Thermal Conductivity and Other Transport Properties of Mg<Subscript>2</Subscript>Sn:Ag Crystals

The temperature dependence of the thermal conductivity κ(T), electrical resistivity ρ(T), and Seebeck coefficient S(T) of Mg₂Sn:Ag crystals with 0 at.% to 1 at.% Ag content were measured at T = 2 K to 400 K. The crystals were cut from ingots that were prepared by the vertical Bridgman method. Undoped samples show a dramatic κ ∝ T ³ rise at low temperatures to a peak value κ _15K = 477 W m⁻¹ K⁻¹. This leads to exceptionally large phonon drag effects causing giant thermopower with S rising sharply to a peak value S _20K = 3000 μV K⁻¹. At higher temperatures S decreases and changes sign to intrinsic values S ≈ −60 μV K⁻¹. The addition of Ag changes the transport properties as follows: (a) κ decreases systematically, the peak shifts to 30 K and falls to 7 W m⁻¹ K⁻¹; (b) ρ changes from high to low values; (c) S(T) changes to a linear dependence with S _300K ≈ 150 μV K⁻¹ to 200 μV K⁻¹.     

Conductivity of layers of a chalcogenide glassy semiconductor Ge<Subscript>2</Subscript>Sb<Subscript>2</Subscript>Te<Subscript>5</Subscript> in high electric fields

Effect of high electric fields on the conductivity of 0.5-1-μm-thick layers of a chalcogenide glassy semiconductor with a composition Ge₂Sb₂Te₅, used in phase memory cells, has been studied. It was found that two dependences are observed in high fields: dependence of the current I on the voltage U, of the type I ∝ U ⁿ , with the exponent (n ≈ 2) related to space-charge-limited currents, and a dependence of the conductivity σ on the field strength F of the type σ = σ₀exp(F/F ₀) (where F ₀ = 6 × 10⁴ V cm⁻¹), caused by ionization of localized states. A mobility of 10⁻³–10⁻² cm² V⁻¹ s⁻¹ was determined from the space-charge-limited currents.     

Crystallization ability and optical and electrical properties of Ge<Subscript>10</Subscript>(Se-Te)<Subscript>90</Subscript> and Ge<Subscript>30</Subscript>(Se-Te)<Subscript>70</Subscript> chalcogenide glassy semiconductors

Chalcogenide glassy semiconductors of the ternary system Ge-Se-Te along the Ge₁₀(Se-Te)₉₀ and Ge₃₀(Se-Te)₇₀ joins have been synthesized. The crystallization ability, near-IR transmission spectra, and temperature dependence of the electrical conductivity of the alloys obtained have been studied. It is shown that chalcogenide glassy semiconductors along the Ge₁₀(Se-Te)₉₀ join have a lower softening and crystallization points compared with semiconductors belonging to the Ge₃₀(Se-Te)₇₀ join. A change in the electrical conductivity of samples by several orders of magnitude occurs upon a phase transition from the glassy to the crystalline state. Compositions of chalcogenide glassy semiconductors in the Ge-Se-Te system are found, which have α < 1 cm⁻¹ absorption coefficient at wavelengths of λ ≈ 1.5 μm and exhibit a thermally induced phase transition from the glassy to the crystalline state.     

Vapor Annealing as a Post-Processing Technique to Control Carrier Concentrations of Bi<Subscript>2</Subscript>Te<Subscript>3</Subscript> Thin Films

This article demonstrates that carrier concentrations in bismuth telluride films can be controlled through annealing in controlled vapor pressures of tellurium. For the bismuth telluride source with a small excess of tellurium, all the films reached a steady state carrier concentration of 4 × 10¹⁹ carriers/cm³ with Seebeck coefficients of −170 μV K⁻¹. For temperatures below 300°C and for film thicknesses of 0.4 μm or less, the rate-limiting step in reaching a steady state for the carrier concentration appeared to be the mass transport of tellurium through the gas phase. At higher temperatures, with the resulting higher pressures of tellurium or for thicker films, it was expected that mass transport through the solid would become rate limiting. The mobility also changed with annealing, but at a rate different from that of the carrier concentration, perhaps as a consequence of the non-equilibrium concentration of defects trapped in the films studied by the low temperature synthesis approach.     

