基于SHT10传感器的仓库温湿度监测系统

本文设计了一个采用SHT10传感器的仓库温湿度监测系统,通过SHT10检测仓库的温度和湿度,如果检测到的温度、湿度值超过设定值时,由单片机AT89S55输出控制信号启动相应的加温和除湿装置,同时由报警电路实现超温、超湿报警。本文给出了系统实现方案框图及数据采集电路;介绍了系统软件实现思路。该系统最终实现了对仓库温湿度参数的准确测量和智能控制,解决了传统温湿度采集系统存在的电路复杂和精度不高等问题。     

仓库温度与湿度自动控制系统设计

针对目前仓储行业环境控制现状,设计了一种仓库温度、湿度控制系统,给出了系统的硬件电路、软件设计思想以及抗干扰措施,该系统以单片机AT89S51为控制中心,采用集成温度传感器AD590为温度检测元件,集成湿度传感器IH3605为湿度检测元件,由温湿度测量电路、温湿度控制电路、键盘、显示电路、通信接口等部分组成,实现对仓库环境温度、湿度的测量与控制.用户可通过键盘在线设置需要的温、湿度以及报警的上下限值,同时可实现数据远传.经实验对比测试,室内温度控制精度在±0.5℃以内,相对湿度控制精度±3%以内.     

储藏冷库温湿度监测终端设计

储藏冷库是现代化农业的重要组成部分,而温度和湿度是每个仓库必然要考虑的重要参数.本文设计一个用单片机控制的多点温湿度采集控制器,以AT89S52为核心芯片,采用数字式传感器SHT75进行温湿度的测量,扩展必要的外部电路,实现多点的温、湿度实时监测、显示、参数设置和网络传输功能.文章介绍了各部分的硬件电路,同时还介绍了软件流程.实验表明该方案设计科学,具有较高的安全性与可靠性.     

基于ZigBee的环境温湿度实时监控系统研制

为解决实验室环境、实验室内恒温恒湿试验箱、原材料或成品仓库等环境温湿度的监控需要,本论文以ZigBee和嵌入式系统技术为核心,设计一套适用于上述场合使用的实时温湿度监控系统,可以实时对监测环境中的温度、湿度参数进行采集、分析、报警、贮存,并根据数据的分析结果控制相应的设备,最终实现对这些参数进行自动调节。     

电池供电的多通道温湿度测量终端设计

为适应大空间范围内温湿度实时采集与控制需求,基于嵌入式技术和无线传感网络技术设计了多通道温湿度测量系统.采用低功耗控制技术,在低功耗处理器MSP430F2618、CC2530和外围硬件电路构成的硬件平台上,利用操作系统抽象层（OSAL）多任务资源分配机制,开发了具有友好人机交互界面和多种工作模式的应用软件.系统提供9路铂电阻传感器和3路温湿度传感器,经实际测试,温度测量精度优于±0.1℃,湿度测量精度优于±1.5％,在1分钟测量1次的情况下可持续工作72小时.     

基于单片机的仓库数据采集系统设计

现代商品生产销售过程中的不确定性,对产品的长时间有效保存提出了挑战。为解决商品储藏的问题,基于仓库环境决定储藏时间的认识,设计了一种仓库数据采集系统;采用AT89C52单片机为控制核心,根据采样参数动态调节温湿度;多片DS18B20通过1-Wire总线联结采集温度数据,HS1100/1101采集湿度数据,实时向上层系统报告数据;并可以进行温湿度的LED显示及越界报警。整个系统的数据采集的实时性好,数据更新率可以达到100 Hz;故障恢复速度快,整个系统的重启只需10 s。     

基于80C52的仓库温湿度监测系统

针对仓库温度与湿度的日常监测工作,该设计以STC80C52为核心,将温湿度传感器采集到的数据进行实时存储,并发送给上位机,上位机能够显示单片机的工作状态并能对数据进行分析。当温湿度达到一定值时,报警系统给予提示。     

低功耗智能温湿度传感器的设计

介绍了一种用于温度,湿度测量的低功耗智能传感器。详细论述了传感器的工作机理,结构和功能特点。利用这种传感器,可以组成温湿度自动测试系统,很方便地检测空气的温湿度。     

基于单片机农业温室温湿度监控系统的设计

为了提高农业温室的生产效率和自动化程度,设计了一种基于农业温室的温湿度监控系统。该系统以AT89S52单片机为控制核心,采用性价比较高的温湿度传感器,实现了对农业温室温湿度的测量与控制。通过调整温度和湿度的限值,可以对针对不同的农作物。当参数越限时,系统会启动声光报警,并通过继电器控制执行机构对系统进行调整。     

基于STM32和FreeRTOS的嵌入式太阳能干燥实时监测和控制系统设计

以ARMCortex—M3处理器sTM32F103vBT6为核心,应用AM2301温湿度传感模块实现对太阳能干燥室内温湿度参数的实时监测,采用数字PID控制技术控制鼓风机的转速,保持干燥室内的温度稳定,并通过继电器控制排气扇的启停使干燥室内湿度保持在设定上限之下。干燥室通过RS485总线和上位机通信,上位机设定干燥室内的目标温度和湿度上限,并实时显示干燥室内温度、湿度、鼓风机转速、排气扇开关状态等参数。嵌入式系统软件采用FreeRTOS实时操作系统,保证了系统的实时性和可靠性,实现对太阳能干燥室内温湿度的实时监测与控制。经现场应用验证了系统运行稳定,控制精度高,响应速度快。     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.