Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor

We present a test-per-clock BIST scheme using memory for storing test patterns that reduces the number of clock cycle necessary for testing. Thus, the test application time is shorter and energy consumption is lower than those in other solutions. The test hardware consists of a space compactor and a MISR, which provides zero error aliasing for modeled faults. The test pattern generator (TPG) scheme is based on a T-type flip-flop feedback shift register. The generator can be seeded similarly to a D-type flip-flop shift register. It generates test patterns in a test-per-clock mode. The TPG pattern sequence is modified at regular intervals by adding a modulo-2 bit from a modification sequence, which is stored in a memory. The memory can be either a ROM on the chip or a memory in the tester. The test patterns have both random and deterministic properties, which are advantageous for the final quality of the resulting test sequence. The number of bits stored in the memory, number of clock cycles, hardware overhead and the parameters of the resulting zero aliasing space compactor and MISR are given for the ISCAS benchmark circuits. The experiments demonstrate that the BIST scheme provides shorter test sequences than other methods while the hardware overhead and memory requirements are kept low.     

Optimizing error masking in BIST by output data modification

The error masking in conventional built-in self-test schemes is known to be around 2^–m when the output data is compacted in an m-bit multi-input linear feedback shift register. In the recent years, several schemes have been proposed which claim to reduce the error masking in a significant way while maintaining the need for a small overhead. In this paper, a completely new scheme for reducing error masking is proposed. Unlike the previous schemes in the literature, the new scheme is circuit-dependent and uses the concept of output data modification. This concept suggests modifying the original test output sequence before compaction, in order to obtain a new sequence with a reduced error masking probability. It is shown that the output data modification scheme provides a simple trade-off between the desired error masking which could run into (2^1thousands) and the area overhead needed (which would usually be equal to a 16 or 32 bit multi-input linear feedback shift register) for this masking. Finally, a formal proof is presented which establishes that despite circuit-dependency, the proposed scheme will on the average always lead to the desired error masking.     

An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

This paper presents a novel seed-based test pattern generator (SB-TPG). The core of SB-TPG is a seed sequence generator. A coverage-driven seed generation algorithm has been proposed to generate the optimized seeds. The test sequence generated by SB-TPG is a single input change (SIC) sequence that can significantly reduce test power for test-per-clock built-in self-test (BIST). Further, seed-masking technique has been put forward to filter those power-consuming seeds, thus reducing test power for test-per-scan BIST. Experimental results show that SB-TPG can achieve high fault coverage with short test length, low power and small hardware overhead.     

Comments on “optimizing error masking in BIST by output data modification”

In a recent paper [1] a scheme for reducing error masking probability by modifying the output data before compaction has been proposed. The aim of the present comment is to direct one's attention to another method of modifier construction. The method employs a linear combinational circuit (LCC) as modifier. Such an approach may require little extra hardware. Furthermore, there is an efficient algorithm for finding a modifier.     

On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST

In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our technique eliminates the need of a ROM for storing the seeds since the reseeding is performed on-the-fly by inverting the logic value of some of the bits of the next state of the Test Pattern Generator (TPG). The proposed reseeding technique is generic and can be applied to TPGs based on both Linear Feedback Shift Registers (LFSRs) and accumulators. An efficient algorithm for selecting reseeding points is also presented, which targets complete fault coverage and allows to well exploiting the trade-off between hardware overhead and test length. Using experimental results we show that the proposed method compares favorably to the other already known techniques with respect to test length and the hardware implementation cost.     

A Gated Clock Scheme for Low Power Testing of Logic Cores

Test power is now a big concern in large core-based systems. In this paper, we present a general approach for minimizing power consumption during test of integrated circuits or embedded cores. The proposed low power/energy technique is based on a gated clock scheme that can be used in a test-per-scan or a test-per-clock environment. The idea is to reduce the clock rate on the scan path (test-per-scan) or the test pattern generator (test-per-clock) without increasing the test time. Numerous advantages can be found in applying such a technique.     

Efficient board interconnect testing using the split boundary scan register

This article presents a new approach to testing board interconnects, on a board containing chips equipped with the Boundary Scan Architecture. The proposed technique reduces the test time, test vector size, and requires an order independent test set at the expense of minimal hardware overhead to the ANSI/IEEE Std. 1149.1-1990 standard. Although most of the algorithms developed so far can be used to test boards under this scheme, we have concentrated on the Walking 1's and 0's for the purpose of presenting this technique. This test can be applied with a reduced time complexity for test generation and application. Furthermore, with local response compaction this scheme can easily be used for BIST implementation, resulting in the application of Walking 1/0 in linear time. All of the above results assume boards that contain 3-state nets, which is an improvement over previously reported results.     