Effect of copper doping on kinetic coefficients and their anisotropy in PbSb<Subscript>2</Subscript>Te<Subscript>4</Subscript>

In anisotropic PbSb₂Te₄ and PbSb₂Te₄:Cu single crystals, nine main independent components of the Hall, electrical-conductivity, thermopower, and Nernst-Ettingshausen effects and their anisotropy in the range 77–450 K have been studied. PbSb₂Te₄ single crystals exhibit a high hole concentration (p ≈ 3 × 10²⁰ cm⁻³). Copper exhibits a donor effect and significantly (approximately by a factor of 2) reduces the hole concentration in PbSb₂Te₄. The temperature dependences of the kinetic coefficients, except for the Hall effect, have a form typical of the one-band model. The significant anisotropy of the Hall coefficient R ₁₂₃/R ₃₂₁ ≈ 2 at low temperatures corresponds to the multi-ellipsoid model of the energy spectrum of holes in PbSb₂Te₄. An important feature of the data on transport phenomena is the high thermopower anisotropy (ΔS ≈ 60–75 μV/K) in the mixed conductivity region caused by the mixed scattering mechanism. Data on the anisotropy of the transverse Nernst-Ettingshausen effect confirm the mixed mechanism of hole scattering; in the cleavage plane, scattering at acoustic phonons dominates, while in the trigonal axis direction, impurity scattering appears significant. Doping with copper enhances the role of impurity scattering in the direction of the trigonal axis c ₃; as a result, two components of the Nernst-Ettingshausen tensor Q ₃₂₁ and Q ₁₃₂ in the PbSb₂Te₄:Cu single crystal are positive at low temperatures, whereas, in the undoped crystal, only the Q ₃₂₁ component is positive.     

Current-voltage characteristics of ZnGa<Subscript>2</Subscript>Se<Subscript>4</Subscript> compound polycrystals

Current-voltage characteristics of the In-ZnGa₂Se₄-In structure have been studied in the temperature range of 90–335 K. Based on the data calculated for the concentration of three trap types in ZnGa₂Se₄, the values N _t = 1.4 × 10¹³, 8.2 × 10¹², and 2.6 × 10¹² cm⁻³ are obtained. The contact region transparency D _k ^*= 10⁻⁵, surface recombination velocity S _k = 0.65 m/s, and carrier lifetime τ = 1.5 × 10⁻⁴ s were determined. It was found that the current transmission mechanism in electric fields weaker than 10³ V/cm is caused by monopolar carrier injection.     

Thermoelectric Properties of Ag-doped Mg<Subscript>2</Subscript>Ge Thin Films Prepared by Magnetron Sputtering

Silver doped p-type Mg₂Ge thin films were grown in situ at 773 K using magnetron co-sputtering from individual high-purity Mg and Ge targets. A sacrificial base layer of silver of various thicknesses from 4 nm to 20 nm was initially deposited onto the substrate to supply Ag atoms, which entered the growing Mg₂Ge films by thermal diffusion. The addition of silver during film growth led to increased grain size and surface microroughness. The carrier concentration increased from 1.9 × 10¹⁸ cm⁻³ for undoped films to 8.8 × 10¹⁸ cm⁻³ for the most heavily doped films, but it did not reach saturation. Measurements in the temperature range of T = 200–650 K showed a positive Seebeck coefficient for all the films, with maximum values at temperatures between 400 K and 500 K. The highest Seebeck coefficient of the undoped film was 400 μV K⁻¹, while it was 280 μV K⁻¹ for the most heavily doped film at ∼400 K. The electrical conductivity increased with silver doping by a factor of approximately 10. The temperature effects on power factors for the undoped and lightly doped films were very limited, while the effects for the heavily doped films were substantial. The power factor of the heavily doped films reached a non-optimum value of ∼10⁻⁵ W cm⁻¹ K⁻² at 700 K.     

Space-charge-limited currents in an Se<Subscript>95</Subscript>As<Subscript>5</Subscript> chalcogenide glass-like semiconductor system containing EuF<Subscript>3</Subscript> impurities

It is established that charge carrier (hole) transport in the Al-Se₉₅As₅〈EuF₃〉-Te structure is effected by unipolar injection currents limited by space charges with the involvement of two capture trap groups. Shallow traps corresponding to charged intrinsic defects C ₁⁻ are related to broken selenium bonds. Deep traps corresponding to charged intrinsic defects P ₂⁻ are formed by arsenic atoms with broken coordination. It is shown that the EuF₃ impurity strongly affects the concentration of the capture traps, especially those localized near the Fermi level.     

