mu/m CMOS

This paper presents a single-chip dual-band CMOS direct-conversion transceiver fully compliant with the IEEE 802.11a/b/g standards. Operating in the frequency ranges of 2.412-2.484 GHz and 4.92-5.805 GHz (including the Japanese band), the fractional-N PLL based frequency synthesizer achieves an integrated (10 kHz-10 MHz) phase noise of 0.54/spl deg//1.1/spl deg/ for 2/5-GHz band. The transmitter error vector magnitude (EVM) is -36/-33 dB with an output power level higher than -3/-5dBm and the receiver sensitivity is -75/-74 dBm for 2/5-GHz band for 64QAM at 54 Mb/s.     

Ultra low power 2.4-GHz 0.35-/spl mu/m CMOS dual-modulus prescaler design

This letter presents the design and implementation of a dual-modulus (64/65) prescaler based upon the phase-switching technique. Low power consumption is achieved by using one dynamic flip-flop in the full-speed divide-by-four circuit and no power-hungry synchronizing circuits to tackle the glitch problem. The proposed design is fabricated using 0.35-/spl mu/m standard CMOS process and is measured to operate from 2.08-2.66GHz with power dissipation of less than 1mW.     

Dual-modulus 127/128 FOM enhanced prescaler design in 0.35-/spl mu/m CMOS technology

The dual-modulus prescaler is a critical block in CMOS systems like high-speed frequency synthesizers. However, the design of high-moduli, high-speed, and low-power dual-modulus prescalers remains a challenge. To face the challenge, this paper introduces the idea of using transmission gates and pseudo-PMOS logic to realize the dual-modulus prescaler. The topology of the prescaler proposed is different from prior designs primarily in two ways: 1) it uses transmission gates in the critical path and 2) the D flip-flops (DFFs) used in the synchronous counter comprise pseudo-PMOS inverters and ratioed latches. A pseudo-PMOS logic-based DFF is introduced and used in the proposed prescaler design. Based on the proposed topology, a dual-modulus divide-by-127/128 prescaler is implemented in 0.35-/spl mu/m CMOS technology. It consumes 4.8 mW from a 3-V supply. The measured phase noise is -143.4 dBc/Hz at 600 kHz. The silicon area required is only 0.06 mm/sup 2/. There are no flip flops or logic gates in the critical path. This topology is suitable for high-speed and high-moduli prescaler designs. It reduces: 1) design complexity; 2) power consumption; and 3) input loading. Measurement results are provided. An improvement in the figure of merit is shown.     

A 0.18-/spl mu/m CMOS bioluminescence detection lab-on-chip

The paper describes a bioluminescence detection lab-on-chip consisting of a fiber-optic faceplate with immobilized luminescent reporters/probes that is directly coupled to an optical detection and processing CMOS system-on-chip (SoC) fabricated in a 0.18-/spl mu/m process. The lab-on-chip is customized for such applications as determining gene expression using reporter gene assays, determining intracellular ATP, and sequencing DNA. The CMOS detection SoC integrates an 8 /spl times/ 16 pixel array having the same pitch as the assay site array, a 128-channel 13-bit ADC, and column-level DSP, and is fabricated in a 0.18-/spl mu/m image sensor process. The chip is capable of detecting emission rates below 10/sup -6/ lux over 30 s of integration time at room temperature. In addition to directly coupling and matching the assay site array to the photodetector array, this low light detection is achieved by a number of techniques, including the use of very low dark current photodetectors, low-noise differential circuits, high-resolution analog-to-digital conversion, background subtraction, correlated multiple sampling, and multiple digitizations and averaging to reduce read noise. Electrical and optical characterization results as well as preliminary biological testing results are reported.     

An 8-Gb/s/pin simultaneously bidirectional transceiver in 0.35-/spl mu/m CMOS

This paper presents architecture, circuits, and test results for a single-ended, simultaneously bidirectional interface capable of a total throughput of 8 Gb/s per pin. The interface addresses noise reduction challenges by utilizing a pseudodifferential reference with noise immunity approaching that of a fully differential reference. The transmitter supports on-chip termination, predistortion, and low-skew near-end outgoing signal echo cancellation. The receiver's sense amplifier evaluates the average of two differential input signals without use of analog components and utilizes imbalanced charge injection to compensate for offset voltages. A test chip integrated in a 0.35-/spl mu/m digital CMOS technology uses the proposed techniques to implement an 8-bit wide single-ended voltage-mode simultaneous bidirectional interface and achieves a performance of 8 Gb/s per pin.     

A 1-V 2.5-mW 5.2-GHz frequency divider in a 0.35-/spl mu/m CMOS process

A 1-V low-power high-speed dynamic-loading frequency divider is proposed using novel D flip-flops with a common-gate topology and with a single clock phase. A simple and accurate small-signal analysis model is provided to estimate the operating frequencies of the divider. Implemented in a standard digital 0.35-/spl mu/m CMOS process and at 1-V supply, the proposed frequency divider measures a maximum operating frequency up to 5.2 GHz with a power consumption of 2.5 mW.     

