AMOLED displays with transfer‐printed integrated circuits

Abstract— Small integrated circuits of crystalline silicon (chiplets) transfer‐printed onto a flat‐panel‐display substrate provide greatly improved electrical performance and uniformity in active‐matrix organic light‐emitting‐diode (OLED) displays. The integrated circuits are formed in high‐performance crystalline silicon using conventional photolithographic processes and then transfer‐printed onto a substrate using a stamp that transfers hundreds or thousands of chiplets at once. The chiplets are connected to an external controller and to pixel elements using conventional photolithographic substrate processing methods. Active‐matrix OLED (AMOLED) displays using transfer‐printed chiplets have good yields, excellent uniformity, and electrical performance and are thermally robust.     

Fast voltage‐driving scheme for AMOLED displays based on internal feedback

Abstract— A new driving scheme for active‐matrix organic light‐emitting diodes (AMOLED) displays based on voltage programming is proposed. While conventional voltage drivers have a trade‐off between speed and accuracy, the new scheme is inherently fast and accurate. Based on the new driving scheme, a fast pixel circuit is designed using amorphous‐silicon (a‐Si) thin‐film transistors (TFTs). As the simulation results indicate, this pixel circuit can compensate the threshold‐voltage shift (VT shift) of the driver transistors. This pixel can be programmed in just 10 μsec, and it can compensate the threshold‐voltage shifts over 5 V with an error rate of less than 5% for a 1 ‐μA pixel current.     

High‐speed pixel circuits for large‐sized 3‐D AMOLED displays

Abstract— Large‐sized active‐matrix organic light‐emitting diode (AMOLED) displays require high‐frame‐rate driving technology to achieve high‐quality 3‐D images. However, higher‐frame‐rate driving decreases the time available for compensating Vth in the pixel circuit. Therefore, a new method needs to be developed to compensate the pixel circuit in a shorter time interval. In this work, image quality of a 14‐in. quarter full‐high‐definition (qFHD) AMOLED driven at a frame rate of over 240 Hz was investigated. It was found that image degradation is related to the time available for compensation of the driving TFT threshold voltage. To solve this problem, novel AMOLED pixel circuits for high‐speed operation are proposed to compensate threshold‐voltage variation at frame rates above 240 Hz. When Vth is varied over ±1.0 V, conventional pixel circuits showed current deviations of 22.8 and 39.8% at 240 and 480 Hz, respectively, while the new pixel circuits showed deviations of only 2.6 and 5.4%.     

Vt Compensated voltage‐data a‐Si TFT AMOLED pixel circuits

Abstract— Active‐matrix organic light‐emitting‐diode (AMOLED) displays are now entering the marketplace. The use of a thin‐film‐transistor (TFT) active matrix allows OLED displays to be larger in size, higher in resolutions and lower in power dissipation than is possible using a conventional passive matrix. A number of TFT active‐matrix pixel circuits have been developed for luminance control, while correcting for initial and electrically stressed TFT parameter variations. Previous circuits and driving methods are reviewed. A new driving method is presented in which the threshold‐voltage (V_t) compensation performance, along with various circuit improvements for amorphous‐silicon (a‐Si) TFT pixel circuits using voltage data, are discussed. This new driving method along with various circuit improvements is demonstrated in a state‐of‐the‐art 20‐in. a‐Si TFT AMOLED HDTV.     

Performance of high‐efficiency AMOLED displays

Abstract— In this paper, the performance of active‐matrix‐driven small‐molecule OLED displays incorporating high‐efficiency electrophosphorescent dopants were analyzed. These enable triplet excitons to contribute to light emission and have led to pixel efficiencies of over 40 lm/W. By considering a conventional two TFT per pixel addressing scheme, we show how this OLED design enables the fabrication of very‐low‐power‐consumption displays (lower than AMLCDs). We simulate display performance and perform a trade‐off analysis comparing the power consumption of displays driven by both amorphous‐silicon and low‐temperature poly‐Si TFTs.     