一种混合信号SoC中模数转换器的内建自测试方案

提出了一种针对混合信号SoC中ADC的动态参数与静态参数测试的内建自测试方案.由于动态参数和静态参数在同一个测试电路中都能够得到测试,因此能够更加全面准确地反映待测器件的性能.通过对存储器和计算资源的合理配置和复用,将两种测试的激励产生和响应分析集成在一起,最大程度地减少了对电路面积的影响.整个设计在FPGA上实现,实验结果证明了其可行性.     

An Accumulator-Based Compaction Scheme For Online BIST of RAMs

Transparent built-in self test (BIST) schemes for RAM modules assure the preservation of the memory contents during periodic testing. Symmetric transparent BIST skips the signature prediction phase required in traditional transparent BIST schemes, achieving considerable reduction in test time. In symmetric transparent BIST schemes proposed to date, output data compaction is performed using either single-input or multiple-input shift registers whose characteristic polynomials are modified during testing. In this paper the utilization of accumulator modules for output data compaction in symmetric transparent BIST for RAMs is proposed. It is shown that in this way the hardware overhead, the complexity of the controller, and the aliasing probability are considerably reduced.      

A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic

Input vector monitoring concurrent on-line BIST based on multilevel decoding logic is an attractive approach to reduce hardware overhead. In this paper, a novel optimization scheme is proposed for further reducing the hardware overhead of the decoding structure, which refers to improved decoding, input reduction, and simulated annealing inputs swapping approaches. Furthermore, utilizing similar multilevel decoding logic as the responses verifier, a novel cost-efficient input vector monitoring concurrent on-line BIST scheme is presented. The proposed scheme is applicable to the concurrent on-line testing for the CUT, the detail of which can not be obtained, such as hard IP cores. Experimental results indicate that the proposed optimization approaches can significantly reduce the hardware overhead of the decoding structure, and the proposed scheme costs lower hardware than other existing schemes.     

基于时序优先的电路容错混合加固方案

为了有效降低容忍软错误设计的硬件和时序开销,该文提出一种时序优先的电路容错混合加固方案。该方案使用两阶段加固策略,综合运用触发器替换和复制门法。第1阶段,基于时序优先的原则,在电路时序松弛的路径上使用高可靠性时空冗余触发器来加固电路;第2阶段,在时序紧张的路径使用复制门法进行加固。和传统方案相比,该方案既有效屏蔽单粒子瞬态(SET)和单粒子翻转(SEU),又减少了面积开销。ISCAS89电路在45 nm工艺下的实验表明,平均面积开销为36.84%,电路平均软错误率降低99%以上。     

Analysis of Hamming count compaction scheme

Advances in VLSI technology require changes in circuit test application methods or apparatus. The use of on-chip testing, called Built-in Testing or Built-in Self-Testing (BIST), has become popular. BIST techniques compact the output response of the circuit under test (CUT). Here we discuss a time compaction method called Hamming count (H-count). H-count encompasses all syndrome detectable faults. Simulation results and theoretical analysis illustrate the overall fault-detection potential of Hamming count. The proposed method presents simple and effective compaction technique.Since BIST methods use productive chip area, a prime concern is providing the test results using the minimal amount of space. Hardware overhead reduction through counter elimination is considered for the Hamming Count compaction test. Intelligent counter selection is necessary to minimize the impact this hardware reduction has on fault detection. A method for selecting the most advantageous syndrome and input variable counter combination to utilize as a reduced H-count test is introduced. Analysis shows that the proposed method produces an optimal pairing. The paired counters have an aliasing probability which is half an order less than that of an unmodified syndrome test with exhaustive inputs. Adaptations in the counter selection method are made using a greedy strategy for choosing multiple counters to combine with the syndrome counter.This work was funded in part by Sandia National Laboratory under contract SANDIA-27-6108.     

动态向量调整的多扫描链测试数据压缩

 由于多扫描链测试方案能够提高测试进度,更适合大规模集成电路的测试,因此提出了一种应用于多扫描链的测试数据压缩方案.该方案引入循环移位处理模式,动态调整向量,能够保留向量中无关位,增加向量的外延,从而提高向量间的相容性和反向相容性;同时,该方案还能够采用一种有效的参考向量更替技术,进一步提高向量间的相关性,减少编码位数.另外,该方案能够利用已有的移位寄存器,减少不必要的硬件开销.实验结果表明所提方案在保持多扫描链测试优势的前提下能够进一步提高测试数据压缩率,满足确定性测试和混合内建自测试.     