Microgenerator Using BiSbTe-Pt Thermopile and Pt-Al<Subscript>2</Subscript>O<Subscript>3</Subscript> Ceramic Combustor

The performance of a microcombustor thermoelectric generator device based on a thermopile using p-type Bi_0.3Sb_1.7Te₃ (BST) and n-type Pt films has been investigated. The BST films were prepared by two different methods—pulsed laser deposition (PLD) and sputter deposition—on Si₃N₄/SiO₂ multilayers on Si substrate. The ceramic catalyst combustor was patterned on the thermopile end on a thin membrane fabricated by back-side bulk etching of the silicon substrate. At 138°C the thermoelectric power factors of the PLD and sputter-deposited films were 3.6 × 10⁻³ W/mK² and 0.22 × 10⁻³ W/mK², respectively. The power from the generator with the sputter-deposited film was 0.343 μW, which was superior to that of the device with the PLD film, which provided 0.1 μW, for combustion of a 200 sccm flow of 3 v/v% hydrogen in air.     

Development of (Bi,Sb)<Subscript>2</Subscript>(Te,Se)<Subscript>3</Subscript>-Based Thermoelectric Modules by a Screen-Printing Process

In major applications, optimal power will be achieved when thermoelectric films are at least 100 μm thick. In this paper we demonstrate that screen-printing is an ideal method to deposit around 100 μm of (Bi,Sb)₂(Te,Se)₃-based films on a rigid or flexible substrate with high Seebeck coefficient value (90 μV K⁻¹ to 160 μV K⁻¹) using a low-temperature process. Conductive films have been obtained after laser annealing and led to acceptable thermoelectric performance with a power factor of 0.06 μW K⁻² cm⁻¹. While these initial material properties are not at the level of bulk materials, the complete manufacturing process is cost-effective, compatible with large surfaces, and affords a mass-production technique.     

Electrodeposition and Thermoelectric Characteristics of Bi<Subscript>2</Subscript>Te<Subscript>3</Subscript> and Sb<Subscript>2</Subscript>Te<Subscript>3</Subscript> Films for Thermopile Sensor Applications

A thermopile sensor was processed on a glass substrate by electrodeposition of n-type bismuth telluride (Bi-Te) and p-type antimony telluride (Sb-Te) films. The n-type Bi-Te film electrodeposited at −50 mV in a 50 mM electrolyte with a Bi/(Bi + Te) mole ratio of 0.5 exhibited a Seebeck coefficient of −51.6 μV/K and a power factor of 7.1 × 10⁻⁴ W/K² · m. The p-type Sb-Te film electroplated at 20 mV in a 70 mM solution with an Sb/(Sb + Te) mole ratio of 0.9 exhibited a Seebeck coefficient of 52.1 μV/K and a power factor of 1.7 × 10⁻⁴ W/K² · m. A thermopile sensor composed of 196 pairs of the p-type Sb-Te and the n-type Bi-Te thin-film legs exhibited sensitivity of 7.3 mV/K.     

Thermoelectric Performance of Zn and Nd Co-doped In<Subscript>2</Subscript>O<Subscript>3</Subscript> Ceramics

Polycrystalline In₂O₃ ceramics co-doped with Zn and Nd were prepared by the spark plasma sintering (SPS) process, and microstructure and thermoelectric (TE) transport properties of the ceramics were investigated. Our results indicate that co-doping with Zn²⁺ and Nd³⁺ shows a remarkable effect on the transport properties of In₂O₃-based ceramics. Large electrical conductivity (~130 S cm⁻¹) and thermopower (~220 μV K⁻¹) can be observed in these In₂O₃-based ceramic samples. The maximum power factor (PF) reaches 5.3 × 10⁻⁴ W m⁻¹ K⁻² at 973 K in the In_1.92Nd_0.04Zn_0.04O₃ sample, with a highest ZT of ~0.25.     