An AMOLED pixel circuit for high image quality of 1000 ppi mobile displays in AR and VR applications

In this paper, an active‐matrix organic light‐emitting diode pixel circuit is proposed to improve the image quality of 5.87‐in. mobile displays with 1000 ppi resolution in augmented and virtual reality applications. The proposed pixel circuit consisting of three thin‐film transistors (TFTs) and two capacitors (3T2C) employs a simultaneous emission driving method to reduce the number of TFTs and the emission current error caused by variations in threshold voltage (Vth) and subthreshold slope (SS) of the low‐temperature polycrystalline silicon TFTs. Using the simultaneous emission driving method, the compensation time is increased to 90 μs from 6.5 μs achieved in the conventional six TFTs and one capacitor (6T1C) pixel circuit. Consequently, the emission current error of the proposed 3T2C pixel circuit was reduced to ±3 least significant bit (LSB) from ±12 LSB at the 32nd gray level when the variations in both the Vth and SS are ±4σ. Moreover, both the crosstalk errors due to the parasitic capacitances between the adjacent pixel circuits and due to the leakage current were achieved to be less than ±1 LSB over the entire gray level. Therefore, the proposed pixel circuit is very suitable for active‐matrix organic light‐emitting diode displays requiring high image quality.     

Comparison of a‐Si and Poly‐Si for AMOLED displays

Abstract— The characteristics of OLED backplanes including the intrinsic properties of a‐Si TFTs and LTPS TFTs will be reviewed. While LTPS TFTs reveal satisfactory stability in AMOLED‐display applications, a‐Si AMOLEDs show better uniformity and are capable of driving OLEDs. However, the stability of a‐Si TFTs under long‐term operation is still unacceptable and remains to be the key issue constraining the commercialization of a‐Si TFT AMOLEDs.     

A digitally driven pixel circuit with current compensation for AMOLED microdisplays

A novel digitally driven pixel circuit for active‐matrix organic light‐emitting diode (OLED) microdisplays is proposed and evaluated. This circuit supports both pulse width modulation and pulse density modulation digital drive approaches. Only three transistors and one capacitor are required per pixel for the proposed circuit. A current mirror is used to compensate for the pixel current changes that occur because of the degradation of the OLEDs over time. The compensation current depends on the potential of the common cathode, the properties of the current mirror, and the Width/Length (W/L) ratio of the drive transistor. The proposed digital pixel circuit also has advantages in circuit layout compared with analog pixel circuits.     

An averaging pixel structure using microcrystalline‐silicon films prepared at high temperature for AMOLED displays

Abstract— A new voltage‐addressed pixel using a multiple drive distribution has been developed to improve, in a simple way, the brightness uniformity of active‐matrix organic light‐emitting‐diode (AMOLED) displays. Moreover, circuits were realized using microcrystalline‐silicon (μc‐Si) films prepared at 600°C using a standard low‐pressure CVD system. The developed p‐channel TFTs exhibit a field‐effect mobility close to 6 cm²/V‐sec. The experimental results show that the proposed spatial distribution of driving TFTs improves the uniformity of current levels, in contrast to the conventional two‐TFT pixel structure. Backplane performances have been compared using circuits based on μc‐Si and furnace‐annealed polysilicon materials. Finally, this technology has been used to make an AMOLED demonstration unit using a top‐emission OLED structure. Thus, by combining both an μc‐Si active‐layer and a current‐averaging driver, an unsophisticated solution is provided to solve the inter‐pixel non‐uniformity issue.     

A new threshold‐voltage compensation technique of poly‐Si TFTs for AMOLED display pixel circuits

Abstract— A new threshold‐voltage compensation technique for polycrystal line‐silicon thin‐film transistors (poly‐Si TFTs) used in active‐matrix organic light‐emitting‐diode (AMOLED) display pixel circuits is presented. The new technique was applied to a conventional 2‐transistor—1‐capacitor (2T1C) pixel circuit, and a new voltage‐programmed pixel circuit (VPPC) is proposed. Theoretically, the proposed pixel is the fastest pixel with threshold‐voltage compensation reported in the literature because of the new compression technique implemented with a static circuit block, which does not affect the response time of the conventional 2T1C pixel circuit. Furthermore, the new pixel exhibits all the other advantages of the 2T1C pixel, such as the simplicity of the peripheral drivers and improves other characteristics, such as its behavior in the temperature variations. The verification of the proposed pixel is made through simulations with HSpice. In order to obtain realistic simulations, device parameters were extracted from fabricated low‐temperature poly‐Si (LTPS) TFTs.     