A low-voltage folded-switching mixer in 0.18-/spl mu/m CMOS

Scaling of CMOS technologies has a great impact on analog design. The most severe consequence is the reduction of the voltage supply. In this paper, a low voltage, low power, AC-coupled folded-switching mixer with current-reuse is presented. The main advantages of the introduced mixer topology are: high voltage gain, moderate noise figure, moderate linearity, and operation at low supply voltages. Insight into the mixer operation is given by analyzing voltage gain, noise figure (NF), linearity (IIP3), and DC stability. The mixer is designed and implemented in 0.18-/spl mu/m CMOS technology with metal-insulator-metal (MIM) capacitors as an option. The active chip area is 160 /spl mu/m/spl times/200 /spl mu/m. At 2.4 GHz a single side band (SSB) noise figure of 13.9 dB, a voltage gain of 11.9 dB and an IIP3 of -3 dBm are measured at a supply voltage of 1 V and with a power consumption of only 3.2 mW. At a supply voltage of 1.8 V, an SSB noise figure of 12.9 dB, a voltage gain of 16 dB and an IIP3 of 1 dBm are measured at a power consumption of 8.1 mW.     

A matrix amplifier in 0.18-/spl mu/m SOI CMOS

A fully integrated matrix amplifier with two rows and four columns (2-by-4) fabricated in a three-layer metal 0.18-/spl mu/m silicon-on-insulator (SOI) CMOS process is presented. It exhibits an average pass-band gain of 15 dB and a unity-gain bandwidth of 12.5 GHz. The input and output ports are matched to 50 /spl Omega/ using m-derived half sections; the measured S/sub 11/ and S/sub 22/ values exceed -7 and -12 dB, respectively. Integrated in 2.0/spl times/2.9mm/sup 2/, it dissipates 233.4 mW total from 2.4- and 1.8-V power supplies.     

A 2-V 2.3/4.6-GHz dual-band frequency synthesizer in 0.35-/spl mu/m digital CMOS process

This brief describes the design of a frequency synthesizer for 2.3/4.6-GHz wireless applications in a 0.35-/spl mu/m digital CMOS process. This synthesizer provides dual-band output signals by means of frequency doubling techniques. Output frequency of the proposed synthesizer ranges from 1.87-2.3 GHz, and 3.74-4.6GHz. This chip consumes a total power of 80 mW from a single 2-V supply, including 45 mW for dual-band output buffers. Core size is 2200 /spl mu/m/spl times/1600 /spl mu/m.     

0.18 /spl mu/m 3-6 GHz CMOS broadband LNA for UWB radio

A 3-6 GHz CMOS broadband low noise amplifier (LNA) for ultra-wideband (UWB) radio is presented. The LNA is fabricated with the 0.18 /spl mu/m 1P6M standard CMOS process. Measurement of the CMOS LNA is performed using an FR-4 PCB test fixture. From 3 to 6 GHz, the broadband LNA exhibits a noise figure of 4.7-6.7 dB, a gain of 13-16 dB, and an input/output return loss higher than 12/10 dB, respectively. The input P/sub 1 dB/ and input IP3 (IIP3) at 4.5 GHz are about -14 and -5 dBm, respectively. The DC supply is 1.8 V.     

A transmit/receive IF chip set for WCDMA mobiles in 0.35 /spl mu/m CMOS

An implementation of the IF section of WCDMA mobile transceivers with a set of two chips fabricated in an inexpensive 0.35-/spl mu/m two-poly three-metal CMOS process is presented. The transmit/receive chip set integrates quadrature modulators and demodulators, wide dynamic range automatic gain control (AGC) amplifiers, with linear-in-decibel gain control, and associated circuitry. This paper describes the problems encountered and the solutions envisaged to meet stringent specifications, with process and temperature variations, thus overcoming the limitations of CMOS devices, while operating at frequencies in the range of 100 MHz-1 GHz. Detailed measurement results corroborating successful application of the new techniques are reported. A receive AGC dynamic range of 73 dB with linearity error of less than /spl plusmn/2 dB and spread of less than 5 dB for a temperature range of -30/spl deg/C to +85/spl deg/C in the gain control characteristic has been measured. The modulator measurement shows a carrier suppression of 35 dB and sideband/third harmonic suppression of over 46 dB. The core die area of each chip is 1.5 mm/sup 2/.     

A 92-MHz 13-bit IF digitizer using optimized SC integrators in 0.35-/spl mu/m CMOS technology

A feedforward compensation scheme with no Miller capacitors is proposed to overcome the bandwidth limitations of traditional Miller compensation schemes. The technique has been used in the design of an operational transconductance amplifier (OTA) with a dc gain of 80 dB, gain bandwidth of 1.4 GHz, phase margin of 62/spl deg/, and 2 ns settling time for 2-pF load capacitor in a standard 0.35-/spl mu/m CMOS technology. The OTA's current consumption is 4.6 mA. The OTA is used in the design of a fourth-order switched-capacitor bandpass /spl Sigma//spl Delta/ modulator with a clock frequency of 92 MHz. It achieves a peak signal-to-noise ratio of 80 and 54 dB for 270-kHz (GSM) and 3.84-MHz (CDMA) bandwidths, respectively and consumes 19 mA of current from a /spl plusmn/1.25-V supply.