像增强器参数综合测试研究

采用高灵敏度低噪声CCD器件作为像管输出图像的探测接收器,研制了一台像增强器参数综合测试系统.分析了各参数的综合测试方法与原理.优化的结构设计保证了一台仪器就能够对像增强器的亮度增益、调制传递函数、分辨力等多种性能参量测试.利用统计学的方法对多次测试结果进行误差分析.试验表明,测试系统具有测试过程自动快速及测试数据准确稳定的优点.     

基于虚拟仪器技术的激光接收器测试系统

本测试系统通过先进的虚拟仪器技术和LabVIEW7．0编程，实现了对传统光学测试仪器的控制并利用信号源和NIPCI-6104E多功能采集卡进行激光接收器模拟仿真；该系统能实时地采集和分析相关测试数据，并能显示、保存和打印最终测试结果。由于使用选进的LabVIEW，编程开发软件和虚拟仪器技术，该系统成为能自动化检测激光接收器各项参数的综合测试系统。实际的测试结果证明，这种方法实用、方便，测量精度高。     

激光引信光学组件参数综合测试技术

对激光引信光学组件的综合测试技术进行了研究,研制了激光引信光学组件测试系统,该系统分为发射机光学组件调试单元和接收机光学组件调试单元,实现了激光引信光学组件的光波长、光功率、发散角、灵敏度、响应时间、视场角、静态噪声等参数的全自动综合测试.测试结果表明:系统重复性好、可靠性高、自动化程度高.     

基于虚拟仪器的直升机电源综合测试系统

介绍了一种直升机电源特性综合测试系统的设计方法,该系统采用现场总线测试技术,使用虚拟仪器编程语言LabWindows/CVI6.0设计了直升机各种供电特性参数的测试算法,实现了数据的多通道同时快速采集以及并行同步采集。虚拟仪器面板的交互式使用,使界面操作简单、便捷。实践证明该电源综合测试系统设计先进,稳定可靠,测试结果达到了要求的精度,可对被测对象的电气特性是否达到国军标要求进行评估。     

激光参数综合测试仪中的几个技术问题及解决方法

从激光技术发展及广泛应用的实际需要出发,提出设计研制激光参数综合测试系统,较详细阐述了系统的重要组成：包括激光发射参数测试、激光接收参数测试、数据处理等分系统及各分系统的主要功能;重点叙述了研制过程中所遇到的主要技术问题及解决方法;给出了该系统的主要技术指标,对该系统的主要技术特点作出了基本说明。     

基于外挂式虚拟仪器的军用电台测试

为了实现军用电台参数的综合测试,本文介绍了虚拟仪器技术在电台综合检测中的具体应用.归纳提取了电台指标测试的基本动作语义集台,提出了采用通用串行总线US8与虚拟仪器开发系统LabVIEW相结合形成外挂式的综合测试平台,兼顾了通用性与专用性,使电台复杂的控制和测量过程更简便、更离效.     

基于外挂式虚拟仪器的军用电台测试

为了实现军用电台参数的综合测试,本文介绍了虚拟仪器技术在电台综合检测中的具体应用.归纳提取了电台指标测试的基本动作语义集台,提出了采用通用串行总线US8与虚拟仪器开发系统LabVIEW相结合形成外挂式的综合测试平台,兼顾了通用性与专用性,使电台复杂的控制和测量过程更简便、更离效.     

基于LabVIEW的LOCOTROL模块测试装置

基于LabVIEW软件开发的LOCOTROL模块测试装置的原理,测控硬件与软件的工作流程.LOCOTROL TRIM/RIM模块综合测试装置包括了继电器触头时间测试、线圈电阻测试、触头电阻测试、逻辑电路测试四个故障诊断模块.程序对采集的数据进行处理后,在触摸显示屏上显示,实现测试参数的实时纪录.结果表明,系统具有测量与控制精度高,自动化程度高等特点.     

电子信息

微机汽车电器盒综合测试系统问世南京航空航天大学测试工程系研制成功汽车电器总成盒综合测试系统.该系统采用微机自动控制技术,可对总成盒上6种41个电器的58种参数实现自动快速检测.显示屏幕用中文菜单提示,显示直观操作简便,能指示有故障或不合格电器部件的位置,并自动进行质量统计和显示、打印、记录,适用于汽车电器总成盒生产厂、汽车总装厂和汽车修理、研究设计等领域.     

一种基于测试集分组的广义交替码

测试数据编码压缩是一类重要、经典的测试源划分（TRP）方法。本文提出了一种广义交替码,将FDR码、交替码都看作它的特例;又扩展了两步压缩方法,将原测试集划分成多组,每组采用不同的比值进行交替编码,综合了交替码与两步编码各自的优势,弥补了FDR码,交替码对某些电路测试集压缩的缺陷,得到了较好的压缩率。实验结果表明,与同类型的编码压缩方法相比,该方案具有更高的测试数据压缩率和较好的综合测试性能。     

k-Sample Maximum Likelihood Ratio Test for Change of Weibull Shape Parameter

A k-sample maximum likelihood ratio (MLR) test is derived to test equality of shape parameters for 2-parameter Weibull populations. The test is independent of the scale parameters, and the power depends on ratios of the shape parameters. Critical points and power calculations were obtained by Monte Carlo techniques for k = 2. The MLR test is equivalent to the MLR test of scale parameters for the extreme value distribution.     