Novel voltage programming n-channel TFT pixel circuit for low power and high performance AMOLED displays

This paper proposes a novel pixel circuit for high resolution, high frame rate, and low power AMOLED displays that is implemented with one driving n-channel TFT, six switching n-channel poly-Si TFTs, and a storage capacitor. The proposed pixel circuit adopts the voltage programming scheme for threshold voltage compensation. Because the whole line time is in use only for charging the data voltage, this pixel circuit is applicable to high resolution and frame rate displays. In addition, it compensates voltage variation of OLEDs and voltage drop of supply lines at lower power consumption. On the average, the non-uniformity of a proposed circuit is reduced to 2.5%, compared to 7.1% of the previous one at a 240 Hz full-HD display. On the other hand, the compensation voltage error, which is caused by feed-through and charge injection noises from falling control signals of switching TFTs, is much less in the proposed scheme than in the previous 5T2C structure. The average error of the proposed circuit is reduced to 0.18 V, compared to 0.75 V of the previous one. The initialization power consumption of the 7T1C circuit is reduced to 98 mW, compared to 530 mW of the 5T2C circuit and the average dynamic power saving ratio of data drivers is estimated in the 7T1C pixel as 98.7% over the 5T2C one for 24 test images.     

Simple pixel circuits for high resolution and high image quality organic light emitting diode‐on‐silicon microdisplays with wide data voltage range

Two simple pixel circuits are proposed for high resolution and high image quality organic light‐emitting diode‐on‐silicon microdisplays. The proposed pixel circuits achieve high resolution due to simple pixel structure comprising three n‐type MOSFETs and one storage capacitor, which are integrated into a unit subpixel area of 3 × 9 µm² using a 90 nm CMOS process. The proposed pixel circuits improve image quality by compensating for the threshold voltage variation of the driving transistors and extending the data voltage range. To verify the performance of the proposed pixel circuits, the emission currents of 24 pixel circuits are measured. The measured emission current deviation error of the proposed pixel circuits A and B ranges from ?2.59% to +2.78%, and from ?1.86% to +1.84%, respectively, which are improved from the emission current deviation error of the conventional current‐source type pixel circuit when the threshold voltage variation is not compensated for, which ranges from ?14.87% to +14.67%. In addition, the data voltage ranges of the proposed pixel circuits A and B are 1.193 V and 1.792 V, respectively, which are 2.38 and 3.57 times wider than the data voltage range of the conventional current‐source type pixel circuit of 0.501 V.     

Flexible active‐matrix OLED displays: Challenges and progress

Abstract— Organic light‐emitting‐device (OLED) devices are very promising candidates for flexible‐display applications because of their organic thin‐film configuration and excellent optical and video performance. Recent progress of flexible‐OLED technologies for high‐performance full‐color active‐matrix OLED (AMOLED) displays will be presented and future challenges will be discussed. Specific focus is placed on technology components, including high‐efficiency phosphorescent OLED technology, substrates and backplanes for flexible displays, transparent compound cathode technology, conformal packaging, and the flexibility testing of these devices. Finally, the latest prototype in collaboration with LG. Phillips LCD, a flexible 4‐in. QVGA full‐color AMOLED built on amorphous‐silicon backplane, will be described.     

Highly reliable oxide‐semiconductor TFT for AMOLED displays

Abstract— The stability and reliability of oxide‐semiconductor TFTs were investigated. The contact material to the oxide semiconductor affected the thermal stability of the TFT, and a molybdenum‐contact source/drain showed good stability. And the passivating film and TFT structure affected the stability against bias stress and humidity stress, and dc‐sputtered Al²O³ passivation and fully covered channel structure with an etching stopper or source/drain showed good reliability. Moreover, high photo‐stability was confirmed by the bias‐enhanced photo‐irradiation stress test. An 11.7‐in.‐diagonal qHD AMOLED display was demonstrated to provide an applicable solution for a large‐sized OLED and an ultra‐high‐definition LCD‐TV mass production.     

High refresh rate and low power consumption AMOLED panel using top‐gate n‐oxide and p‐LTPS TFTs

A pixel circuit and a gate driver on array for light‐emitting display are presented. By simultaneously utilizing top‐gate n‐type oxide and p‐type low‐temperature polycrystalline silicon (LTPS) thin‐film transistors (TFTs), the circuits provide high refresh rate and low power consumption. An active‐matrix LED (AMOLED) panel with proposed circuits is fabricated, and driving at various refresh rate ranging from 1 to 120 Hz could be achieved.     