Improvement of Thermoelectric Power Factor of Hydrothermally Prepared Bi<Subscript>0.5</Subscript>Sb<Subscript>1.5</Subscript>Te<Subscript>3</Subscript> Compared with its Solvothermally Prepared Counterpart

We report on the successful hydrothermal synthesis of Bi_0.5Sb_1.5Te₃, using water as the solvent. The products of the hydrothermally prepared Bi_0.5 Sb_1.5Te₃ were hexagonal platelets with edges of 200–1500 nm and thicknesses of 30–50 nm. Both the Seebeck coefficient and electrical conductivity of the hydrothermally prepared Bi_0.5Sb_1.5Te₃ were larger than those of the solvothermally prepared counterpart. Hall measurements of Bi_0.5Sb_1.5Te₃ at room temperature indicated that the charge carrier was p-type, with a carrier concentration of 9.47 × 10¹⁸ cm⁻³ and 1.42 × 10¹⁹ cm⁻³ for the hydrothermally prepared Bi_0.5Sb_1.5Te₃ and solvothermally prepared sample, respectively. The thermoelectric power factor at 290 K was 10.4 μW/cm K² and 2.9 μW/cm K² for the hydrothermally prepared Bi_0.5Sb_1.5Te₃ and solvothermally prepared sample, respectively.     

Thermoelectric Properties of In<Subscript>0.3</Subscript>Ga<Subscript>0.7</Subscript>N Alloys

We report on the experimental investigation of the potential of InGaN alloys as thermoelectric (TE) materials. We have grown undoped and Si-doped In_0.3Ga_0.7N alloys by metalorganic chemical vapor deposition and measured the Seebeck coefficient and electrical conductivity of the grown films with the aim of maximizing the power factor (P). It was found that P decreases as electron concentration (n) increases. The maximum value for P was found to be 7.3 × 10⁻⁴ W/m K² at 750 K in an undoped sample with corresponding values of Seebeck coefficient and electrical conductivity of 280 μV/K and 93␣(Ω cm)⁻¹, respectively. Further enhancement in P is expected by improving the InGaN material quality and conductivity control by reducing background electron concentration.     

Enhancing Thermoelectric Properties of Polycrystalline Bi<Subscript>2</Subscript>S<Subscript>3</Subscript> by Optimizing a Ball-Milling Process

Bismuth sulfide (Bi₂S₃) polycrystalline samples were fabricated by mechanical alloying (MA) combined with spark plasma sintering (SPS). The microstructure and electrical transport properties were investigated with special emphasis on the influence of the ball-milling process. Bi₂S₃ compound powders could be readily synthesized directly from elemental powders under all the investigated conditions, and highly dense n-type bulk Bi₂S₃ samples with high density (>95%) were fabricated by the subsequent SPS process. Changing the MA conditions had no apparent influence on the microstructure or phase structure of the MA-derived Bi₂S₃ powders, but the electrical properties and thermopower of the SPS-sintered Bi₂S₃ bulk samples were greatly dependent on the MA speed and time. The power factor of Bi₂S₃ was increased to 233 μW K⁻² m⁻¹ at 573 K by optimizing the ball-milling process. This power factor is higher than values reported to date for Bi-S binary samples without texture.     

Effect of Rapid Thermal Annealing on Sputtered CaCu<Subscript>3</Subscript>Ti<Subscript>4</Subscript>O<Subscript>12</Subscript> Thin Films

Calcium copper titanium oxide (CaCu₃Ti₄O₁₂, abbreviated to CCTO) films were deposited on Pt/Ti/SiO₂/Si substrates at room temperature (RT) by radiofrequency magnetron sputtering. As-deposited CCTO films were treated by rapid thermal annealing (RTA) at various temperatures and in various atmospheres. X-ray diffraction patterns and scanning electron microscope (SEM) images demonstrated that the crystalline structures and surface morphologies of CCTO thin films were sensitive to the annealing temperature and ambient atmosphere. Polycrystalline CCTO films could be obtained when the annealing temperature was 700°C in air, and the grain size increased signifi- cantly with annealing in O₂. The 0.8-μm CCTO thin film that was deposited at RT for 2 h and then annealed at 700°C in O₂ exhibited a high dielectric constant (ε′) of 410, a dielectric loss (tan δ) of 0.17 (at 10 kHz), and a leakage current density (J) of 1.28 × 10⁻⁵ A/cm² (at 25 kV/cm).     

