基于DLL倍频技术的1GHz本地振荡器设计

介绍了一种基于0.5μm CMOS DLL合成1GHz信号的新方法．这种方法的特点是只通过使用简单的逻辑和放大来产生倍频信号．该设计的频率合成器包括两个部分：一个DLL(Delay-Locked Loop)和一个频率合成逻辑模块．输入的参考频率是25MHz，合成的输出频率为1GHz．     

对基于DLL和PLL的射频CMOS振荡器的相位抖动比较

通过对 PL L 和 DL L 相位抖动的比较 ,结合 DL L 倍频器的结构特点 ,得出了一个有用的公式 ,这个公式可以用于在 PL L 和 DL L 两种结构中选择出一个最佳方案 ,使得在使用 CMOS工艺实现频率合成器时能够得到最佳的功耗和相位抖动的折衷 .对于倍频系数很大的倍频器宜采用基于 PL L 的结构 ,这样可以消耗较少的功率 ;而对于较小的倍频系数的倍频器要采用基于 DL L 的结构 ,这样相位抖动特性将非常优良     

X波段GaAs单片压控振荡器

本文报告了X波段GaAs单片压控振荡器的设计和制作,电路设计采用小信号CAD分析程序,能准确地预计振荡频率,同时利用特殊工艺途径提高了变容管Q值.单片电路调谐范围是9.3～11.6GHz,输出功率大于10dBm.     

高性能超低功耗的4.224GHz正交LC VCO

采用Jazz0.18μm RF CMOS工艺设计并实现应用于MB-OFDM超宽带频率综合器的4.224GHz电感电容正交压控振荡器。通过解析的方法给出了电感电容正交压控振荡器的模型,并推导出简洁的公式解释了相位噪声性能与耦合因子的关系。测试结果显示,核心电路在1.5V电源电压下,消耗6mA电流,频率调谐范围为3.566~4.712GHz;在主频频偏1MHz处的相位噪声为-119.99dBc/Hz,对应的相位噪声的FoM(Figure-of-Merit)为183dB;I、Q两路信号等效的相位误差为2.13°。     

闭环压控振荡器的设计

压控振荡器在许多电子设备中得到应用。平显火控系统中的f_d信号发生器实际上可以认为是一个压控振荡器。其输入信号是—控制电压即频偏调制电压,输出是频率与输入电压成线性关系的正弦波。开环压控振荡器对于输出频率与输入电压之间的线性关系难以保证。现在采用的ICL8038是一集成压控振荡器,其线性度在10倍程的频率范围内较好,而在更大范围内则有所下降。另外,该器件输出频率的温度稳定性不够高,特别是国产5G8038尽管价格较进口的ICL8038便宜近十倍,但温度稳定性更差。本文介绍一种闭环压控振荡器电路,以稳定输出频率与输入电压间的线性度。     

适用于2．4GHz锁相环LC压控振荡器设计

本文设计了一种适用于2．4GHz锁相环的LC压控振荡器,采stoic0．13ffCMOS工艺,中心频率2．4GHz,频率调谐范围136MHz,在1．8v电压下工作时,静态电流为5mA,在偏离中心频率1MHz处,测得相位噪声为-111dBc／Hz。     

基于0.18μm SiGe BiCMOS工艺的60GHz VCO分析与设计

采用0.18 μm SiGe BiCMOS工艺,设计了一个60GHz的交叉耦合差分压控振荡器(VCO).通过分析传输线的性能,用λ/ 4短路传输线构造谐振回路.在分析VCO相位噪声的基础上,采用噪声滤波技术提高VCO的相位噪声性能.该VCO的工作电压为2.2V,偏置电流为11mA,频率调谐范围为58.377GHz～60.365GHz.当振荡频率为60.365GHz时,1MHz和10MHz频偏处的相位噪声分别为-79.1dBc/ Hz和-99.77dBc/ Hz.     

4GHz级频率综合器下单片低相位噪声CMOS电感电容压控振荡器的设计

基于0.18μm RF CMOS工艺,采用双端调谐结构实现了一种可应用于WLAN的二次变频收发机的压控振荡器.其输出频率范围可以覆盖收发机所需4.1～4.3GHz的频段,其最大调谐范围为500MHz.在距中心频率4.189GHz为4MHz处的相位噪声为-117dBc/Hz,500kHz处为-107dBc/Hz.输出信号抖动的均方根值为4.423ps,输出功率为-8.68dBm.     

基于0.2μm GaAs PHEMT工艺的压控振荡器IC设计

给出了一个采用0 2μmGaAsPHEMT工艺设计的全集成差分负阻式LC压控振荡器电路,芯片面积为0 52×0 7mm2。采用3 3V正电源供电,测得输出功率约-11 22dBm,频率调节范围6 058GHz～9 347GHz;在自由振荡频率7 2GHz处,测得的单边带相位噪声约为-82dBc/Hz@100kHz.     

基于0.18 μm CMOS工艺的6 GHz环形压控振荡器设计

基于0.18 μmCMOS工艺设计的全差分环形压控振荡器电路,芯片总面积为0.65×0.79 mm2,1.8V电源供电,总功耗155 mW,中心频率6 GHz,调谐范围1 GHz.可应用于IEEE802.11a WLAN系统.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.