Highly reliable a‐IGZO TFTs on a plastic substrate for flexible AMOLED displays

We have successfully reduced threshold voltage shifts of amorphous In–Ga–Zn–O thin‐film transistors (a‐IGZO TFTs) on transparent polyimide films against bias‐temperature stress below 100 mV, which is equivalent to those on glass substrates. This high reliability was achieved by dense IGZO thin films and annealing temperature below 300 °C. We have reduced bulk defects of IGZO thin films and interface defects between gate insulator and IGZO thin film by optimizing deposition conditions of IGZO thin films and annealing conditions. Furthermore, a 3.0‐in. flexible active‐matrix organic light‐emitting diode was demonstrated with the highly reliable a‐IGZO TFT backplane on polyimide film. The polyimide film coating process is compatible with mass‐production lines. We believe that flexible organic light‐emitting diode displays can be mass produced using a‐IGZO TFT backplane on polyimide films.     

Power saving through state retention in IGZO‐TFT AMOLED displays for wearable applications

We present a qHD (960 × 540 with three sub‐pixels) top‐emitting active‐matrix organic light‐emitting diode display with a 340‐ppi resolution using a self‐aligned IGZO thin‐film transistor backplane on polyimide foil with a humidity barrier. The back plane process flow is based on a seven‐layer photolithography process with a CD = 4 μm. We implement a 2T1C pixel engine and use a commercial source driver IC made for low‐temperature polycrystalline silicon. By using an IGZO thin‐film transistor and leveraging the extremely low off current, we can switch off the power to the source and gate driver while maintaining the image unchanged for several minutes. We demonstrate that, depending on the image content, low‐refresh operation yields reduction in power consumption of up to 50% compared with normal (continuous) operation. We show that with the further increase in resolution, the power saving through state retention will be even more significant.     

Novel self‐aligned top‐gate oxide TFT for AMOLED displays

Abstract— A novel highly reliable self‐aligned top‐gate oxide‐semiconductor thin‐film transistor (TFT) formed by using the aluminum (Al) reaction method has been developed. This TFT structure has advantages such as small‐sized TFTs, lower mask count, and small parasitic capacitance. The TFT with a 4‐μm channel length exhibited a field‐effect mobility of 21.6 cm²/V‐sec, a threshold voltage of ?1.2 V, and a subthreshold swing of 0.12 V/decade. Highly reliable TFTs were obtained after 300°C annealing without increasing the sheet resistivity of the source/drain region. A 9.9‐in.‐diagonal qHD AMOLED display was demonstrated with self‐aligned top‐gate oxide‐semiconductor TFTs for a low‐cost and ultra‐high‐definition OLED display. Excellent brightness uniformity could be achieved due to small parasitic capacitance.     

Threshold‐voltage‐compensation methods for AMOLED pixel and analog buffer circuits

Abstract— New pixel‐circuit designs for active‐matrix organic light‐emitting diodes (AMOLEDs) and a new analog buffer circuit for the integrated data‐driver circuit of active‐matrix liquid‐crystal displays (AMLCDs) and AMOLEDs, based on low‐temperature polycrystalline‐silicon thin‐film transistors (LTPS‐TFTs), were proposed and verified by SPICE simulation and measured results. Threshold‐voltage‐compensation pixel circuits consisting of LTPS‐TFTs, an additional control signal line, and a storage capacitor were used to enhance display‐image uniformity. A diode‐connected concept is used to calibrate the threshold‐voltage variation of the driving TFT in an AMOLED pixel circuit. An active load is added and a calibration operation is applied to study the influences on the analog buffer circuit. The proposed circuits are shown to be capable of minimizing the variation from the device characteristics through the simulation and measured results.     

Noise‐margin analysis of a‐Si:H digital circuits

Abstract— The noise margin is one of the fundamental metrics in evaluating the viability and robustness of digital circuits. An analytical model of amorphous‐silicon digital‐circuit noise margin was developed, including the effects of circuit aging. The threshold voltage of a‐Si:H transistors increases over time with electrical stress, degrading the performance and eventually leading to circuit wear‐out. Since static and dynamic inverters are the basic digital‐circuit design elements, they are the basis for this analysis. The analytical model is verified with experimental measurements. The lifetime of dynamic a‐Si:H digital circuits is found to exceed the lifetime for static a‐Si:H circuits by a factor of 2–3. Although the lifetimes are relatively short (～10⁵ sec) and under continuous electrical stress, they are sufficient for low‐duty‐cycle applications.