Self-Test Techniques for Crypto-Devices

This paper describes a generic built-in self-test strategy for devices implementing symmetric encryption algorithms. Taking advantage of the inner iterative structures of crypto-cores, test facilities are easily set-up for circular self-test of the crypto-cores, built-in pseudorandom test generation and response analysis for other cores in the host device. Main advantages of the proposed test implementation are an architecture with no visible scan chain, 100% fault coverage on crypto-cores with negligible area overhead, availability of pseudorandom test sources, and very low aliasing response compaction for other cores.      

FPGA上抗侧信道攻击的密码算法实现

密码算法在运行时可能会受到侧信道攻击,抗侧信道攻击的FPGA密码算法实现是目前研究的一个热点。通过随机数保护关键数据的S盒移位掩码法被认为是一种有效的防御手段。采用该方式实现的密码算法在提高运行安全性的同时,可能会带来硬件资源开销的增加及加解密速度的降低。通过对SM4算法的实现表明,采用合适的实现方式时S盒移位掩码法抗侧信道攻击实现对算法硬件资源开销及加解密速度影响不是太大,具有一定的实用价值。     

Exploiting distribution of unknown values in test responses to optimize test output compactors

Test output compactors can effectively reduce the data volume of test responses without scarifying fault coverage. However, when there are unknown values (X-bits) in the test output, the fault coverage can be severely comprised. Many compaction schemes that can handle X-bits have been developed. However, existing test response compaction schemes are designed without considering the locations of errors and X-bits. This design methodology essentially assumes that observable errors as well as X-bits are randomly distributed among all scan cells. Recent studies show that X-bits may not be randomly distributed; some scan cells could capture much more X-bits than others. In this paper, we propose to exploit the nonuniform distribution of X-bits to optimize test response compactors such that a higher compression rate is achieved with lower hardware overhead. The proposed design method is applicable to various test output compaction schemes that can handle X-bits in the test responses, including X-blocking, X-masking, and X-tolerant circuits. Experimental results show that, in the presence of X-bits, the compression results will be significantly improved with the help of the proposed method.     

Layout Driven Selection and Chaining of Partial Scan Flip-Flops

In an era of sub-micron technology, routing is becoming a dominant factor in area, timing, and power consumption. In this paper, we study the problem of selection and chaining of scan flip-flops with the objective of achieving minimum routing area overhead. Most of previous work on partial scan has put emphasis on selecting as few scan flip-flops as possible to break all cycles in S-graph. However, the flip-flops that break more cycles are often the ones that have more fanins and fanouts. The area adjacent to these nodes is often crowded in layout. Such selections will cause layout congestion and increase the number of tracks to chain the scan flip-flops. To take layout information into consideration, we propose a matching-based algorithm to solve the problem. First, an initial placement will be performed before scan flip-flops are selected. Then, iteratively, a matching-based algorithm taking the current layout into account is proposed to select and chain the scan flip-flops. Experimental results show that, on the average, our algorithm can reduce 8.1% area overhead as compared with the previously proposed methods that do not utilize the layout information in flip-flop selection.     

A Fault Detection Scheme for the FPGA Implementation of SHA-1 and SHA-512 Round Computations

The Secure Hash Algorithm is the most popular hash function currently used in many security protocols such as SSL and IPSec. Like other cryptographic algorithms, the hardware implementation of hash functions is of great importance for high speed applications. Because of the iterative structure of hash functions, a single error in their hardware implementation could result in a large number of errors in the final hash value. In this paper, we propose a novel time-redundancy-based fault diagnostic scheme for the implementation of SHA-1 and SHA-512 round computations. This scheme can detect permanent as well as transient faults as opposed to the traditional time redundancy technique which is only capable of detecting transient errors. The proposed design does not impose significant timing overhead to the original implementation of SHA-1 and SHA-512 round computation. We have implemented the proposed design for SHA-1 and SHA-512 on Xilinx xc2p7 FPGA. It is shown that for the proposed fault detection SHA-1 and SHA-512 round computations, there are, respectively, 3% and 10% reduction in the throughput with 58% and 30% area overhead as compared to the original schemes. The fault simulation of the implementation shows that almost 100% fault coverage can be achieved using the proposed scheme for transient and permanent faults.     

A Twin Symbol Encoding Technique Based on Run‐Length for Efficient Test Data Compression

Recent test data compression techniques raise concerns regarding power dissipation and compression efficiency. This letter proposes a new test data compression scheme, twin symbol encoding, that supports block division skills that can reduce hardware overhead. Our experimental results show that the proposed technique achieves both a high compression ratio and low‐power dissipation. Therefore, the proposed scheme is an attractive solution for efficient test data compression.