Super-Large Domain Metal-Induced Radially Crystallized Poly-Si Made Using Ni(NO<Subscript>3</Subscript>)<Subscript>2</Subscript>/NH<Subscript>4</Subscript>OH Mixed Solution

By using an aqueous solution of Ni(NO₃)₂/NH₄OH for formation of Ni media on a-Si, disk-like super-large domain metal-induced radially crystallized (S-MIRC) poly-Si was prepared. The process requires no buffer layer deposition on a-Si. The prepared S-MIRC poly-Si has an average domain size of up to 60 μm, highest hole Hall mobility of 27.1 cm² V⁻¹ s⁻¹, and highest electron Hall mobility of 45.6 cm² V⁻¹ s⁻¹. Poly-Si TFT made on super-large-domain S-MIRC poly-Si had high mobility of ~105.8 cm² V⁻¹ s⁻¹, steep sub-threshold slope of ~1.0 V decade⁻¹, high on/off state current ratio of >10⁷ and low threshold voltage of ~ −6.9 V. A simultaneous Ni-collected and induced crystallization model is proposed to explain the growth kinetics of S-MIRC poly-Si.     

Thermoelectric Properties of Zr<Subscript>3</Subscript>Mn<Subscript>4</Subscript>Si<Subscript>6</Subscript> and TiMnSi<Subscript>2</Subscript>

The Seebeck coefficient, electrical resistivity, and thermal conductivity of Zr₃Mn₄Si₆ and TiMnSi₂ were studied. The crystal lattices of these compounds contain relatively large open spaces, and, therefore, they have fairly low thermal conductivities (8.26 Wm⁻¹ K⁻¹ and 6.63 Wm⁻¹ K⁻¹, respectively) at room temperature. Their dimensionless figures of merit ZT were found to be 1.92 × 10⁻³ (at 1200 K) and 2.76 × 10⁻³ (at 900 K), respectively. The good electrical conductivities and low Seebeck coefficients might possibly be due to the fact that the distance between silicon atoms in these compounds is shorter than that in pure semiconductive silicon.     

Development of Molecular Beam Epitaxially Grown Hg<Subscript>1−<Emphasis Type="Italic">x</Emphasis></Subscript>Cd<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>Te for High-Density Vertically-Integrated Photodiode-Based Focal Plane Arrays

Hg_1−x Cd _x Te samples of x ~ 0.3 (in the midwave infrared, or MWIR, spectral band) were prepared by molecular beam epitaxy (MBE) for fabrication into 30-μm-pitch, 256 × 256, front-side-illuminated, high-density vertically-integrated photodiode (HDVIP) focal plane arrays (FPAs). These MBE Hg_1−x Cd _x Te samples were grown on CdZnTe(211) substrates prepared in this laboratory; they were ~10-μm thick and were doped with indium to ~5 × 10¹⁴ cm⁻³. Standard HDVIP process flow was employed for array fabrication. Excellent array performance data were obtained from these MWIR arrays with MBE HgCdTe material. The noise-equivalent differential flux (NEΔΦ) operability of the best array is 99.76%, comparable to the best array obtained from liquid-phase epitaxy (LPE) material prepared in this laboratory.     

Preparation of Well-Tiled <Emphasis Type="Italic">γ</Emphasis>-Na<Subscript><Emphasis Type="Italic">x</Emphasis></Subscript>Co<Subscript>2</Subscript>O<Subscript>4</Subscript> by a Novel and Simple Sodium Alginate Gel Method and Its Electrical Properties

In this paper, a novel and simple sodium alginate (SA) gel method was developed to prepare γ-Na _x Co₂O₄. This method involved the chemical gelling of SA in the presence of Co²⁺ ions by cross-linking. After calcining at 700°C to 800°C, single-phase γ-Na _x Co₂O₄ crystals were obtained. The arrangement of about 1 μm to 4 μm flaky particles exhibited a well-tiled structure along the plane direction of the flaky particles. SA not only acted as the control agent for crystal growth, but also provided a Na source for the γ-Na _x Co₂O₄ crystals. The electrical properties of γ-Na _x Co₂O₄ ceramics prepared via ordinary sintering after cold isostatic pressing were investigated. The Seebeck coefficient and power factor of the bulk material were 177 μV K⁻¹ and 4.3 × 10⁻⁴ W m⁻¹ K⁻² at 850 K, respectively.