A-to-D converters static error detection from dynamic parameter measurement

A complete characterisation of ADC requires the estimation of two kinds of performances, static and dynamic parameters. Each set of items is extracted from a different test procedure, involving high test cost. As both groups of parameters reflect the converter behaviour, there should be a link between each other. This paper investigates whether the correlation between ADC static and dynamic parameters could enable to deduce the whole set of performances from a single dynamic test procedure, leading to shorter processing time and reduced hardware resources. The influence of static errors on the classical dynamic parameters is thus studied for different ADC resolutions. It is shown that under appropriate test conditions, the variations of dynamic parameters under static errors impact are significant enough to allow the detection of ADC offset, gain and non-linearity errors.     

一种精确测量AC-DC电源管理类芯片的方法

对于AC-DC电路测试,圆片测试(CP)一般采用开环测试的方法,测试项目较少,从而使CP的测试时间大大减少,提高了测试效率以及测试产能。CP测试的目的是测试基准电压以及输出波形等参数,并对相应参数进行工艺上的修调,使得这些参数达到中心值,保证芯片基本功能的准确;但CP测试并不是应用环境下的芯片状态,所以当AC-DC电路进行成品测试(FT)的时候,通过模拟芯片的应用环境来测试芯片在应用端的参数,从而确保芯片在工作环境中能正常应用,达到检测芯片的目的。主要介绍了AC-DC电路在闭环应用环境下各项参数的测试方法,确保电路功能的稳定性以及可靠性。     

Optimum simple step-stress accelerated life tests with censoring

The authors present the optimum simple time-step and failure-step stress accelerated life tests for the case where a prespecified censoring time is involved. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model are assumed. The authors obtain the optimum test plans to minimize the asymptotic variance of the maximum-likelihood estimator of the mean life at a design stress. Nomographs for the optimum time-step stress test are also given. Simple step stress test plans with censoring were studied. The optimum failure-step stress test plans are obtained in a closed form, whereas, for the time-step stress test, nomographs are given for finding the optimum plans on the basis of parameters. The parameters must be approximated from experience, similar data, or a preliminary test. For some selected values of the parameters, the effect of incorrect preestimates was studied in terms of the percentage of variance increase. The effect was found to be small     

Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

ADCs are fully characterized by both static and dynamic parameters. Testing methods usually combine a histogram-based approach with a spectral analysis to determine the complete set of ADCs parameters. In the view of a unique test procedure, this paper investigates the correlation between both kinds of parameters. Experimental results demonstrate that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset, gain and non-linearity errors, opening the way of a low-cost test strategy in the frequency domain.     

数据挖掘在IGBT模型参数提取中的应用研究

针对半导体器件的SPICE模型参数提取,提出了一种正向处理技术。对于选定的器件和模型,大量运行不同模型参数组合下的SPICE仿真,获得各种不同的电特性曲线,形成超大规模的数据集。若通过测试得到了确实的测试数据,则通过数据挖掘和人工智能中的数据处理算法得到数据集中、最匹配的曲线项,直接给出模型参数的估计值。针对IGBT模型,通过批量仿真获得约15 k个数据,使用kNN算法和多元回归法对测试曲线构成的测试集进行了参数提取。结果表明,该方法能快速获取器件的模型参数,具有稳健性的优点。该方法为研究者对器件模型特性提供了有益的认识。     

红外焦平面阵列测试虚拟仪器系统

红外焦平面阵列主要性能参数的测试和评价是研制、生产和应用阵列的基础.由于焦平面阵列的像元数太多,所以测试复杂且计算繁琐.基于虚拟仪器技术构建的红外焦平面阵列测试系统,能完成焦平面阵列的特性参数定量测试和成像实验.在大幅度降低测试成本的同时,系统还具有易于扩展、升级和修改的优势,从而为红外焦平面阵列的研制提供了有效的测试与实验技术手段.     

Circuit Modeling of Interdigitated Capacitors Fabricated by High‐K LTCC Sheets

The circuit modeling of interdigitated capacitors fabricated by high‐k low‐temperature co‐fired ceramic (LTCC) sheets was investigated. The s‐parameters of each test structure were measured from 50 MHz to 10 GHz, and the modeling was performed using these measured s‐parameters up to the first resonant frequency. Each test structure was divided into appropriate building blocks. The equivalent circuit of each building block was composed based on the partial element equivalent circuit (PEEC) method. Modeling was executed to optimize the parameters in the equivalent circuit of each building block. The validity of the extracted parameters was verified by the predictive modeling for the test structures with different geometry. After that, Monte Carlo analysis and sensitivity analysis were performed based on the extracted parameters. The modeling methodology can allow a device designer to improve the yield and to save time and cost for the design and manufacturing of devices.     

A New Nonstationarity Detector

A new test to determine the stationarity length of a locally wide sense stationary Gaussian random process is proposed. Based on the modeling of the process as a time-varying autoregressive process, the time-varying model parameters are tested using a Rao test. The use of a Rao test avoids the necessity of obtaining the maximum likelihood estimator of the model parameters under the alternative hypothesis, which is intractable. Computer simulation results are given to demonstrate its effectiveness and to verify the asymptotic theoretical performance of the test. Applications are to spectral analysis, noise estimation, and time series modeling.