共查询到20条相似文献,搜索用时 62 毫秒
1.
对于复杂的MCM多层互连基板,电测试是控制成本、确保质量的关键环节。本文简要介绍了探针电阻、电容、电子束、潜在路缺陷电测试主其测试技术的应用。 相似文献
2.
南通富士通微电子股份有限公司 《中国集成电路》2007,16(7):42-43
1、简介南通富士通的MCM封装测试技术是利用陶瓷基板或硅基板作为芯片间的互连,将二片以上的超大规模集成电路芯片安装在多层互连基板上,再用金丝与金属框架相连通,而后由树脂包封外壳的多芯片半导 相似文献
3.
MCM—C多层基板技术及其发展应用 总被引:1,自引:0,他引:1
本文系统阐述了MCM-C(陶瓷厚膜型多芯片组件)的三类多层基板的基本结构与工艺技术,并对MCM-C的发展趋势及应用进行了介绍。 相似文献
4.
5.
6.
7.
8.
9.
与组装技术发展保持同步的MCM测试技术 总被引:1,自引:0,他引:1
随着电子技术的发展,人们对多芯片模块(multichip modules简称MCM)的需求正在不断地快速增长,这是因为该封装形式能够提供微型化、轻量化的子系统,从而节省系统级的成本。MCM是通过将若干个集成电路芯片装入一个封装内所获得的,该封装的尺寸大小与一个单芯片封装相同。如果采用了MCM器件的话,系统板能够做得非常小。由于MCM解决方法中焊点少于单芯片的解决方法,所以可靠性也随之增加了。 相似文献
10.
11.
12.
Tin (Sn) doping in gallium nitride (GaN) has been mainly reported from the theoretical view only. Based upon the availability of Sn precursor and commercialization, Sn-GaN film has not been deposited magnetron sputtering until this work. By using the cheap and safe reactive sputtering technique, here we present Sn-GaN thin films with single cermet targets at the Sn/(Sn+Ga) molar ratios of x=0, 0.03, 0.07, and 0.1 to form Sn-x-GaN films under the atmosphere of the mixture of Ar and N2. The Sn-GaN films had the wurtzite structure. Sn can be added to GaN to form SnGaN alloy with a maximal amount of ~10%. The structural, electrical, and optical properties had changed with the Sn content until the oversaturation of Sn in Sn-0.1-GaN. The Sn doping led to the lattice expansion, worsened crystallinity, n-type GaN, increased electrical concentration, decreased the electrical mobility etc. Moreover, n-Sn-x-GaN/p-Si diodes were successfully made and their performance was evaluated in terms of the barrier height, ideality factor, and series resistance. This work has opened the door for studying the different kinds of dopants on the important III nitrides. 相似文献
13.
本文介绍利用已建成的双束低能离子束薄膜淀积系统,制备Si、Ge、GaN低温外延膜,Si/CoSi_2/Si多层结构膜,以及金刚石多晶膜。 相似文献
14.
We have grown In0.5Ga0.5N films on SiO2/Si (100) substrate at 100–400 °C for 90 min by rf reactive sputtering with single cermet target. The target was made by hot pressing the mixture of metallic indium, gallium and ceramic gallium nitride powder. X-ray diffraction (XRD) measurements indicated that In0.5Ga0.5N films had wurtzite structure and showed the preferential (1 0 -1 0) diffraction. Both SEM and AFM showed that In0.5Ga0.5N films were smooth and had small roughness of 0.6 nm. Optical properties were measured by photoluminescence (PL) spectra from room temperature to low temperature of 20 K. The 2.28 eV green emission was achieved at room temperature for all our InGaN films. The electrical properties of In0.5Ga0.5N films on a SiO2/Si (100) substrate were measured by the Hall measurement at room temperature. InGaN films showed the electron concentration of 1.51×1020–1.90×1020 cm−3 and mobility of 5.94–10.5 cm2 V−1 s−1. Alloying of InN and GaN was confirmed for the sputtered InGaN. 相似文献
15.
16.
17.
NIELin-ru MENGQing-lan LINan 《半导体光子学与技术》2004,10(2):93-96
For Hall measurement under different magnetic fields at LN2 temperature, Hg1-xCdxTe (MCT) film (radius 1 cm) grown on CdTe substrate by LPE is photoengraved into many small Van Der Pauw squares, then their Hall coefficients and mobilities are measured and analyzed, respectively. Two films were Hall-tested during the temperature range from LHe 4. 2K to about 200K. An actual impression on the uniformity of electrical parameters for MCT film can obtained by means of the methods presented in this paper. 相似文献
18.
利用飞秒脉冲激光和泵浦-探测技术测量了贵金属-介质复合薄膜(Cu-Ba-O、Au-Ba-O)的瞬态光学透过率随延迟时间的变化曲线,观察到了薄地光的吸收迅速增大并在皮秒时间内的状的现象,该现象是薄膜中超微粒子内费米能级附近电子被飞秒激光脉冲激光,产生非平衡态电子而经历瞬态弛豫造成的,本文从理论上给出了复合薄膜中Au超微粒子的电子声子相互作用常数g的数值。 相似文献
19.
E. E. Glickman V. Bogush A. Inberg Y. Shacham-Diamand N. Croitoru 《Microelectronic Engineering》2003,70(2-4):495-500
It is shown that optimization of the electroless deposition and the use of vacuum annealing yield dramatic decrease in the resistivity and its scatter in 100- and 50-nm silver–tungsten (Ag–W) films. Physical processes, which control the resistivity drop during low-temperature annealing and the residue resistivity in the annealed films are discussed. 相似文献